A Comparison of the Elemental Concentrations Obtained using X-ray Microanalysis of Bulk Cryofractured and Ultrathin Cryosectioned Mucus Layer of the Airway Surface Liquid in Mouse Trachea

2001 ◽  
Vol 7 (S2) ◽  
pp. 998-999
Author(s):  
C.A. Ackerley ◽  
G. Kent ◽  
Y.M. Heng ◽  
A. Tilups ◽  
L.E. Becker
Keyword(s):  
Thin Film ◽  
Filter Paper ◽  
Airway Surface Liquid ◽  
Mucus Layer ◽  
X Ray ◽  
Major Function ◽  
Cellular Debris ◽  
Surface Liquid ◽  
The Individual ◽  
Pathological Material

The airways are lined with a thin film consisting of two layers. A watery layer, the airway surface liquid (ASL) surrounds the cilia and its major function is to serve as a medium for ciliary boating of mucus out of the respiratory system. The other layer is a viscous mucus layer consisting mainly of airway cellular secretions and cellular debris.The composition and effects of altered concentrations of the constitutive elements in the ASL and mucus layer remain a mystery. in human patients, attempts have been made to determine the composition of these layers by sampling with a filter paper by touching it to the mucosa and wetting it by capillary action. This material was then removed from the filter paper and quantitative analyses using energy dispersive x-ray spectrometry (EDS) and a Hall’s thin film correction routine performed on the residue. Although differences were detected between normal and pathological material, these results did not reflect the composition of the individual layers but an average of both.Attempts have been made to determine the elemental composition of these layers in intact and in cultured rabbit trachea, bovine trachea and hamster trachea.

Determination of the Mechanical Response of Thin Films with X-Rays

1993 ◽  
Vol 308 ◽  
Author(s):  
I. C. Noyan ◽  
G. Sheikh
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Response ◽  
Strain Analysis ◽  
Local Strain ◽  
X Rays ◽  
Stress Strain ◽  
X Ray ◽  
The Individual

ABSTRACTThe mechanical response of a specimen incorporating thin films is dictated by a combination of fundamental mechanical parameters such as Young's moduli of the individual layers, and by configurational parameters such as adhesion strength at the interface(s), residual stress distribution and other process dependent factors. In most systems, the overall response will be dominated by the properties of the (much thicker) substrate. Failure within the individual layers, on the other hand, is dependent on the local strain distributions and can not be predicted from the substrate values alone. To better understand the mechanical response of these systems, the strain within the individual layers of the thin film system must be measured and correlated with applied stresses. Phase selectivity of X-ray stress/strain analysis techniques is well suited for this purpose. In this paper, we will review the use of the traditional x-ray stress/strain analysis methods for the determination of the mechanical properties of thin film systems.

Crystallinity of rf-sputtered MoS2 films

1987 ◽  
Vol 2 (6) ◽  
pp. 827-838 ◽  
Author(s):  
Jeffrey R. Lince ◽  
Paul D. Fleischauer
Keyword(s):  
Thin Film ◽  
Substrate Surface ◽  
Accurate Information ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Plane ◽  
Diffraction Peaks ◽  
The Individual ◽  
Steel Substrates ◽  
Quality Control Test

The crystallinity and morphology of thin, radio-frequency (rf) -sputtered MoS2 films deposited on 440C stainless steel substrates at both ambient (∼70°C) and high temperatures (245°C) were studied by scanning electron microscopy (SEM) and by x-ray diffraction (Read thin-film photography and 0−20 scans). Under SEM the films exhibited a “ridgelike” (or platelike) formation region for thicknesses between 0.18 and 1.0 μm MoS2. X-ray diffraction was shown to give more detailed and accurate information than electron defraction, previously used for elucidating the structure of sputtered lubricant films. Read thin-film x-ray diffraction photographs revealed patterns consistent with the presence of polycrystalline films and strong orientation of the MoS2 crystallites. Correlation of those patterns with 0−20 scans of the films indicated that the basal planes of the MoS2 crystallites [i.e., the (001) planes] were perpendicular to the substrate surface plane, and that various edge planes [i.e., the (h k 0) planes] in the individual crystallites were parallel to the surface plane, in agreement with previous observations of thinner films. Sliding wear caused the crystallites to orient with their basal planes parallel to the surface plane. The crystallite lattices in all films in this study were shown to exhibit compressive stress (∼ 3%–5% with respect to natural molybdenite) in the direction perpendicular to the (h k 0) planes, and the worn films were expanded (i.e., exhibited tensile stress) perpendicular to the (001) plane. In addition, the shapes of the x-ray diffraction peaks were strongly influenced by the presence of oxygen impurities and/or sulfur vacancies in the MoS2 lattice, indicating that x-ray diffraction may provide a simple quality-control test for the production of a film with optimum lubricating properties.

scholarly journals Composition of Airway Surface Liquid Determined by X-ray Microanalysis

2006 ◽  
Vol 111 (1) ◽  
pp. 137-153 ◽  
Author(s):  
Inna Kozlova ◽  
Viengphet Vanthanouvong ◽  
Johannesson Marie ◽  
Godfried M. Roomans
Keyword(s):  
Airway Surface Liquid ◽  
X Ray ◽  
Surface Liquid

X-ray fluorescence determination of Ni, Ti and Nb in memory alloys using solution and thin film samples with an internal standard

2019 ◽  
Vol 11 (28) ◽  
pp. 3619-3622
Author(s):  
L. F. Tian ◽  
Y. C. Dai ◽  
D. S. Zou ◽  
T. C. Lei ◽  
S. K. Huang
Keyword(s):  
Thin Film ◽  
Filter Paper ◽  
Internal Standard ◽  
X Ray ◽  
Xrf Analysis ◽  
Fluorescence Determination ◽  
Paper Disk ◽  
Filter Paper Disk

Specimen for XRF analysis of high content of Ni, Ti and Nb in memory alloys, prepared by solution (a) and a filter paper disk (b).

Correlation of Thin Film Measurement Techniques for Device Packaging Processes

2014 ◽  
Author(s):  
J. Walter ◽  
W. Mack ◽  
C.Y. Lee ◽  
C. Gspan
Keyword(s):  
Thin Film ◽  
Semiconductor Industry ◽  
Measurement Techniques ◽  
Fluorescence Analysis ◽  
Thin Layers ◽  
Layer System ◽  
Tem Analysis ◽  
X Ray ◽  
The Individual ◽  
Non Destructive

Abstract The analysis of thin layers in semiconductor components represents a central point in the quality control of semiconductor companies. Not only to control production processes, but to successfully operate also reverse engineering, reliable thin-film measurement methods are essential. In this work, non-destructive thin film EDX (energy dispersive X-ray micro analysis) software and μXRF (micro x-ray fluorescence analysis) were compared with TEM analysis. These methods ensure a high lateral resolution which is essential in the analysis of semiconductor structures. As an example, four different, for the semiconductor industry interesting, very thin coating systems in the nanometer range have been tested. In the individual cases best TEM detector contrast settings could be found, as well as optimum fluorescence lines settings on the EDX to minimize the errors. The TEM measurements, in thickness and composition, were compared to the thin film EDX software and the μXRF method results to determine their accuracy. It turns out that depending on the layer system recalibration with multilayer standards or at least with elemental standards is recommended. It could be shown that with μXRF and thin film EDX a reliable, rapid and non-destructive layer analysis is possible.

Elemental Composition of Airway Surface Liquid in the Pig Determined by X-Ray Microanalysis

2005 ◽  
Vol 32 (1) ◽  
pp. 59-64 ◽  
Author(s):  
Inna Kozlova ◽  
Viengphet Vanthanouvong ◽  
Birgitta Almgren ◽  
Marieann Högman ◽  
Godfried M. Roomans
Keyword(s):  
Elemental Composition ◽  
Airway Surface Liquid ◽  
X Ray ◽  
Surface Liquid

scholarly journals Measurements of airway surface liquid height and mucus transport by fluorescence microscopy, and of ion composition by X-ray microanalysis

2004 ◽  
Vol 3 ◽  
pp. 135-139 ◽  
Author(s):  
Godfried M. Roomans ◽  
Inna Kozlova ◽  
Harriet Nilsson ◽  
Viengphet Vanthanouvong ◽  
Brian Button ◽  
...  
Keyword(s):  
Fluorescence Microscopy ◽  
Airway Surface Liquid ◽  
Ion Composition ◽  
X Ray ◽  
Liquid Height ◽  
Surface Liquid

Investigations of CuInSe2 Thin Films and Contact

1990 ◽  
Vol 187 ◽  
Author(s):  
S. Raud ◽  
Quat T. Vu ◽  
M-A. Nicolet ◽  
G. A. Pollock ◽  
K. W. Mitchell ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Contact Stability ◽  
The Individual

AbstractWe study the properties of CuInSe2 thin films grown on glass and on Mo substrates. The investigation is carried out with X-ray diffraction, RBS, XTEM and SEM.CuInSe2/Mo contact stability is investigated after annealing at 600°C. RBS reveals that this treatment induces an interdiffusion between the metal and the chalcopyrite. To clarify this reaction, we have investigated the individual thin-film couples upon annealing. RBS and X-ray diffraction reveal insignificant interaction between Mo/Cu and Mo/In, but Se reacts with Mo.

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