Quantification and Mitigation of Electron-Beam-Induced Carbon Contamination

AbstractThe surface properties of hydroxyapatite, including electric charge, can influence the biological response, tissue compatibility, and adhesion of biological cells and biomolecules. Results reported here help in understanding this influence by creating charged domains on hydroxyapatite thin films deposited on silicon using electron beam irradiation and investigating their shape, properties, and carbon contamination for different doses of incident injected charge by two methods. Photoluminescence laser scanning microscopy was used to image electrostatic charge trapped at pre-existing and irradiation-induced defects within these domains, while phase imaging in atomic force microscopy was used to image the carbon contamination. Scanning Auger electron spectroscopy and Kelvin probe force microscopy were used as a reference for the atomic force microscopy phase contrast and photoluminescence laser scanning microscopy measurements. Our experiment shows that by combining the two imaging techniques the effects of trapped charge and carbon contamination can be separated. Such separation yields new possibilities for advancing the current understanding of how surface charge influences mediation of cellular and protein interactions in biomaterials.

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A carbon contamination cleaning of gold film by electron beam irradiation with minimum structural damages

Journal of the Korean Physical Society ◽

10.3938/jkps.71.467 ◽

2017 ◽

Vol 71 (8) ◽

pp. 467-470 ◽

Cited By ~ 1

Author(s):

D. J. Park ◽

T. H. Kang ◽

D. S. Kim ◽

H. T. Kim ◽

S. B. Choi

Keyword(s):

Electron Beam ◽

Electron Beam Irradiation ◽

Gold Film ◽

Beam Irradiation ◽

Carbon Contamination

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Removal of carbon contamination in ETEM by introducing Ar during electron beam irradiation

Journal of Microscopy ◽

10.1111/jmi.12759 ◽

2018 ◽

Vol 273 (1) ◽

pp. 46-52 ◽

Cited By ~ 2

Author(s):

T. TOKUNAGA ◽

K. SAITO ◽

K. KUNO ◽

K. HIGUCHI ◽

Y. YAMAMOTO ◽

...

Keyword(s):

Electron Beam ◽

Electron Beam Irradiation ◽

Beam Irradiation ◽

Carbon Contamination

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Direct writing of gold nanostructures with an electron beam: On the way to pure nanostructures by combining optimized deposition with oxygen-plasma treatment

Beilstein Journal of Nanotechnology ◽

10.3762/bjnano.8.253 ◽

2017 ◽

Vol 8 ◽

pp. 2530-2543 ◽

Cited By ~ 5

Author(s):

Domagoj Belić ◽

Mostafa M Shawrav ◽

Emmerich Bertagnolli ◽

Heinz D Wanzenboeck

Keyword(s):

Electron Beam ◽

Plasma Treatment ◽

Oxygen Plasma ◽

Gold Nanostructures ◽

Oxygen Plasma Treatment ◽

Direct Write ◽

Direct Writing ◽

Organic Precursor ◽

Carbon Contamination ◽

Step Process

This work presents a highly effective approach for the chemical purification of directly written 2D and 3D gold nanostructures suitable for plasmonics, biomolecule immobilisation, and nanoelectronics. Gold nano- and microstructures can be fabricated by one-step direct-write lithography process using focused electron beam induced deposition (FEBID). Typically, as-deposited gold nanostructures suffer from a low Au content and unacceptably high carbon contamination. We show that the undesirable carbon contamination can be diminished using a two-step process – a combination of optimized deposition followed by appropriate postdeposition cleaning. Starting from the common metal-organic precursor Me2-Au-tfac, it is demonstrated that the Au content in pristine FEBID nanostructures can be increased from 30 atom % to as much as 72 atom %, depending on the sustained electron beam dose. As a second step, oxygen-plasma treatment is established to further enhance the Au content in the structures, while preserving their morphology to a high degree. This two-step process represents a simple, feasible and high-throughput method for direct writing of purer gold nanostructures that can enable their future use for demanding applications.

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Electron Beam Bombardment Induced Decrease of Cathodoluminescence Intensity from GaN Not Caused by Absorption in Buildup of Carbon Contamination

MRS Internet Journal of Nitride Semiconductor Research ◽

10.1557/s1092578300000430 ◽

2004 ◽

Vol 9 ◽

Cited By ~ 8

Author(s):

Eva M. Campo ◽

G. S. Cargill III ◽

Milan Pophristic ◽

Ian Ferguson

Keyword(s):

Electron Beam ◽

Electric Fields ◽

Alternative Explanation ◽

Charge Injection ◽

Band Edge ◽

Near Band Edge ◽

Carbon Contamination ◽

Cathodoluminescence Intensity

Monochromatic CL imaging, CL spectra, WDS spectra, and EDS spectra and imaging demonstrate that electron beam bombardment of LEO-GaN causes decrease of near band edge cathodoluminescence intensity that cannot be attributed to absorption in a growing carbon contamination layer. An alternative explanation is needed, such as generation of defects, or charge injection and buildup of internal electric fields, caused by electron beam bombardment.

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Electron beam influence on the carbon contamination of electron irradiated hydroxyapatite thin films

Applied Surface Science ◽

10.1016/j.apsusc.2015.03.214 ◽

2015 ◽

Vol 346 ◽

pp. 342-347 ◽

Cited By ~ 5

Author(s):

Radu Hristu ◽

Stefan G. Stanciu ◽

Denis E. Tranca ◽

George A. Stanciu

Keyword(s):

Thin Films ◽

Electron Beam ◽

Carbon Contamination

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Techniques for Transmission Electron Microscopy of Fiber-Matrix Interfaces in Aluminum Alloy-Boron Composites by Ion Erosio

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100065079 ◽

1971 ◽

Vol 29 ◽

pp. 204-205

Author(s):

G. G. Shaw

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Aluminum Alloy ◽

Electron Beam ◽

Pure Aluminum ◽

Ion Milling ◽

Transmission Electron ◽

Fiber Matrix ◽

Ion Erosion ◽

Row Of Fibers

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.

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Temperature Dependence of the Critical Electron Dose for Fatty Acid Monolayers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100053188 ◽

1982 ◽

Vol 40 ◽

pp. 78-79

Author(s):

Kenneth H. Downing ◽

Robert M. Glaeser

Keyword(s):

Electron Beam ◽

Fatty Acid ◽

Inelastic Scattering ◽

Temperature Dependence ◽

Structural Damage ◽

Direct Result ◽

Second Step ◽

Strong Temperature Dependence ◽

Electron Dose ◽

Covalent Bonds

The structural damage of molecules irradiated by electrons is generally considered to occur in two steps. The direct result of inelastic scattering events is the disruption of covalent bonds. Following changes in bond structure, movement of the constituent atoms produces permanent distortions of the molecules. Since at least the second step should show a strong temperature dependence, it was to be expected that cooling a specimen should extend its lifetime in the electron beam. This result has been found in a large number of experiments, but the degree to which cooling the specimen enhances its resistance to radiation damage has been found to vary widely with specimen types.

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