New understanding of LDD NMOS hot-carrier degradation and device lifetime at cryogenic temperatures

1997 ◽  
Vol 37 (10-11) ◽  
pp. 1747-1754 ◽  
Author(s):  
Janet Wang-Ratkovic ◽  
Ronald C. Lacoe ◽  
Kenneth P. MacWilliams ◽  
Miryeong Song ◽  
Stephanie Brown ◽  
...  
Keyword(s):  
Cryogenic Temperatures ◽  
Hot Carrier ◽  
Device Lifetime ◽  
Hot Carrier Degradation

scholarly journals Hot Carrier Degradation in MOSFETs at Cryogenic Temperatures Down to 4.2 K

2021 ◽  
pp. 1-1
Author(s):  
Yuanke Zhang ◽  
Jun Xu ◽  
Tengteng Lu ◽  
Yujing Zhang ◽  
Chao Luo ◽  
...  
Keyword(s):  
Cryogenic Temperatures ◽  
Hot Carrier ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation
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