Secondary Electron Contrast in Molecular Liquids

1998 ◽  
Vol 4 (S2) ◽  
pp. 288-289
Author(s):  
B.L. Thiel ◽  
D.J. Stokes ◽  
A.M. Donald
Keyword(s):  
Cross Sections ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Colloidal Suspensions ◽  
Environmental Scanning ◽  
Ionization Cross ◽  
Relative Contrast ◽  
Initial Generation ◽  
Ionization Cross Sections

Liquid containing specimens can be stabilized for observation in the Environmental Scanning Electron Microscope (ESEM). It is also possible to examine systems that are primarily liquid, such as colloidal suspensions and gels, or even possess a multi-component liquid microstructure as in emulsions.(l) In order for such investigations to be useful, an understanding of the origins of secondary electron contrast in liquids is necessary. Our aim here is not to produce a complete theory of secondary electron emission in these systems, but to provide general guidelines for discriminating between two liquids based on relative contrast.Secondary electron emission from a substance is determined by three processes: creation, transport through the material, and escape from the surface.(2) Contrast between two regions will be due to differences in one or more of these processes. Initial generation of secondary electrons is primarily a function of the ionization cross-sections of the substance and its density.

scholarly journals Secondary Electron Emission from Solid Surfaces Bombarded by Medium Energy Ions

1971 ◽  
Vol 24 (4) ◽  
pp. 859 ◽  
Author(s):  
ER Cawthron
Keyword(s):  
Cross Sections ◽  
Secondary Electron Emission ◽  
Statistical Treatment ◽  
Solid Surfaces ◽  
Ionization Cross ◽  
Positive Ions ◽  
Interaction Processes ◽  
Reasonable Range ◽  
Ionization Cross Sections ◽  
Positive Ion

The results of Cawthron, Cotterell, and Oliphant for the emission of electrons produced by bombardment of a metal surface with various kinds of positive ions are compared with the predictions of proposed theories. It is seen that the complexity of the interaction processes occurring when a positive ion enters a surface is such that the emission process can only be described in a non-analytical manner, using a statistical treatment. The following discussion indicates that the observed results can be predicted qualitatively over a reasonable range of bombarding energies for many targets and ions by applying the theory of Parilis and Kishinevski. The energy loss cross sections, as well as the actual ionization cross sections, are shown to be important factors in determining the total emission.

Historical Introduction

1977 ◽  
Vol 35 ◽  
pp. 2-5
Author(s):  
R. D. Heidenreich
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
50Th Anniversary ◽  
Secondary Emission ◽  
Wave Nature ◽  
Nobel Prize In Physics ◽  
Primary Electrons ◽  
The U.S ◽  
Mutual Agreement

This program has been organized by the EMSA to commensurate the 50th anniversary of the experimental verification of the wave nature of the electron. Davisson and Germer in the U.S. and Thomson and Reid in Britian accomplished this at about the same time. Their findings were published in Nature in 1927 by mutual agreement since their independent efforts had led to the same conclusion at about the same time. In 1937 Davisson and Thomson shared the Nobel Prize in physics for demonstrating the wave nature of the electron deduced in 1924 by Louis de Broglie.The Davisson experiments (1921-1927) were concerned with the angular distribution of secondary electron emission from nickel surfaces produced by 150 volt primary electrons. The motivation was the effect of secondary emission on the characteristics of vacuum tubes but significant deviations from the results expected for a corpuscular electron led to a diffraction interpretation suggested by Elasser in 1925.

SEM and Auger microanalysis studies of Cu-Be dynode surfaces at each activation condition

1978 ◽  
Vol 36 (1) ◽  
pp. 524-525
Author(s):  
T. Koshikawa ◽  
Y. Fujii ◽  
E. Sugata ◽  
F. Kanematsu
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Life Time ◽  
Activation Process ◽  
Beam Diameter ◽  
Activation Temperature ◽  
Electron Multiplier ◽  
Activation Condition ◽  
Activation Conditions

The Cu-Be alloys are widely used as the electron multiplier dynodes after the adequate activation process. But the structures and compositions of the elements on the activated surfaces were not studied clearly. The Cu-Be alloys are heated in the oxygen atmosphere in the usual activation techniques. The activation conditions, e.g. temperature and O2 pressure, affect strongly the secondary electron yield and life time of dynodes.In the present paper, the activated Cu-Be dynode surfaces at each condition are investigated with Scanning Auger Microanalyzer (SAM) (primary beam diameter: 3μmϕ) and SEM. The commercial Cu-Be(2%) alloys were polished with Cr2O3 powder, rinsed in the distilled water and set in the vacuum furnance.Two typical activation condition, i.e. activation temperature 730°C and 810°C in 5x10-3 Torr O2 pressure were chosen since the formation mechanism of the BeO film on the Cu-Be alloys was guessed to be very different at each temperature from the results of the secondary electron emission measurements.

SEM analysis of DC magnetron sputtered beryllium films

1988 ◽  
Vol 46 ◽  
pp. 960-961
Author(s):  
E. F. Lindsey ◽  
C. W. Price ◽  
E. L. Pierce ◽  
E. J. Hsieh
Keyword(s):  
Fine Structure ◽  
Electron Emission ◽  
Secondary Electron ◽  
Low Voltage ◽  
Ion Beam ◽  
Secondary Electron Emission ◽  
Sem Analysis ◽  
Fused Silica ◽  
Grain Structure ◽  
Silica Substrate

Columnar structures produced by DC magnetron sputtering can be altered by using RF biased sputtering or by exposing the film to nitrogen pulses during sputtering, and these techniques are being evaluated to refine the grain structure in sputtered beryllium films deposited on fused silica substrates. Beryllium is brittle, and fractures in sputtered beryllium films tend to be intergranular; therefore, a convenient technique to analyze grain structure in these films is to fracture the coated specimens and examine them in an SEM. However, fine structure in sputtered deposits is difficult to image in an SEM, and both the low density and the low secondary electron emission coefficient of beryllium seriously compound this problem. Secondary electron emission can be improved by coating beryllium with Au or Au-Pd, and coating also was required to overcome severe charging of the fused silica substrate even at low voltage. The coating structure can obliterate much of the fine structure in beryllium films, but reasonable results were obtained by using the high-resolution capability of an Hitachi S-800 SEM and either ion-beam coating with Au-Pd or carbon coating by thermal evaporation.

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