Size-Resolved Single-Particle Fluorescence Spectrometer for Real-Time Analysis of Bioaerosols: Laboratory Evaluation and Atmospheric Measurements

2019 ◽  
Vol 53 (22) ◽  
pp. 13257-13264 ◽  
Author(s):  
Minghui Zhang ◽  
Thomas Klimach ◽  
Nan Ma ◽  
Tobias Könemann ◽  
Christopher Pöhlker ◽  
...  
2017 ◽  
Vol 2017 (1) ◽  
pp. 000280-000285
Author(s):  
J. Craig Prather ◽  
Michael Bolt ◽  
Haley Harrell ◽  
Tyler Horton ◽  
John Manobianco ◽  
...  

Abstract This work outlines the development and testing of novel in-situ atmospheric sensors. The system is designed for deployment of the sensors en masse to increase the geospatial density of atmospheric measurements. This sensor system is being designed to replace the costly, larger atmospheric sensors currently in use. Improvement in sensor technologies, substrates, and additive manufacturing techniques have allowed for such a device to be realizable. The devices contain a sensor suite that gathers temperature, relative humidity, and pressure from microsensors as well as position, velocity, and heading from a compact GPS receiver. This data is then sent to a base station for analysis by atmospheric scientists, with the potential for real time analysis.


Author(s):  
R.P. Goehner ◽  
W.T. Hatfield ◽  
Prakash Rao

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.


2020 ◽  
Vol 67 (4) ◽  
pp. 1197-1205 ◽  
Author(s):  
Yuki Totani ◽  
Susumu Kotani ◽  
Kei Odai ◽  
Etsuro Ito ◽  
Manabu Sakakibara

2021 ◽  
Vol 2021 (4) ◽  
pp. 7-16
Author(s):  
Sivaraman Eswaran ◽  
Aruna Srinivasan ◽  
Prasad Honnavalli

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