Assessment of Deformation using the Focused Ion Beam Technique

2000 ◽  
Vol 6 (S2) ◽  
pp. 530-531
Author(s):  
M.G. Burke ◽  
P.T. Duda ◽  
G. Botton ◽  
M. W. Phaneuf
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Site Specificity ◽  
Alloy 600 ◽  
The Past ◽  
Transmission Electron ◽  
Wide Range ◽  
Potential Applications ◽  
Beam Technique ◽  
Significant Attention

Focused Ion Beam (FIB) micromachining techniques have gained significant attention over the past few years as a promising method for the preparation of a variety of metallic and nonmetallic materials for subsequent characterization using transmission electron microscopy (TEM) The advantage of the FIB in terms of site specificity and speed for the preparation of uniform electron transparent sections has opened a wide range of potential applications in materials characterization. The ability to image the sample in the FIB can also provide important microstructural data for materials analysis. In this study, both conventionally electropolished and FIB-ed specimens were prepared in order to characterize the microstructure of a commercially-produced tube of Alloy 600 (approximately Ni-15 Cr-10 Fe- 0.05 C). The electropolished samples were prepared using a solution of 20% HClO4 - 80% CH3OH at ∼-40°C. The FIB sections were obtained from a cross-section of the tube that had been mechanically thinned to ∼100 μm. The section was thinned in a Micrion 2500 FIB system with a Ga ion beam at 50 kV accelerating voltage.

scholarly journals Sample Preparation Methodologies for In Situ Liquid and Gaseous Cell Analytical Transmission Electron Microscopy of Electropolished Specimens

2016 ◽  
Vol 22 (6) ◽  
pp. 1350-1359 ◽  
Author(s):  
Xiang Li Zhong ◽  
Sibylle Schilling ◽  
Nestor J. Zaluzec ◽  
M. Grace Burke
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Focused Ion Beam ◽  
General Procedure ◽  
Ion Beam ◽  
Metals And Alloys ◽  
Stainless Steel Sample ◽  
Transmission Electron ◽  
Wide Range

AbstractIn recent years, an increasing number of studies utilizing in situ liquid and/or gaseous cell scanning/transmission electron microscopy (S/TEM) have been reported. Because of the difficulty in the preparation of suitable specimens, these environmental S/TEM studies have been generally limited to studies of nanoscale structured materials such as nanoparticles, nanowires, or sputtered thin films. In this paper, we present two methodologies which have been developed to facilitate the preparation of electron-transparent samples from conventional bulk metals and alloys for in situ liquid/gaseous cell S/TEM experiments. These methods take advantage of combining sequential electrochemical jet polishing followed by focused ion beam extraction techniques to create large electron-transparent areas for site-specific observation. As an example, we illustrate the application of this methodology for the preparation of in situ specimens from a cold-rolled Type 304 austenitic stainless steel sample, which was subsequently examined in both 1 atm of air as well as fully immersed in a H2O environment in the S/TEM followed by hyperspectral imaging. These preparation techniques can be successfully applied as a general procedure for a wide range of metals and alloys, and are suitable for a variety of in situ analytical S/TEM studies in both aqueous and gaseous environments.

Microstructural Characterization of Dehydrogenated Products of the LiBH4-YH3 Composite

2014 ◽  
Vol 20 (6) ◽  
pp. 1798-1804 ◽  
Author(s):  
Ji Woo Kim ◽  
Kee-Bum Kim ◽  
Jae-Hyeok Shim ◽  
Young Whan Cho ◽  
Kyu Hwan Oh
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Microstructural Characterization ◽  
Static Vacuum ◽  
Lithium Borohydride ◽  
Transmission Electron ◽  
Resolution Imaging ◽  
Yttrium Hydride ◽  
Beam Technique

AbstractThe dehydrogenated microstructure of the lithium borohydride-yttrium hydride (LiBH4-YH3) composite obtained at 350°C under 0.3 MPa of hydrogen and static vacuum was investigated by transmission electron microscopy combined with a focused ion beam technique. The dehydrogenation reaction between LiBH4 and YH3 into LiH and YB4 takes place under 0.3 MPa of hydrogen, which produces YB4 nano-crystallites that are uniformly distributed in the LiH matrix. This microstructural feature seems to be beneficial for rehydrogenation of the dehydrogenation products. On the other hand, the dehydrogenation process is incomplete under static vacuum, leading to the unreacted microstructure, where YH3 and YH2 crystallites are embedded in LiBH4 matrix. High resolution imaging confirmed the presence of crystalline B resulting from the self-decomposition of LiBH4. However, Li2B12H12, which is assumed to be present in the LiBH4 matrix, was not clearly observed.

New Transmission Electron Microscope Characterization Techniques from Precision Focused Ion Beam Membranes

1999 ◽  
Vol 5 (S2) ◽  
pp. 886-887
Author(s):  
R. Hull ◽  
D. Dunn ◽  
J. Demarest ◽  
D.T. Mathes
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Dissimilar Materials ◽  
Three Dimensions ◽  
Constant Thickness ◽  
Specimen Preparation ◽  
Contrast Imaging ◽  
Transmission Electron ◽  
Wide Range ◽  
Characterization Of Materials

The combination of focused ion beam (FIB) sputtering with transmission electron microscopy (TEM) offers new opportunities for the nanoscale characterization of materials. The FIB may be used to prepare membranes for TEM imaging which are: (i) Site selective, i.e. the membranes may be placed with sub-micron precision in all three dimensions, (ii) Largely free of differential sputtering artifacts, such that membranes may be prepared which are of constant thickness from structures with very dissimilar materials, and (iii) Of precisely known geometry.The challenges associated with FIB specimen preparation will also be discussed and are summarized in Figure 1: (a) Surface amorphization damage, (b) Residual differential sputtering effects, (c) Redeposition of sputtered material and (d) Membrane bowing due to internal or beaminduced stresses. It will be demonstrated that each of these effects can be sufficiently controlled to allow high quality diffraction contrast imaging in a wide range of materials.

Focused ion beam technique and transmission electron microscope studies of microdiamonds from the Saxonian Erzgebirge, Germany

2003 ◽  
Vol 210 (3-4) ◽  
pp. 399-410 ◽  
Author(s):  
Larissa F. Dobrzhinetskaya ◽  
Harry W. Green ◽  
Matthew Weschler ◽  
Mark Darus ◽  
Young-Chung Wang ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Transmission Electron ◽  
Beam Technique

scholarly journals Focused Ion Beam in the Study of Biomaterials and Biological Matter

2012 ◽  
Vol 2012 ◽  
pp. 1-6 ◽  
Author(s):  
Kathryn Grandfield ◽  
Håkan Engqvist
Keyword(s):  
Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Life Sciences ◽  
X Ray ◽  
The Past ◽  
Biological Matter ◽  
Dual Beam ◽  
Transmission Electron ◽  
Environmental Sem

The application of focused ion beam (FIB) techniques in the life sciences has progressed by leaps and bounds over the past decade. A once dedicated ion beam instrument, the focused ion beam today is generally coupled with a plethora of complementary tools such as dual-beam scanning electron microscopy (SEM), environmental SEM, energy dispersive X-ray spectroscopy (EDX), or cryogenic possibilities. All of these additions have contributed to the advancement of focused ion beam use in the study of biomaterials and biological matter. Biomaterials, cells, and their interfaces can be routinely imaged, analyzed, or prepared for techniques such as transmission electron microscopy (TEM) with this comprehensive tool. Herein, we review the uses, advances, and challenges associated with the application of FIB techniques to the life sciences, with particular emphasis on TEM preparation of biomaterials, biological matter, and their interfaces using FIB.

Correlation Between Microstructure and Hardness of the Weld HAZ in Grade 100 Microalloyed Steel

2004 ◽  
Author(s):  
K. Poorhaydari ◽  
B. M. Patchett ◽  
D. G. Ivey
Keyword(s):  
Grain Size ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Bainitic Ferrite ◽  
Coarse Grained ◽  
Fine Grained ◽  
Weld Thermal Cycle ◽  
Thin Foils ◽  
Transmission Electron ◽  
Beam Technique

The weld thermal cycle results in significant changes in microstructure and, consequently, mechanical properties of the weld heat affected zone (HAZ). In this paper, hardness variations across the HAZ and for different welding heat inputs (0.5–2.5 kJ/mm), obtained in a Grade 100 microalloyed steell, are explained based on the microstructural observations. Micro- and nano-hardness examination provided hardness profiles across the HAZ and nano-distribution of hardness in each HAZ sub-region, respectively. Optical microscopy and transmission electron microscopy (TEM) were used for evaluation of grain size, phase structure and precipitate type, shape and distribution. Both carbon replicas and thin foils (prepared by focused ion beam technique) were used for TEM. The fine-grained HAZ for all heat inputs was primarily composed of polygonal ferrite, with some regions of twinned martensite in the higher heat input (1.5 and 2.5 kJ/mm) samples. Twinned martensite regions were also identified in the coarse-grained HAZ of the 0.5 kJ/mm sample. Grain size changes were the major cause for the variation of hardness in the fine-grained HAZ; however, large packets of bainitic ferrite and martensite in the coarse-grained HAZ, with small ferrite/martensite laths, were responsible for the relative hardening in the coarse-grained HAZ.

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