Electron-beam-induced 3-D epitaxy Of TiO on TiO2

1988 ◽  
Vol 46 ◽  
pp. 684-685
Author(s):  
M. R. McCartney
Keyword(s):  
High Resolution ◽  
Transition Metal Oxides ◽  
Three Dimensional ◽  
High Resolution Electron Microscopy ◽  
High Resolution Imaging ◽  
Metallic Oxide ◽  
Resolution Electron ◽  
Resolution Imaging ◽  
Modified Surface ◽  
Electron Stimulated Desorption

It is well-known that the surfaces of maximally-valent transition-metal oxides should be particularly susceptible to electron-stimulated desorption of oxygen under the conditions prevailing in high-resolution electron microscopy (HREM). Indeed, it has been observed that lattice fringes corresponding to TiO have developed on the surfaces of crystals of rutile, TiO2. Fig. 1a shows the modified surface of a rutile crystal tilted to (001)-projection with extensive regions of disorder and small crystallites of reduced (metallic) oxide at the edge; fig. 1b shows TiO2 in a [010]-projection with crystals of TiO in -projection. By combining the techniques of high-resolution imaging, optical diffractogram (ODM) analysis, and computer modeling of crystal structure, a three-dimensional epitaxy for the growth of TiO on TiO2 can be proposed.

Alternative approaches to ultra-high resolution imaging

1991 ◽  
Vol 49 ◽  
pp. 650-651
Author(s):  
J.M. Cowley
Keyword(s):  
High Resolution ◽  
High Voltage ◽  
High Resolution Electron Microscopy ◽  
Crystal Defects ◽  
High Resolution Imaging ◽  
General Applicability ◽  
Resolution Electron ◽  
Radiation Resistant ◽  
Resolution Imaging ◽  
Alternative Approaches

By extrapolation of past experience, it would seem that the future of ultra-high resolution electron microscopy rests with the advances of electron optical engineering that are improving the instrumental stability of high voltage microscopes to achieve the theoretical resolutions of 1Å or better at 1MeV or higher energies. While these high voltage instruments will undoubtedly produce valuable results on chosen specimens, their general applicability has been questioned on the basis of the excessive radiation damage effects which may significantly modify the detailed structures of crystal defects within even the most radiation resistant materials in a period of a few seconds. Other considerations such as those of cost and convenience of use add to the inducement to consider seriously the possibilities for alternative approaches to the achievement of comparable resolutions.

Electron crystallographic determination of the 3-D structure of staurolite at atomic resolution

1991 ◽  
Vol 49 ◽  
pp. 540-541
Author(s):  
Kenneth H. Downing ◽  
Hu Meisheng ◽  
Hans-Rudolf Went ◽  
Michael A. O'Keefe
Keyword(s):  
High Resolution ◽  
Three Dimensional ◽  
High Resolution Electron Microscopy ◽  
Atomic Resolution ◽  
Dimensional Structure ◽  
Structure Information ◽  
Resolution Electron ◽  
Scattering Effects ◽  
High Resolution Images ◽  
Effects Of Radiation

With current advances in electron microscope design, high resolution electron microscopy has become routine, and point resolutions of better than 2Å have been obtained in images of many inorganic crystals. Although this resolution is sufficient to resolve interatomic spacings, interpretation generally requires comparison of experimental images with calculations. Since the images are two-dimensional representations of projections of the full three-dimensional structure, information is invariably lost in the overlapping images of atoms at various heights. The technique of electron crystallography, in which information from several views of a crystal is combined, has been developed to obtain three-dimensional information on proteins. The resolution in images of proteins is severely limited by effects of radiation damage. In principle, atomic-resolution, 3D reconstructions should be obtainable from specimens that are resistant to damage. The most serious problem would appear to be in obtaining high-resolution images from areas that are thin enough that dynamical scattering effects can be ignored.

Nano-probe x-ray analysis and high-resolution imaging on planar defects in high-pressure synthesized infinite-layer superconductor

1994 ◽  
Vol 52 ◽  
pp. 728-729
Author(s):  
Y. Y. Wang ◽  
H. Zhang ◽  
V. P. Dravid ◽  
H. Zhang ◽  
L. D. Marks ◽  
...  
Keyword(s):  
High Pressure ◽  
High Resolution ◽  
Atomic Structure ◽  
Emission Spectra ◽  
High Resolution Electron Microscopy ◽  
Planar Defects ◽  
X Ray ◽  
Infinite Layer ◽  
Resolution Electron ◽  
Resolution Imaging

Azuma et al. observed planar defects in a high pressure synthesized infinitelayer compound (i.e. ACuO2 (A=cation)), which exhibits superconductivity at ~110 K. It was proposed that the defects are cation deficient and that the superconductivity in this material is related to the planar defects. In this report, we present quantitative analysis of the planar defects utilizing nanometer probe xray microanalysis, high resolution electron microscopy, and image simulation to determine the chemical composition and atomic structure of the planar defects. We propose an atomic structure model for the planar defects.Infinite-layer samples with the nominal chemical formula, (Sr1-xCax)yCuO2 (x=0.3; y=0.9,1.0,1.1), were prepared using solid state synthesized low pressure forms of (Sr1-xCax)CuO2 with additions of CuO or (Sr1-xCax)2CuO3, followed by a high pressure treatment.Quantitative x-ray microanalysis, with a 1 nm probe, was performed using a cold field emission gun TEM (Hitachi HF-2000) equipped with an Oxford Pentafet thin-window x-ray detector. The probe was positioned on the planar defects, which has a 0.74 nm width, and x-ray emission spectra from the defects were compared with those obtained from vicinity regions.

Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy

2012 ◽  
Vol 1 (5) ◽  
pp. 389-425 ◽  
Author(s):  
Takeo Oku
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Nanostructured Materials ◽  
Structure Analysis ◽  
Incident Beam ◽  
High Resolution Electron Microscopy ◽  
Structure Model ◽  
Resolution Electron ◽  
Correction Technique ◽  
Resolution Imaging

AbstractHigh-resolution electron microscopy (HREM) analysis has contributed to the direct structure analysis of advanced nanostructured materials, of which the properties of these materials are strongly dependent on the atomic arrangements. In the present article, the direct structure analysis of nanostructured materials such as boride and oxide materials was described and the high-resolution imaging methods were applied to boron nitride nanomaterials such as nanotubes and nanoparticles. An aberration correction technique is also expected as an advanced nanostructure analysis with higher resolution. The HREM image of TlBa2Ca3Cu4O11 was taken with the incident beam parallel to the a axis together with a structure model after image processing.

scholarly journals Plastic embedding immunolabeled large-volume samples for three-dimensional high-resolution imaging

2017 ◽  
Vol 8 (8) ◽  
pp. 3583 ◽  
Author(s):  
Yadong Gang ◽  
Xiuli Liu ◽  
Xiaojun Wang ◽  
Qi Zhang ◽  
Hongfu Zhou ◽  
...  
Keyword(s):  
High Resolution ◽  
Large Volume ◽  
Three Dimensional ◽  
High Resolution Imaging ◽  
Plastic Embedding ◽  
Resolution Imaging

scholarly journals Three-Dimensional High-Resolution Imaging of Gold Nanorods Uptake in Sentinel Lymph Nodes

Nano Letters ◽  
2011 ◽  
Vol 11 (7) ◽  
pp. 2938-2943 ◽  
Author(s):  
Yeongri Jung ◽  
Roberto Reif ◽  
Yaguang Zeng ◽  
Ruikang K. Wang
Keyword(s):  
High Resolution ◽  
Lymph Nodes ◽  
Gold Nanorods ◽  
Three Dimensional ◽  
Sentinel Lymph Nodes ◽  
High Resolution Imaging ◽  
Resolution Imaging

Imaging of the crotoxin crystal in vitreous ice at 3.9 Å resolution

1987 ◽  
Vol 45 ◽  
pp. 646-647
Author(s):  
L. L. Degn
Keyword(s):  
High Resolution ◽  
Crystallographic Analysis ◽  
Specimen Preparation ◽  
High Resolution Imaging ◽  
Technical Problems ◽  
Resolution Electron ◽  
Resolution Imaging ◽  
Diffraction Patterns ◽  
Crotalus Durissus ◽  
Complex Crystal

The crotoxin complex is a 24,500 dalton neurotoxic protein isolated from the venom of the Brazilian rattlesnake Crotalus durissus terrificus. The crotoxin complex crystallizes as thin crystals suitable for high resolution 3-D reconstruction by electron crystallographic analysis. High resolution imaging of an untilted crotoxin complex crystal embedded in glucose has been reported. Presented here is high resolution (3.9 Å) imaging of an untilted crotoxin complex crystal embedded in vitreous ice.Several technical problems are involved in the collection of high resolution electron crystallographic data for 3-D reconstruction. First, the specimen should be as flat as possible on the grid since bending due to specimen preparation or due to beam-induced movement may cause smeared reflections in electron diffraction patterns or optical diffractograms, a phenomenon that is particularly noticeable in highly tilted specimens.

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