Microscopy and Microanalysis '98, Atlanta, Georgia

1998 ◽  
Vol 4 (1) ◽  
pp. 80-80
Author(s):  
Kathi Alexander ◽  
Jay Jerome
Keyword(s):  
Biological Sciences ◽  
Energy Dispersive Spectrometry ◽  
State Of The Art ◽  
Atom Probe ◽  
Physical Sciences ◽  
Probe Field ◽  
The Core ◽  
Analysis Society ◽  
Ion Microscopy ◽  
Microbeam Analysis Society

Joint meeting of the Microscopy Society of America (56th) and the Microbeam Analysis Society (32nd).An exciting and diverse set of meeting activities has been arranged for the upcoming gathering of microscopists and micro-analysts in Atlanta, Georgia in July. The meeting should prove to have something for everybody. The core of the Microscopy and Microanalysis '98 meeting consists of state-of-the-art symposia in the areas of Advances in Instrumentation and Techniques and in Applications of Microscopy and Microanalysis in the areas of biological sciences and physical sciences. Invited speakers include world-renown researchers from 14 different countries. Of special interest are symposia celebrating 30 Years of Energy Dispersive Spectrometry in Microanalysis (specially sponsored by MAS), 30 Years of Atom Probe Field Ion Microscopy, and a pre-meeting workshop and meeting symposia on that topic have also been scheduled this year.

Welcome From The Program Committee

2004 ◽  
Vol 10 (S02) ◽  
pp. 61-61
Keyword(s):  
Biological Sciences ◽  
State Of The Art ◽  
Program Committee ◽  
Physical Sciences ◽  
Current State ◽  
Hands On ◽  
Analysis Society ◽  
Poster Presentations ◽  
Executive Program ◽  
Microbeam Analysis Society

The Executive Program Group for Microscopy and Microanalysis 2004 set out with the challenge of drafting a compelling scientific program for the annual meetings of the Microscopy Society of America (MSA) and the Microbeam Analysis Society (MAS) that would be equal to the excitement of organizational change being discussed by the societies. We feel that we have met the challenge, providing a diverse and balanced program that looks forward to new opportunities and presents the current state-of-the-art for microscopy and microanalysis. For the third consecutive year, the program is strengthened by the co-sponsorship of the International Metallographic Society (IMS), which is fast becoming an annual partner in the M&M meetings. M&M is the largest annual meeting of its kind in the world, and features an awesome commercial exhibit of microscopy and microanalysis equipment and accessories, with the latest commercial innovations featured and available for hands-on demonstration. We envision Savannah as a venue that will be remembered for historic steps forward in science and technology. The heart of the program comprises symposia in areas of biological sciences applications, physical sciences applications, and advances in instrumentation and technique, which feature both invited and contributed papers, and both platform and poster presentations. Contributed sessions are featured in a comprehensive topical listing.

Welcome form the Program Committee

2006 ◽  
Vol 12 (S1) ◽  
pp. 48-48
Author(s):  
Paul Kotula ◽  
Mike Marko ◽  
Raynald Gauvin ◽  
Gabriel Lucas ◽  
Steven Dekanich ◽  
...  
Keyword(s):  
State Of The Art ◽  
Program Committee ◽  
The State ◽  
Scientific Program ◽  
Physical Sciences ◽  
The World ◽  
Analysis Society ◽  
Microscopical Society ◽  
Executive Program ◽  
Microbeam Analysis Society

Microscopy and Microanalysis 2006 will be the premiere meeting of the year for scientists and technologists interested in learning about the latest advances in applications and techniques for the analysis of a broad range of materials in the biological and physical sciences, as well as nano- and bio-technology. M&M-2006 will again host the largest commercial exhibition of microscopy and microanalysis equipment and related accessories in the world. In addition to the usual sponsoring societies, the Microscopy Society of America (MSA), and the Microbeam Analysis Society (MAS), the International Metallographic Society (IMS) will again be a co-sponsoring society for the meeting. We are also fortunate that the Microscopical Society of Canada/Société de Microscopie du Canada (MSC/SMC) will also be co-sponsoring the meeting this year. The M&M-2006 Executive Program Committee, comprised of co-chairs from each of the sponsoring societies, has put together a comprehensive scientific program that will encompass the state-of-the art in microscopy and microanalysis in 2006, and we look forward to welcoming you to Navy Pier!

An Improved Method for the Preparation and TEM Examination of Sharp Pointed Tips used in APFIM and STM

1990 ◽  
Vol 48 (2) ◽  
pp. 102-103
Author(s):  
E.A. Fischione ◽  
P.E. Fischione ◽  
J.J. Haugh ◽  
M.G. Burke
Keyword(s):  
Atom Probe ◽  
Preparation Process ◽  
Improved Method ◽  
Ion Milling ◽  
Polishing Process ◽  
Probe Field ◽  
Scanning Tunnelling ◽  
Stm Tips ◽  
Tunnelling Microscopy ◽  
Ion Microscopy

A common requirement for both Atom Probe Field-Ion Microscopy (APFIM) and Scanning Tunnelling Microscopy (STM) is a sharp pointed tip for use as either the specimen (APFIM) or the probe (STM). Traditionally, tips have been prepared by either chemical or electropolishing techniques. Recently, ion-milling has been successfully employed in the production of APFIM tips [1]. Conventional electropolishing techniques are applicable to a wide variety of metals, but generally require careful manual adjustments during the polishing process and may also be time-consuming. In order to reduce the time and effort involved in the preparation process, a compact, self-contained polishing unit has been developed. This system is based upon the conventional two-stage electropolishing technique in which the specimen/tip blank is first locally thinned or “necked”, and subsequently electropolished until separation occurs.[2,3] The result of this process is the production of two APFIM or STM tips. A mechanized polishing unit that provides these functions while automatically maintaining alignment has been designed and developed.

Site Occupation Determinations in Ni3Ai by Atom Probe

1986 ◽  
Vol 81 ◽  
Author(s):  
M.K. Miller ◽  
J.A. Horton
Keyword(s):  
Phase Diagrams ◽  
Ternary Phase ◽  
Atom Probe ◽  
Zone Axis ◽  
Strong Preference ◽  
Probe Field ◽  
Site Occupation ◽  
Weak Preference ◽  
Ternary Phase Diagrams ◽  
Ion Microscopy

AbstractThe site occupation of three substitutional elements, hafnium, iron and cobalt, in substoichiometric Ni3Al was determined from atom probe field-ion microscopy. The hafnium was found to have a strong preference for the aluminum sites, the cobalt had a strong preference for the nickel sites, and the iron had a weak preference for the aluminum sites. The atom probe results were in agreement with zone axis electron channeling microanalysis of the same alloys and predictions from the position of the solubility lobes in the ternary phase diagrams.

Atom-probe field ion microscopy

1992 ◽  
Vol 107 (3-6) ◽  
pp. 95-104 ◽  
Author(s):  
Manfred Leisch
Keyword(s):  
Atom Probe ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy
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