Advances in Stem Instrumentation for Biology

Author(s):  
J. S. Wall

The forte of the Scanning transmission Electron Microscope (STEM) is high resolution imaging with high contrast on thin specimens, as demonstrated by visualization of single heavy atoms. of equal importance for biology is the efficient utilization of all available signals, permitting low dose imaging of unstained single molecules such as DNA.Our work at Brookhaven has concentrated on: 1) design and construction of instruments optimized for a narrow range of biological applications and 2) use of such instruments in a very active user/collaborator program. Therefore our program is highly interactive with a strong emphasis on producing results which are interpretable with a high level of confidence.The major challenge we face at the moment is specimen preparation. The resolution of the STEM is better than 2.5 A, but measurements of resolution vs. dose level off at a resolution of 20 A at a dose of 10 el/A2 on a well-behaved biological specimen such as TMV (tobacco mosaic virus). To track down this problem we are examining all aspects of specimen preparation: purification of biological material, deposition on the thin film substrate, washing, fast freezing and freeze drying. As we attempt to improve our equipment/technique, we use image analysis of TMV internal controls included in all STEM samples as a monitor sensitive enough to detect even a few percent improvement. For delicate specimens, carbon films can be very harsh-leading to disruption of the sample. Therefore we are developing conducting polymer films as alternative substrates, as described elsewhere in these Proceedings. For specimen preparation studies, we have identified (from our user/collaborator program ) a variety of “canary” specimens, each uniquely sensitive to one particular aspect of sample preparation, so we can attempt to separate the variables involved.

Author(s):  
A. V. Crewe

The high resolution STEM is now a fact of life. I think that we have, in the last few years, demonstrated that this instrument is capable of the same resolving power as a CEM but is sufficiently different in its imaging characteristics to offer some real advantages.It seems possible to prove in a quite general way that only a field emission source can give adequate intensity for the highest resolution^ and at the moment this means operating at ultra high vacuum levels. Our experience, however, is that neither the source nor the vacuum are difficult to manage and indeed are simpler than many other systems and substantially trouble-free.


Author(s):  
L. Gandolfi ◽  
J. Reiffel

Calculations have been performed on the contrast obtainable, using the Scanning Transmission Electron Microscope, in the observation of thick specimens. Recent research indicates a revival of an earlier interest in the observation of thin specimens with the view of comparing the attainable contrast using both types of specimens.Potential for biological applications of scanning transmission electron microscopy has led to a proliferation of the literature concerning specimen preparation methods and the controversy over “to stain or not to stain” in combination with the use of the dark field operating mode and the same choice of technique using bright field mode of operation has not yet been resolved.


Author(s):  
J. Liu ◽  
G. E. Spinnler

The morphology of metallic nano particles fluctuates and rapidly changes under the influence of electron beam irradiation. Structural transformations of small Au particles and disordering of small Pt clusters have been reported. Although the existence of a quasimolten state in nano particles has been experimentally observed there are still many unanswered questions concerning the onset of this unstable state. The previous experiments were carried out in non-UHV microscopes and the particles were prepared ex situ. We report preliminary observations of the evolution of clean Ag nano particles in a UHV scanning transmission electron microscope (STEM).The experiments were performed on a UHV STEM (VG HB-501S), known by the acronym MIDAS (Microscope for Imaging, Diffraction and Analysis of Surfaces). The probe size used for nanodiffraction was approximately 1 nm in diameter with a beam current density of 104 A/cm2. Silver nano particles were formed by evaporating Ag onto a pre-cleaned thin (< 5 nm in thickness) carbon film inside the UHV specimen preparation chamber attached to the MIDAS column.x


Author(s):  
J. S. Wall ◽  
J. F. Hainfeld

Mass measurement with the Scanning Transmission Electron Microscope (STEM) is a technique with wide application which has been developed in several laboratories. It is especially useful for particle identification in micrographs or in measurements of mass per unit length and mass distribution within a complex object.The accuracy of mass measurements is determined by random errors (Counting statistics, substrate thickness variation) and systematic errors (biochemical degradation, salt, specimen preparation artifacts, radiation damage). Random errors can be estimated from previous studies and range from 1-10%.


2004 ◽  
Vol 12 (6) ◽  
pp. 26-29 ◽  
Author(s):  
Toshie Yaguchi ◽  
Yasushi Kuroda ◽  
Mitsuru Konno ◽  
Takeo Kamino ◽  
Tsuyohsi Ohnishi ◽  
...  

In characterization or failure analysis of new materials and semiconductor devices, the requirements for three dimensional observation and analysis are rapidly increasing. We discuss techniques for specimen preparation, three-dimensional observation, and elemental analysis of semiconductor devices that we developed using a system consisting of a dedicated focused ion beam (FIB) instrument and a scanning transmission electron microscope (STEM). The system utilizes a FIB-STEM compatible specimen holder with a specially designed rotation mechanism, which allows 360° rotation of a specimen on a conical stage (needle stub) around the ion beam axis of the FIB system and 360° rotation perpendicular to the electron beam in the STEM. A piece of sample (micro sample) is extracted from a specific-site by the micro-sampling technique and mounted on the needle stub. Instruments used in the study are the Hitachi FB-2100 FIB system with a micro-sampling attachment and the HD-2300 field emission 200kV STEM.


2014 ◽  
Vol 20 (5) ◽  
pp. 1605-1618 ◽  
Author(s):  
Tian T. Li ◽  
Stephanie N. Bogle ◽  
John R. Abelson

AbstractFluctuation electron microscopy can reveal the nanoscale order in amorphous materials via the statistical variance in the scattering intensity as a function of position, scattering vector, and resolution. However, several sources of experimental artifacts can seriously affect the magnitude of the variance peaks. The use of a scanning transmission electron microscope for data collection affords a convenient means to check whether artifacts are present. As nanodiffraction patterns are collected in serial, any spatial or temporal dependence of the scattering intensity across the series can easily be detected. We present examples of the major types of artifact and methods to correct the data or to avoid the problem experimentally. We also re-cast the statistical formalism used to identify sources of noise in view of the present results. The present work provides a basis on which to perform fluctuation electron microscopy with a high level of reliability and confidence in the quantitative magnitude of the data.


Author(s):  
J.S. Wall ◽  
J.F. Hainfeld ◽  
K.D. Chung

Mass measurements with the Scanning Transmission Electron Microscope (STEM) provide a direct link between biochemistry and the information in the dark field STEM image of an unstained biological specimen. Total mass of a complex mass of individual components, mass per unit length, mass per unit area, or change in mass distribution following biochemical treatment, are easily determined.Accuracy and preparation requirements have been described elsewhere. In the past year, we have made significant progress in specimen preparation, developing a “wet film” technique which eliminates the need for glow discharge treatment of grids. The method is similar to the Valentine technique but uses minute quantities of specimen. A thin carbon film is evaporated under UHV conditions onto freshly cleaved rock salt. The thin carbon is floated off the rock salt onto distilled water and a titanium grid with a thick, holey carbon film laid on top of it. After a few minutes, the grid is picked up from above by grasping its edge with a tweezer and turned over so that the adhering drop of water is facing upward.


Author(s):  
P. S. D. Lin

In assessing the resolving power of a high resolution scanning electron microscope using field emission tip (Hitachi HFS-2), two types of specimens were found to be of value.Fig. 1a, 1b are two successive exposures of some bright spots found on some thin carbon films. These carbon films were originally prepared for work in a high resolution scanning transmission electron microscope. Spots similar in size and distribution have been detected on micrographs taken in that microscope (Fig. 2).


Author(s):  
Barbara J. Turpin ◽  
Po-Fu Huang ◽  
Amy Roos ◽  
Peter H. McMurry

Collection and preservation strategies and a routine analysis procedure were developed for elemental analysis of individual atmospheric particles using a scanning-transmission electron microscope (STEM) equipped with a super ultra-thin window energy dispersive x-ray detector. These techniques were applied to airborne particles collected at Meadview, AZ, a remote site just downriver of the Grand Canyon. Collection, preservation and beam damage issues of concern in electron microscopic analysis of atmospheric particles will be discussed. Aerosol compositions are usually determined from bulk particle measurements, and it is assumed that compounds are either internally mixed (all present in each particle) or externally mixed (particles each contain a single compound). Insight into the microscopic mixing characteristics of atmospheric aerosols will ultimately further the understanding of atmospheric particle transformation, visibility degradation, and the fate of airborne pollutants.Particles were collected in the summer of 1992 in three size fractions (1.0-0.5 μm, 0.5-0.26 μm, 0.26-0.12 μm in diameter) using a Hering Low Pressure Impactor and a 250 Å thick silver film substrate supported by a silver TEM grid.


1998 ◽  
Vol 4 (S2) ◽  
pp. 660-661
Author(s):  
Y. Xin ◽  
N.D. Browning ◽  
S.J. Pennycook ◽  
P.D. Nellist ◽  
S. Sivananthan ◽  
...  

Wide gap nitride semiconductors have attracted significant attention recently due to their promising performance as short-wavelength light emitting diodes (LEDs) and blue lasers. One interesting issue concerning GaN is that the material is relatively insensitive to the presence of a density of dislocations which is six orders of magnitude higher than that for III-V arsenide and phosphide based LEDs. Although it is well known that these dislocations originate at the film-substrate interface during film growth, thread through the whole epilayer with line direction along <0001> and are perfect dislocations with Burgers vectors of a, c, or c+a, the reason why they have such a small effect on the properties of GaN is unclear.To develop a fundamental understanding of the properties of these dislocations, the core structures are studied here by high resolution Z-contrast imaging in a 300kV VG HB603 scanning transmission electron microscope (STEM) with a resolution of 0.13nm.


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