A study of blends of isotactic polypropylene with high density polyethylene by transmission electron microscopy

Polymer ◽  
1998 ◽  
Vol 39 (25) ◽  
pp. 6669-6672 ◽  
Author(s):  
P Montes ◽  
Y.A Rafiq ◽  
M.J Hill
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Isotactic Polypropylene ◽  
High Density Polyethylene ◽  
High Density ◽  
Transmission Electron

Study on Nanometer Size Structures in the Cr-Mo Electroplated Layer Using Transmission Electron Microscopy and Positron Lifetime Measurement

2011 ◽  
Vol 675-677 ◽  
pp. 247-250 ◽  
Author(s):  
Yoshio Tanita ◽  
Daiji Matsui ◽  
Hiroshi Fukushima
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dark Field Image ◽  
Dark Field ◽  
High Density ◽  
Positron Annihilation Lifetime ◽  
Small Crystal ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Crystal Grains

Micro- and nano-structures of the Cr-Mo electroplated layers were studied mainly by Transmission Electron Microscopy (TEM), High Resolution TEM (HRTEM) and Positron Annihilation Lifetime Spectroscopy (PALS). These electroplated layers which were deposited in Cr-Mo electrolyte containing an organic sulfonic acid, showed surface structures having severe ups and downs of small crystal grains. Both selected area diffraction and dark-field image of TEM confirmed the presence of very small crystal grains of less than 50 nm. These small crystal grains exhibited textured structure when the electrolyte contained an organic sulfonic catalyst. PALS results indicated the presence of high density nano-size voids, and HRTEM analysis confirmed the presence of high density voids of 1 nm to 2 nm in diameter. Size and density of these nano-voids increased with the amount of catalyst in the electrolyte.

Tem Assessment of Defects in (CdHg)Te Heterostructures

1990 ◽  
Vol 216 ◽  
Author(s):  
S.G. Lawson-Jack ◽  
I.P. Jones ◽  
D.J. Williams ◽  
M.G. Astles
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Buffer Layer ◽  
High Density ◽  
Misfit Dislocations ◽  
Cross Sectional ◽  
Burgers Vector ◽  
Density Of Dislocations ◽  
Transmission Electron ◽  
Interfacial Plane

ABSTRACTTransmission electron microscopy has been used to assess the defect contents of the various layers and interfaces in (CdHg) Te heterostructures. Examination of cross sectional specimens of these materials suggests that the density of misfit dislocations at the interfaces is related to the layer thicknesses, and that the high density of dislocations which are generated at the GaAs/CdTe interface are effectively prevented from penetrating into the CdHgTe epilayer by a 3um thick buffer layer. The majority of the dislocations in the layers were found to have a Burgers vector b = a/2<110> and either lie approximately parallel or inclined at an angle of ∼ 60° to the interfacial plane.

The Study on Surface Chemistry of Nanoporous Black Si Layers

2011 ◽  
Vol 79 ◽  
pp. 304-308
Author(s):  
Wang Li
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Surface Chemistry ◽  
Point Defects ◽  
High Density ◽  
Nanometer Scale ◽  
Transmission Electron ◽  
One Step ◽  
Amorphous Si ◽  
Microscopy Techniques

We reported our detailed investigation of the microstructure and surface chemistry of nanoporous black Si layers using transmission electron microscopy techniques such as HRTEM, EDS, and EELS. We found that a one-step nanoparticle-catalyzed liquid etch creates deep conical nanovoids. The cones provide the density-graded surface that suppresses reflection. The surface of the as-etched nanoporous black Si is an amorphous Si suboxide (SiOx) produced by the strongly oxidizing nanocatalyzed etch. The c-Si/suboxide interface is rough at the nanometer scale and contains a high density of point defects.

Precipitation Hardening in Fe-1.03%Cu Structural Steel

2007 ◽  
Vol 561-565 ◽  
pp. 111-114
Author(s):  
Hui Ping Ren ◽  
Hai Yan Wang ◽  
Zong Chang Liu ◽  
Lin Chen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Precipitation Hardening ◽  
Solution Treatment ◽  
Zone Axis ◽  
High Density ◽  
Nano Scale ◽  
Transmission Electron ◽  
Steel Strength ◽  
Diffraction Patterns

The precipitation of copper during aging at 650oC within ferrite in high-purity Fe-1.03wt%Cu steel was examined by transmission electron microscopy, and the influence of precipitation particles on property of experimental steel was investigated. The microstructure and the corresponding diffraction patterns of different zone axis were analyzed. Nano-scale copper-rich clusters with B2-like structure and high density dislocation around precipitate was observed during either solution treatment or aging. Nano-scale metastable precipitates and high density around them were found to play the most important role for increasing steel strength.

High-density stacking faults in a supersaturated nitrided layer on austenitic stainless steel

2016 ◽  
Vol 49 (6) ◽  
pp. 1967-1971 ◽  
Author(s):  
Ke Tong ◽  
Fei Ye ◽  
Honglong Che ◽  
Ming Kai Lei ◽  
Shu Miao ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Stainless Steel ◽  
Austenitic Stainless Steel ◽  
Nitrided Layer ◽  
Stacking Faults ◽  
High Density ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

The nitrogen-supersaturated phase produced by low-temperature plasma-assisted nitriding of austenitic stainless steel usually contains a high density of stacking faults. However, the stacking fault density observed in previous studies was considerably lower than that determined by fitting the X-ray diffraction pattern. In this work, it has been confirmed by high-resolution transmission electron microscopy that the strip-shaped regions of about 3–25 nm in width observed at relatively low magnification essentially consist of a series of stacking faults on every second {111} atomic plane. A microstructure model of the clustered stacking faults embedded in a face-centred cubic structure was built for these regions. The simulated X-ray diffraction and transmission electron microscopy results based on this model are consistent with the observations.

Structure and Electronic Properties of Misfit Dislocations in ZnSe/GaAs(001) Heterojunctions

1994 ◽  
Vol 340 ◽  
Author(s):  
Y. Chen ◽  
X. Liu ◽  
E. Weber ◽  
E. D. Bourret ◽  
D. J. Olego ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electrical Properties ◽  
Electronic Properties ◽  
Misfit Dislocation ◽  
Orthogonal Array ◽  
High Density ◽  
Misfit Dislocations ◽  
Transmission Electron ◽  
Dislocation Arrays

ABSTRACTStudies of the structure and electrical properties of regular and irregular misfit dislocations in undoped and N-doped ZnSe epilayers grown on GaAs(001) substrates by transmission electron microscopy (TEM), cathodoluminescence (CL) are reported. In undoped ZnSe epilayers, two sets of misfit dislocation arrays were observed: a straight orthogonal array along [110] and, and an irregular array roughly along [100] and [010] directions. The CL observations suggest that the irregular dislocations trap carriers more efficiently than the dislocations along <110>, possibly due to the high density of kinks existing along the zig-zag irregular dislocations. These irregular dislocations can be eliminated by doping nitrogen in the ZnSe epilayer with [N]≥l×1018 cm−3.

Improvement of Carbon Nanotube Films on SiC formed by Surface Decomposition by Hydrogen Peroxide Purification

2009 ◽  
Vol 1204 ◽  
Author(s):  
Takahiro Maruyama ◽  
Fumiya Nakahama ◽  
Shigeya Naritsuka
Keyword(s):  
Electron Microscopy ◽  
Hydrogen Peroxide ◽  
Transmission Electron Microscopy ◽  
Carbon Nanotube ◽  
Functional Groups ◽  
High Density ◽  
Transmission Electron ◽  
Multi Walled Carbon Nanotube ◽  
Shoulder Peak ◽  
Surface Decomposition

AbstractWe studied the effects of annealing in H2O2 on the morphologies and structures of “as grown” high-density, well-aligned multi-walled carbon nanotube (MWNT) films formed by surface decomposition of SiC. After annealing in H2O2 solution at 100°C for 3 h, the G/D ratio increased from 1.44 to 2.33, the FWHM of the G band peak became narrower, and a D′ shoulder peak appeared. Transmission electron microscopy (TEM) revealed that the dispersion of MWNTs in dimethylformamide (DMF) solution was improved, suggesting that film impurities were reduced and that damage to the MWNTs was negligible. After annealing for 9 h, the G/D ratio decreased to 1.57, and exfoliation of some MWNTs was observed. In addition, several functional groups such as carboxylic (-COOH) and hydroxyl (-OH) were formed on the surface of the MWNTs. From these results, we conclude that annealing in H2O2 under proper conditions can effectively purify “as grown” MWNT films formed by surface decomposition of SiC.

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