Transmission Electron Microscope Specimen Preparation of Metal Matrix Composites Using the Focused Ion Beam Miller

1999 ◽  
Vol 5 (S2) ◽  
pp. 892-893
Author(s):  
J.M. Cairney ◽  
R.D. Smith ◽  
P.R. Munroe
Keyword(s):  
Metal Matrix Composites ◽  
Metal Matrix ◽  
Focused Ion Beam ◽  
Materials Science ◽  
Volume Fraction ◽  
Ion Beam ◽  
Semiconductor Industry ◽  
Specimen Preparation ◽  
Matrix Composites ◽  
Thin Foils

The focused ion beam (FIB) miller has been widely accepted as a powerful tool in the semiconductor industry. However, it is now finding applications in more general materials science applications. The high resolution, energetic gallium ion beam can rapidly and precisely section materials to reveal their internal structure; one particularly valuable application being the preparation of thin foils for TEM examination, especially from heterogenous materials.To date, TEM sample preparation using FIBs has concentrated on semiconductor cross-sections [1], powders [2], and surface treated materials, e.g. galvanized steels [3]. However, thin foils of grossly heterogeneous materials, such as metal-matrix composites, are also difficult to prepare using conventional methods and are therefore well suited to sectioning using the FIB. In this study, thin foils were prepared from two composite materials: a 7075 aluminium alloy containing a 20% volume fraction of SiC particles and a FeAl alloy containing a 60% volume fraction of WC particles.

FIB Techniques for Analysis of Metallurgical Specimens

2000 ◽  
Vol 6 (S2) ◽  
pp. 524-525 ◽  
Author(s):  
Michael W. Phaneuf ◽  
Jian Li
Keyword(s):  
Focused Ion Beam ◽  
Materials Science ◽  
Ion Beam ◽  
Semiconductor Industry ◽  
Zirconium Alloys ◽  
Chemical Information ◽  
Specimen Preparation ◽  
Orientation Contrast ◽  
Imaging Tool ◽  
Zinc Coatings

Focused ion beam (FIB) microscopes, the use of which is well established in the semiconductor industry, are rapidly gaining attention in the field of materials science, both as a tool for producing site specific, parallel sided TEM specimens and as a stand alone specimen preparation and imaging tool.Both FIB secondary ion images (FIB SII) and FIB secondary electron images (FIB SEI) contain novel crystallographic and chemical information. The ability to see “orientation contrast” in FIB SEI and to a lesser extent SII is well known for cubic materials and more recently stress-free FIB sectioning combined with FIB imaging have been shown to reveal evidence of plastic deformation in metallic specimens. Particularly in hexagonal metals, FIB orientation contrast is sometimes reduced or eliminated by the FIB sectioning process. We have successfully employed FIB gas assisted etching during FIB sectioning using XeF2 for zirconium alloys and Cl2 for zinc coatings on steels to retain orientation contrast during subsequent imaging.

Transmission Electron Microscope Specimen Preparation of Metal Matrix Composites Using the Focused Ion Beam Miller

2000 ◽  
Vol 6 (5) ◽  
pp. 452-462 ◽  
Author(s):  
Julie M. Cairney ◽  
Robert D. Smith ◽  
Paul R. Munroe
Keyword(s):  
Electron Microscope ◽  
Metal Matrix Composites ◽  
Transmission Electron Microscope ◽  
Metal Matrix ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Matrix Composites ◽  
Transmission Electron ◽  
The Matrix ◽  
Ceramic Reinforcement

AbstractTransmission electron microscope samples of two types of metal matrix composites were prepared using both traditional thinning methods and the more novel focused ion beam miller. Electropolishing methods were able to produce, very rapidly, thin foils where the matrix was electron transparent, but the ceramic reinforcement particles remained unthinned. Thus, it was not possible in these foils to study either the matrix-reinforcement interface or the microstructure of the reinforcement particles themselves. In contrast, both phases in the composites prepared using the focused ion beam miller thinned uniformly. The interfaces in these materials were clearly visible and the ceramic reinforcement was electron transparent. However, microstructural artifacts associated with ion beam damage were also observed. The extent of these artifacts and methods of minimizing their effect were dependent on both the materials and the milling conditions used.

Redeposition Effects in TEM Sample Preparation of Feal-Based Metal Matrix Composites using the Focused Ion Beam Miller

2000 ◽  
Vol 6 (S2) ◽  
pp. 514-515
Author(s):  
Julie M. Cairney ◽  
Paul R. Munroe
Keyword(s):  
Electron Microscope ◽  
Cross Sections ◽  
Focused Ion Beam ◽  
Materials Science ◽  
Ion Beam ◽  
Semiconductor Industry ◽  
Specific Area ◽  
Matrix Composites ◽  
Positional Accuracy ◽  
Areas Of Interest

The focused ion beam miller (FIB) has been widely used in the semiconductor industry for many years, but only recently has its potential as a tool for materials science been recognised. The FIB uses a highly energetic beam of gallium ions to sputter material such that it can precisely section, as well as image, areas of interest. The FIB can be used to create crosssections, which can be examined in the FIB or in a scanning electron microscope (SEM). Cross sections can be made from delicate samples or samples in which a specific area needs to be viewed, for example to check the thickness of coatings or for failure analysis.The FIB may also be used to prepare transmission electron microscope (TEM) specimens [1]. Extremely site-specific thin areas may be prepared with high positional accuracy from heterogeneous samples such as composites or layered structures.

scholarly journals Predictive Computational Model for Damage Behavior of Metal-Matrix Composites Emphasizing the Effect of Particle Size and Volume Fraction

Materials ◽  
2021 ◽  
Vol 14 (9) ◽  
pp. 2143
Author(s):  
Shaimaa I. Gad ◽  
Mohamed A. Attia ◽  
Mohamed A. Hassan ◽  
Ahmed G. El-Shafei
Keyword(s):  
Finite Element ◽  
Metal Matrix Composites ◽  
Metal Matrix ◽  
Volume Fraction ◽  
Particulate Composites ◽  
Aluminum Matrix Composites ◽  
Matrix Composites ◽  
Zone Method ◽  
Stress Strain ◽  
The Matrix

In this paper, an integrated numerical model is proposed to investigate the effects of particulate size and volume fraction on the deformation, damage, and failure behaviors of particulate-reinforced metal matrix composites (PRMMCs). In the framework of a random microstructure-based finite element modelling, the plastic deformation and ductile cracking of the matrix are, respectively, modelled using Johnson–Cook constitutive relation and Johnson–Cook ductile fracture model. The matrix-particle interface decohesion is simulated by employing the surface-based-cohesive zone method, while the particulate fracture is manipulated by the elastic–brittle cracking model, in which the damage evolution criterion depends on the fracture energy cracking criterion. A 2D nonlinear finite element model was developed using ABAQUS/Explicit commercial program for modelling and analyzing damage mechanisms of silicon carbide reinforced aluminum matrix composites. The predicted results have shown a good agreement with the experimental data in the forms of true stress–strain curves and failure shape. Unlike the existing models, the influence of the volume fraction and size of SiC particles on the deformation, damage mechanism, failure consequences, and stress–strain curve of A359/SiC particulate composites is investigated accounting for the different possible modes of failure simultaneously.

Thermomechanical Behavior of Low CTE Metal-Matrix Composites Fabricated Through Ultrasonic Additive Manufacturing

2012 ◽  
Author(s):  
Ryan Hahnlen ◽  
Marcelo J. Dapino
Keyword(s):  
Shear Strength ◽  
Additive Manufacturing ◽  
Metal Matrix Composites ◽  
Metal Matrix ◽  
Volume Fraction ◽  
Large Strain ◽  
Matrix Composites ◽  
Interface Shear ◽  
Mechanical Coupling ◽  
Ultrasonic Additive Manufacturing

Shape memory and superelastic NiTi are often utilized for their large strain recovery and actuation properties. The objective of this research is to utilize the stresses generated by pre-strained NiTi as it is heated in order to tailor the CTE of metal-matrix composites. The composites studied consist of an Al 3003-H18 matrix with embedded NiTi ribbons fabricated through an emerging rapid prototyping process called Ultrasonic Additive Manufacturing (UAM). The thermally-induced strain of the composites is characterized and results show that the two key parameters in adjusting the effective CTE are the NiTi volume fraction and prestrain of the embedded NiTi. From the observed behavior, a constitutive composite model is developed based constitutive SMA models and strain matching composite models. Additional composites were fabricated to characterize the NiTi-Al interface through EDS and DSC. These methods were used to investigate the possibility of metallurgical bonding between the ribbon and matrix and determine interface shear strength. Interface investigation indicates that mechanical coupling is accomplished primarily through friction and the shear strength of the interface is 7.28 MPa. Finally, using the developed model, a composite was designed and fabricated to achieve a near zero CTE. The model suggests that the finished composite will have a zero CTE at a temperature of 135°C.

High Resolution FIB as a General Materials Science Tool

1998 ◽  
Vol 4 (S2) ◽  
pp. 492-493 ◽  
Author(s):  
M.W. Phaneuf ◽  
J. Li ◽  
T. Malis
Keyword(s):  
Integrated Circuit ◽  
Focused Ion Beam ◽  
Materials Science ◽  
Ion Beam ◽  
General Purpose ◽  
Ion Source ◽  
Specimen Preparation ◽  
Ion Beam Sputtering ◽  
Imaging Characteristics ◽  
Beam Sputtering

Focused Ion Beam or FIB systems have been used in integrated circuit production for some time. The ability to combine rapid, precision focused ion beam sputtering or gas-assisted ion etching with focused ion beam deposition allows for rapid-prototyping of circuit modifications and failure analysis of defects even if they are buried deep within the chip's architecture. Inevitably, creative TEM researchers reasoned that a FIB could be used to produce site specific parallel-sided, electron transparent regions, thus bringing about the rather unique situation wherein the specimen preparation device often was worth as much as the TEM itself.More recently, FIB manufacturers have concentrated on improving the resolution and imaging characteristics of these instruments, resulting in a more general-purpose characterization tool. The Micrion 2500 FIB system used in this study is capable of 4 nm imaging resolution using either secondary electron or secondary ions, both generated by a 50 kV liquid metal gallium ion source.

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