A Liquid Nitrogen Cooled Stage for STEM

1974 ◽  
Vol 32 ◽  
pp. 444-445
Author(s):  
Louis T. Germinario
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Liquid Nitrogen ◽  
Room Temperature ◽  
Objective Lens ◽  
Thermal Drift ◽  
Specimen Holder ◽  
Resolution Capability ◽  
Focal Position

A liquid nitrogen stage has been developed for the JEOL JEM-100B electron microscope equipped with a scanning attachment. The design is a modification of the standard JEM-100B SEM specimen holder with specimen cooling to any temperatures In the range ~ 55°K to room temperature. Since the specimen plane is maintained at the ‘high resolution’ focal position of the objective lens and ‘bumping’ and thermal drift la minimized by supercooling the liquid nitrogen, the high resolution capability of the microscope is maintained (Fig.4).

A Tilting Cold Stage For The AEI EM802

1970 ◽  
Vol 28 ◽  
pp. 372-373
Author(s):  
P.R. Swann ◽  
G.R. Swann
Keyword(s):  
High Resolution ◽  
Liquid Nitrogen ◽  
Room Temperature ◽  
Objective Lens ◽  
Cold Stage ◽  
Focal Position ◽  
Translation Stage

A tilting cold stage of unique design and with exceptional facilities has been developed commercially for the AEI EM802. The design consists of a double tilting stage allowing ±25° of specimen tilt about two orthogonal axes, with specimen cooling to any temperature in the range -150°C to room temperature. Since the specimen plane is maintained at the normal focal position of the objective lens and ‘bumping’ is eliminated by the circulation of gaseous rather than liquid nitrogen, the high resolution of the microscope is maintained.The apparatus consists of a translation stage, A, containing all the tilting controls, a simple specimen cartridge, B, and a hollow annulus, C, clamped to the translation stage, through which flows the cooling gas from the liquid nitrogen Dewar, D.

High Resolution Goniometer Stage for Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 42-43
Author(s):  
A. Mikaziri ◽  
S. Ohomori ◽  
T. Yamamoto
Keyword(s):  
Thermal Stability ◽  
Electron Microscope ◽  
High Resolution ◽  
Optical Axis ◽  
Resolving Power ◽  
Objective Lens ◽  
Thermal Drift ◽  
Power Stability ◽  
Supporting System

The performance of a goniometer stage to an electron microscope may be evaluated from several view points, such as operational easy, stability and resolving power. Stability is the fundamental, however. As is often experienced, the incorporation of a specimen tilting mechanism into the specimen chamber causes a functional unstability of the instrument and also causes inconvenience in the design of the objective lens. The top entry goniometer stage has an advantage in mechanical and thermal stability, since the specimen and specimen shifting stage are symmetrically supported around the optical axis. This supporting system is the main difference from that of the side entry goniometer stage. In the latter, the vibration and thermal drift of the specimen is unavoidable, in principle, due to an unbalanced specimen support.We have recently developed a top entry goniometer for the JEM-100B Electron Microscope, taking these points into account to meet the demand for high resolving power: this goniometer is of double tilt type, permitting each axis to tilt by ±30° and enabling the specimen to tilt around some composite tilting axis by ±40°.

A New High Resolution Transmission Electron Microscope with Second-Zone Objective Lens

1969 ◽  
Vol 27 ◽  
pp. 176-177 ◽  
Author(s):  
H. Tochigi ◽  
H. Uchida ◽  
S. Shirai ◽  
K. Akashi ◽  
D. J. Evins ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Objective Lens ◽  
High Excitation ◽  
Transmission Electron ◽  
New Instrument

A New High Excitation Objective Lens (Second-Zone Objective Lens) was discussed at Twenty-Sixth Annual EMSA Meeting. A new commercially available Transmission Electron Microscope incorporating this new lens has been completed.Major advantages of the new instrument allow an extremely small beam to be produced on the specimen plane which minimizes specimen beam damages, reduces contamination and drift.

Design of a new objective lens for an HB-501A STEM

1991 ◽  
Vol 49 ◽  
pp. 416-417
Author(s):  
Earl J. Kirkland ◽  
Robert J. Keyse
Keyword(s):  
High Resolution ◽  
Spherical Aberration ◽  
Scanning Transmission Electron Microscope ◽  
Dark Field ◽  
Objective Lens ◽  
Specimen Holder ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field ◽  
High Resolution Microscopy

An ultra-high resolution pole piece with a coefficient of spherical aberration Cs=0.7mm. was previously designed for a Vacuum Generators HB-501A Scanning Transmission Electron Microscope (STEM). This lens was used to produce bright field (BF) and annular dark field (ADF) images of (111) silicon with a lattice spacing of 1.92 Å. In this microscope the specimen must be loaded into the lens through the top bore (or exit bore, electrons traveling from the bottom to the top). Thus the top bore must be rather large to accommodate the specimen holder. Unfortunately, a large bore is not ideal for producing low aberrations. The old lens was thus highly asymmetrical, with an upper bore of 8.0mm. Even with this large upper bore it has not been possible to produce a tilting stage, which hampers high resolution microscopy.

Development of high-performance objective lens polepiece for ultrahigh resolution Analytical Electron Microscope

1993 ◽  
Vol 51 ◽  
pp. 254-255
Author(s):  
K. Fukushima ◽  
T. Kaneyama ◽  
F. Hosokawa ◽  
H. Tsuno ◽  
T. Honda ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Performance ◽  
Open Space ◽  
Materials Science ◽  
Objective Lens ◽  
Ultrahigh Resolution ◽  
Science Field ◽  
Specimen Holder ◽  
Analytical Electron ◽  
Analytical Electron Microscope

Recently, in the materials science field, the ultrahigh resolution analytical electron microscope (UHRAEM) has become a very important instrument to study extremely fine areas of the specimen. The requirements related to the performance of the UHRAEM are becoming gradually severer. Some basic characteristic features required of an objective lens are as follows, and the practical performance of the UHRAEM should be judged by totally evaluating them.1) Ultrahigh resolution to resolve ultrafine structure by atomic-level observation.2) Nanometer probe analysis to analyse the constituent elements in nm-areas of the specimen.3) Better performance of x-ray detection for EDS analysis, that is, higher take-off angle and larger detection solid angle.4) Higher specimen tilting angle to adjust the specimen orientation.To attain these requirements simultaneously, the objective lens polepiece must have smaller spherical and chromatic aberration coefficients and must keep enough open space around the specimen holder in it.

Field Emission SEM with a Newly Developed FEGUN and Conical Strongly Excited Objective Lens

2000 ◽  
Vol 6 (S2) ◽  
pp. 764-765
Author(s):  
H. Kazumori ◽  
A. Yamada ◽  
M. Mita ◽  
T. Nokuo ◽  
M. Saito
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Secondary Electron ◽  
Objective Lens ◽  
Probe Current ◽  
Large Samples ◽  
Low Emission ◽  
Working Distance ◽  
Scanning Electron

A newly developed cold FE-GUN which enables to us to obtain large probe current and low emission noise, and conical strongly excited objective lens has been installed on the JSM-6700F Scanning Electron Microscope (SEM). In the range of accelerating voltages from 0.5 to 15kV, this instrument has got much better resolution as compared with in-lens type SEM (Ohyama et al 1986)(Fig. 1). We can obtain high-resolution secondary electron images with large samples (ex. 150mm ϕ×10mmH).Our old type objective lens (Kazumori et al 1994) has the limitation of working distance (WD), but the new lens enables us to work at very short WD at accelerating voltage of 15kV. As a result the spherical (Cs) and chromatic (Cc) aberration constants are 1.9mm and 1.7mm respectively at a WD of 3mm.In order to get large probe current, we increased emission current and got near the distance between the t ip of emi tter and the pr inciple plane of condenser lens.

Dynamic Observation of Dislocation Movements at Elevated Temperatures Using a Heating and Straining Stage

1971 ◽  
Vol 29 ◽  
pp. 108-109
Author(s):  
Y. Ishida ◽  
F. Moritoh
Keyword(s):  
Stainless Steel ◽  
Electron Microscope ◽  
Room Temperature ◽  
Elevated Temperatures ◽  
Steel Tube ◽  
Deformation Mechanisms ◽  
Stainless Steel Tube ◽  
Specimen Holder ◽  
Dynamic Observation ◽  
Temperature Deformations

Dynamic observation of dislocation movements is a direct means of examining proposed deformation mechanisms. Room temperature deformations have been observed dynamically by various authors, but at elevated temperatures no observation has been reported. Various dislocation theories have been proposed on the creep mechanism of metals at elevated temperatures. They disagree to each other even in the basic eharacteristics of the dislocation movements. The dislocation may move either individually or as a group. The motion may be either smooth or intermittent. The dynamic observation is suitable to resolve those basic conflicts.A heating-straining goniometer stage (Fig. 1) was developed for the experiment. It was mounted in a Hitachi 200KV electron microscope. The foil is pasted between A areas and heated indirectly by a furnace B through a stainless steel tube C. A rapid drying paste Aron α was used in the present experiment. The tube C surrounds the top of the specimen holder.

Unique Features of a High Resolution Scanning Transmission Electron Microscope

1974 ◽  
Vol 32 ◽  
pp. 404-405
Author(s):  
J. W. Wiggins ◽  
M. Beer ◽  
D. C. Woodruff ◽  
J. A. Zubin
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Heavy Atom ◽  
Scanning Transmission Electron Microscope ◽  
Objective Lens ◽  
Optical Parameters ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

A high resolution scanning transmission electron microscope has been constructed and is operating. The initial task of this instrument is to attempt the sequencing of DNA by heavy-atom specific staining. It is also suitable for many other biological investigations requiring high resolution, low contamination and minimum radiation damage.The basic optical parameters are: 20 to 100 KV acceleration potential, objective lens focal length of 1.0 mm. with Cs = 0.7 mm., and two additional lenses designated as condensor and diffraction lenses. The purpose of the condensor lens is to provide a parallel beam incident to the objective, and the diffraction lens produces an image of the back focal plane of the objective in the plane of an annular detector.

A High Resolution Dual Gun Electron Miscroscope for TEM and SEM

1974 ◽  
Vol 32 ◽  
pp. 422-423
Author(s):  
P. S. Ong ◽  
C. L. Gold
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Spot Size ◽  
Resolving Power ◽  
Objective Lens ◽  
Scanning System ◽  
Transmission Electron ◽  
Mode Of Operation ◽  
Electron Microscopes ◽  
Scanning Electron

Transmission electron microscopes (TEM) have the capability of producing an electron spot (probe) with a diameter equal to its resolving power. Inclusion of the required scanning system and the appropriate detectors would therefore easily convert such an instrument into a high resolution scanning electron microscope (SEM). Such an instrument becomes increasingly useful in the transmission mode of operation since it allows the use of samples which are considered too thick for conventional TEM. SEM accessories now available are all based on the use of the prefield of the objective lens to focus the beam. The lens is operated either as a symmetrical Ruska lens or its asymmetrical version. In these approaches, the condensor system of the microscope forms part of the reducing optics and the final spot size is usually larger than 20Å.

Simplified transfer of frozen-hydrated specimens into a commercially available cooling holder

1984 ◽  
Vol 42 ◽  
pp. 274-275
Author(s):  
B. D. Athey ◽  
J.P. Langmore
Keyword(s):  
Electron Microscope ◽  
Structural Analysis ◽  
High Resolution ◽  
Liquid Nitrogen ◽  
Manual Dexterity ◽  
New Method ◽  
Biological Macromolecules ◽  
Cooling Stage

The examination of frozen-hydrated specimens maintained at liquid nitrogen (LN2) temperatures within the electron microscope is now established as an important technique to perform high resolution structural analysis of biological macromolecules. In some commercially available side-entry cold stages, it is often impossible to take advantage of this new method because hydration of the frozen specimen during grid placement and subsequent transfer of the stage into the EM makes the sample unusable. Recently, modifications to allow for frost-free transfer under LN2 have been reported for the JEOL EMSCH cooling stage, available for the JEOL JEM 100CX. Detailed below is a further change to this holder which greatly improves the reproducability of specimen transfer, reducing the time and manual dexterity needed for this process.

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