High resolution chemical mapping in the energy-filtering TEM: application to interface layers in ceramics

Coupling synchrotron IR beam to an ATR element enhances spatial resolution suited for high-resolution single cell analysis in biology, medicine and environmental science.

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High resolution chemical mapping of biomimetic membranes by force volume imaging

2008 International Conference on Nanoscience and Nanotechnology ◽

10.1109/iconn.2008.4639261 ◽

2008 ◽

Author(s):

Matthew R. Nussio ◽

Nicolas H. Voelcker ◽

Matthew J. Sykes ◽

Ben S. Flavel ◽

John O. Miners ◽

...

Keyword(s):

High Resolution ◽

Chemical Mapping ◽

Biomimetic Membranes ◽

Volume Imaging ◽

Force Volume

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High-Resolution Chemical Mapping of Surface Bound Functional Groups with Tapping-Mode Scanning Force Microscopy

Journal of the American Chemical Society ◽

10.1021/ja971474+ ◽

1997 ◽

Vol 119 (36) ◽

pp. 8564-8565 ◽

Cited By ~ 27

Author(s):

Michael O. Finot ◽

Mark T. McDermott

Keyword(s):

High Resolution ◽

Functional Groups ◽

Scanning Force Microscopy ◽

Chemical Mapping ◽

Tapping Mode ◽

Force Microscopy ◽

Scanning Force

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Near-field chemical mapping of gold nanostructures using a functionalized scanning probe

Physical Chemistry Chemical Physics ◽

10.1039/c7cp06004a ◽

2017 ◽

Vol 19 (46) ◽

pp. 31063-31071 ◽

Cited By ~ 6

Author(s):

C. Dab ◽

C. Awada ◽

A. Merlen ◽

A. Ruediger

Keyword(s):

Raman Spectroscopy ◽

Surface Plasmon Resonance ◽

High Resolution ◽

Surface Plasmon ◽

Photophysical Properties ◽

Near Field ◽

Scanning Probe ◽

Gold Nanostructures ◽

Chemical Mapping ◽

Tip Enhanced Raman Spectroscopy

We report on photochemical and photophysical properties produced by Surface Plasmon Resonance (SPR) on metallic nanograins by means of high resolution Functionalized Tip-Enhanced Raman Spectroscopy (F-TERS).

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High-resolution TEM and energy filtering TEM study of interfacial structure and reaction of diamond/Si in chemical vapor deposition

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100137732 ◽

1995 ◽

Vol 53 ◽

pp. 272-273

Author(s):

Fu-Rong Chen ◽

L. Chang ◽

C. J. Chen ◽

T. S. Lin

Keyword(s):

High Resolution ◽

Microwave Plasma ◽

Chemical Vapor ◽

Amorphous Layer ◽

Interfacial Structure ◽

Cross Sectional ◽

Energy Filtering ◽

Processing Step ◽

Microwave Plasma Cvd ◽

High Resolution Tem

Diamond film was grown using microwave plasma CVD technique which consists of three steps: carburization, bias and growth . The high resolution TEM (HRTEM) in cross-sectional view has been used to observe the evolution of interfacial structure in each processing step [1]. The chemistry near the interface was characterized with elemental mapping using energy-filtered imaging technique with Gatan imaging Filter (GIF) [2]. At the carburization stage, β-SiC, diamond particles and graphite plates have been observed in an amorphous layer. This amorphous layer was analysized to be carbon by energy filtering technique.As shown in the Fig. 1, β-SiC can form in epitaxial orientation with Si in the following stage of biasing. Graphite was not observed after the bias was applied. At the bias stage there is an interlayer of 6 nm thick between diamond and silicon substrate . From the high resoultion image in Fig. 2 (a), most of the regions of the interlayer are of amorphous characteristics which presents a barrier to identify the elemental compositions.

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