Lorentz Electron Microscopy of Magnetic Domains in Eptaxial Iron Films

1974 ◽  
Vol 32 ◽  
pp. 476-477
Author(s):  
K. R. Lawless ◽  
G. R. Proto
Keyword(s):  
Electron Microscopy ◽  
Single Crystal ◽  
Rock Salt ◽  
Domain Walls ◽  
Weak Field ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Iron Films ◽  
Normal Operating ◽  
Iron Wire

This paper describes the results of a study of domain walls in single crystal iron films by Lorentz electron microscopy. The films were prepared by evaporating 99.99% iron wire onto an air cleaved (100) rock salt substrate heated to 400°C. The films were stripped from the rock salt, mounted on Cu folding grids and annealed at a temperature between 700°C and 900°C. The study was performed in a Siemens Elmiskop 1 A operated in the weak field objective lens mode with the specimen raised 5.4 mm. above its normal operating position.

Lorentz Microscopy: Effect of Tilting on Magnetic Domains in Single Crystal Iron Films

1968 ◽  
Vol 26 ◽  
pp. 388-389
Author(s):  
L. F. Allard ◽  
A. P. Rowe ◽  
P. L. Fan
Keyword(s):  
Single Crystal ◽  
Domain Walls ◽  
Magnetic Domain ◽  
Objective Lens ◽  
Pole Piece ◽  
Magnetic Domains ◽  
Iron Films ◽  
Lorentz Microscopy ◽  
Magnetic Domain Walls ◽  
Microscopy Techniques

In order to observe magnetic domain walls by Lorentz microscopy techniques it is often necessary either to operate the microscope with the objective lens off, thus severely limiting the magnification, or to move the specimen from its usual position or make some other modification so that the field to which it is subjected is not so strong that it saturates the specimen. However, conditions in the JEM-6A have proved favorable for observation of domains in single crystal iron films by the out-of-focus method without any modifications, using either the regular specimen stage with the small bore pole piece or the tilting stage with the large bore pole piece. The tilting stage is particularly useful for these studies because the domains are very sensitive to small differences in inclination in the field.

Lorentz electron microscopy of domain walls in single−crystal evaporated iron films

1975 ◽  
Vol 46 (1) ◽  
pp. 416-421 ◽  
Author(s):  
George R. Proto ◽  
Kenneth R. Lawless
Keyword(s):  
Electron Microscopy ◽  
Single Crystal ◽  
Domain Walls ◽  
Iron Films

Asymmetric 180° Domain Walls in Single Crystal Iron Films

1972 ◽  
Vol 32 (6) ◽  
pp. 1493-1499 ◽  
Author(s):  
Sonoko Tsukahara ◽  
Hisazo Kawakatsu
Keyword(s):  
Single Crystal ◽  
Domain Walls ◽  
Iron Films

Scanning electron microscopy with polarization analysis: An update

1991 ◽  
Vol 49 ◽  
pp. 764-765
Author(s):  
J. Unguris ◽  
M. W. Hart ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Domain Walls ◽  
Domain Wall Motion ◽  
Optical Recording ◽  
Polarization Analysis ◽  
Magnetic Domains ◽  
Magnetic Microstructure ◽  
Domain Structures ◽  
Scanning Electron

Over the past ten years the technique of scanning electron microscopy with polarization analysis (SEMPA) has rapidly evolved from a scientific curiosity to a useful analytical tool for looking at a material's magnetic microstructure. Several reviews of the technique have been published elsewhere. SEMPA has been successfully used to analyze various technological problems such as: noise in magnetic and magneto-optical recording media, domain wall motion in thin film recording heads, and domain structures in small Permalloy shapes. Basic science applications of SEMPA include quantitative studies of the influence of the surface on the structure of magnetic domains and domain walls, and studies of magnetic microstructures in ultra-thin (0.1 - 1 nm) ferromagnetic films. Many current applications of SEMPA make use of the technique's surface sensitivity to probe the magnetism of thin films and multilayers.

Growth of Rock-Salt and Spinel Structured Oxides on α-Al2O3, c-ZrO2 and MgO

1994 ◽  
Vol 343 ◽  
Author(s):  
Sundar Ramamurthy ◽  
Paul G. Kotula ◽  
C. Barry Carter
Keyword(s):  
Electron Microscopy ◽  
Single Crystal ◽  
Rock Salt ◽  
Low Voltage ◽  
Orientation Relationships ◽  
Plan View ◽  
Transmission Electron ◽  
Crystal Films ◽  
Α Al2o3

ABSTRACTPulsed-laser deposition has been used to grow thin films of the rock-salt and spinel structured oxides NiO, CoO and C03O4 on single-crystal substrates of α-Al2O3, MgO and C-Z1O2. The resultant microstructures were characterized in plan-view by transmission electron microscopy and by low-voltage scanning electron microscopy. In all the depositions, the parameters could be controlled to grow predominantly single-crystal films. In the NiO/(0001)α-Al2O3 and CoO/(100)c-ZrO2 systems, {111}-oriented films were observed which were found to be twinned close to 60° and 90° about <111> respectively. Growth of cobalt oxide films on (100) MgO at 800°C and 15 mTorr of oxygen produced {100}-oriented domains of C03O4 meeting at antiphase boundaries. These observations and other recent studies re-emphasize the role of substrate crystallography in governing the orientation relationships in the overlayer.

Oxidation of Single Crystal Iron Film at Very Low Pressures

1970 ◽  
Vol 28 ◽  
pp. 460-461
Author(s):  
P. L. Fan ◽  
L. O. Brockway
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Single Crystal ◽  
Vapor Deposition ◽  
Iron Film ◽  
Oxide Formation ◽  
Iron Films ◽  
Transmission Electron ◽  
Advanced Stages ◽  
Low Pressures

The oxidation of iron has been studied mostly with polycrystalline samples and at advanced stages of oxide formation. The formation of isolated iron oxide grains on single crystal iron films has rarely been observed. This work is to report the observation, by transmission electron microscopy, of such oxide grains formed by controlled oxidation of single crystal iron films.Single crystal iron films were obtained by vapor deposition from an electron beam evaporator onto polished (001) faces of NaCl. The substrate, temperature was 350°C. The vacuum just before deposition was about 8 × 10−6 torr. The deposition rate was 8 - 10 A/sec and the thickness of the film was in the order of 1000 Å.

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