New understanding of LDD CMOS hot-carrier degradation and device lifetime at cryogenic temperatures
1997 ◽
Vol 37
(10-11)
◽
pp. 1747-1754
◽
2019 ◽
Vol 19
(4)
◽
pp. 609-614
◽
Keyword(s):
2002 ◽
Vol 12
(3)
◽
pp. 11-14
◽
Keyword(s):
Keyword(s):
Keyword(s):
1993 ◽
Vol 140
(6)
◽
pp. 431
◽
Keyword(s):
1988 ◽
Vol 49
(C4)
◽
pp. C4-651-C4-655
◽
1988 ◽
Vol 49
(C4)
◽
pp. C4-787-C4-790