IDENTIFYING GAPS IN AUTOMATING THE ASSESSMENT OF TECHNOLOGY READINESS LEVELS
2020 ◽
Vol 1
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pp. 551-558
Keyword(s):
AbstractCrucial in the design process, Technology Readiness Levels are a common form of technology maturity assessment. Studies suggest that the TRL scale can be subjective and biased. Automating the assessment can reduce human bias. This paper highlights important challenges of automation by presenting data collected on 15 technologies from the nanotechnology sector. Our findings show that, contrary to claims from the literature, patent data exists for low maturity technologies and may be useful for automation. We also found that there exists unexpected trends in data publications at TRL 2, 3 and 4.
2015 ◽
Vol 92
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pp. 196-209
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2017 ◽
Vol 160
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pp. 804-812
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2010 ◽
Vol 129-131
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pp. 1196-1200
1982 ◽
Vol 22
(2)
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pp. 195-206
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2008 ◽
Vol 05
(03)
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pp. 259-278
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Keyword(s):