Characterization of the Paper Coating Structure Using Focused Ion Beam and Field-Emission Scanning Electron Microscopy. 2. Structural Variation Depending on the Glass Transition Temperature of an S/B Latex

2018 ◽  
Vol 57 (49) ◽  
pp. 16718-16726 ◽  
Author(s):  
Jee-Hong Lee ◽  
Hak Lae Lee
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Glass Transition ◽  
Transition Temperature ◽  
Structural Variation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Coating Structure ◽  
Scanning Electron

scholarly journals Bridging the gap: 3D real-space characterization of colloidal assemblies via FIB-SEM tomography

Nanoscale ◽  
2019 ◽  
Vol 11 (12) ◽  
pp. 5304-5316 ◽  
Author(s):  
Jessi E. S. van der Hoeven ◽  
Ernest B. van der Wee ◽  
D. A. Matthijs de Winter ◽  
Michiel Hermes ◽  
Yang Liu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Real Space ◽  
Particle Level ◽  
Particle Assemblies ◽  
Space Characterization ◽  
Scanning Electron

Focused ion beam-scanning electron microscopy tomography for quantitative real space studies of particle assemblies on a single particle level.

3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam-Scanning Electron Microscopy

2012 ◽  
Vol 18 (S2) ◽  
pp. 614-615
Author(s):  
J. Lin ◽  
W. Heeschen ◽  
J. Reffner ◽  
J. Hook
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Pigment Dispersion ◽  
Beam Scanning ◽  
Paint Films ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

Langmuir ◽  
2020 ◽  
Vol 36 (11) ◽  
pp. 2816-2822 ◽  
Author(s):  
Takashi Kakubo ◽  
Katsunori Shimizu ◽  
Akemi Kumagai ◽  
Hiroaki Matsumoto ◽  
Miki Tsuchiya ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Polymer Interface ◽  
Metal Polymer ◽  
Scanning Electron

Focused ion beam scanning electron microscopy in biology

2014 ◽  
Vol 254 (3) ◽  
pp. 109-114 ◽  
Author(s):  
C. KIZILYAPRAK ◽  
J. DARASPE ◽  
B.M. HUMBEL
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Scanning Electron
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