Direct Observation of the Outermost Surfaces of Mesoporous Silica Thin Films by High Resolution Ultralow Voltage Scanning Electron Microscopy

Langmuir ◽  
2017 ◽  
Vol 33 (9) ◽  
pp. 2148-2156 ◽  
Author(s):  
Maho Kobayashi ◽  
Kyoka Susuki ◽  
Haruo Otsuji ◽  
Yusuke Sakuda ◽  
Shunsuke Asahina ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Mesoporous Silica ◽  
Direct Observation ◽  
Silica Thin Films ◽  
Voltage Scanning ◽  
Scanning Electron

Radiation damage of mesoporous silica thin films monitored by X-ray reflectivity and scanning electron microscopy

2012 ◽  
Vol 427 (1-3) ◽  
pp. 411-414 ◽  
Author(s):  
S. Dourdain ◽  
X. Deschanels ◽  
G. Toquer ◽  
C. Grygiel ◽  
I. Monnet ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Mesoporous Silica ◽  
Radiation Damage ◽  
X Ray ◽  
Silica Thin Films ◽  
Scanning Electron

scholarly journals Morphological Characterization of Ordered Meso-Pores on a Mesoporous Silica by using High-Resolution Scanning Electron Microscopy

2011 ◽  
Vol 17 (S2) ◽  
pp. 1912-1913
Author(s):  
Y Ohrai ◽  
T Sunaoshi ◽  
H Ito ◽  
T Ogashiwa ◽  
N Ikawa ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Mesoporous Silica ◽  
Morphological Characterization ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Practical method for high-resolution imaging of polymers by low-voltage scanning electron microscopy

Scanning ◽  
2004 ◽  
Vol 26 (3) ◽  
pp. 122-130 ◽  
Author(s):  
Cedric Gaillard ◽  
Pierre A. Stadelmann ◽  
Christopher J. G. Plummer ◽  
Gilbert Fuchs
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Low Voltage ◽  
Practical Method ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
Voltage Scanning ◽  
Scanning Electron

scholarly journals Direct observation and analysis of yolk-shell materials using low-voltage high-resolution scanning electron microscopy: Nanometal-particles encapsulated in metal-oxide, carbon, and polymer

APL Materials ◽  
2014 ◽  
Vol 2 (11) ◽  
pp. 113317 ◽  
Author(s):  
Shunsuke Asahina ◽  
Mitsuo Suga ◽  
Hideyuki Takahashi ◽  
Hu Young Jeong ◽  
Carolina Galeano ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Metal Oxide ◽  
Direct Observation ◽  
Low Voltage ◽  
Scanning Electron
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