scholarly journals Pore Size-Dependent Structure of Confined Water in Mesoporous Silica Films from Water Adsorption/Desorption Using ATR–FTIR Spectroscopy

Langmuir ◽  
2019 ◽  
Vol 35 (37) ◽  
pp. 11986-11994 ◽  
Author(s):  
Bettina Baumgartner ◽  
Jakob Hayden ◽  
Jérôme Loizillon ◽  
Sophia Steinbacher ◽  
David Grosso ◽  
...  
RSC Advances ◽  
2021 ◽  
Vol 11 (17) ◽  
pp. 10010-10017
Author(s):  
Ping-Chung Kuo ◽  
Zhi-Xun Lin ◽  
Tzi-Yi Wu ◽  
Chun-Han Hsu ◽  
Hong-Ping Lin ◽  
...  

Mesoporous silica films were used as supports with high loading capacity and enzyme activity.


RSC Advances ◽  
2016 ◽  
Vol 6 (113) ◽  
pp. 111787-111796 ◽  
Author(s):  
Shang Liu ◽  
Guixiang Ma ◽  
Shaolei Xie ◽  
Yongzhong Jia ◽  
Jinhe Sun ◽  
...  

Phase transition regulation was achieved by imbibing adipic acid into mesoporous silica chambers, on the basis of pore size-dependent thermal behaviour.


2020 ◽  
Vol 11 (9) ◽  
pp. 3731-3737 ◽  
Author(s):  
Yan Yan ◽  
Man Li ◽  
Sophia King ◽  
Tiphaine Galy ◽  
Michal Marszewski ◽  
...  

2008 ◽  
Vol 607 ◽  
pp. 30-33 ◽  
Author(s):  
Laszlo Lizkay ◽  
C. Corbel ◽  
P. Perez ◽  
P. Desgardin ◽  
Marie France Barthe ◽  
...  

Positron annihilation gamma energy distribution, lifetime spectroscopy and time-of-flight method were used to study surfactant-templated mesoporous silica films deposited on glass. The lifetime depth profiling was correlated to Doppler broadening and 3γ annihilation fraction measurements to determine the annihilation characteristics inside the films. A set of consistent fingerprints for positronium annihilation, o-Ps reemission into vacuum, and pore size was directly determined. The lifetime measurements were performed in reflection mode with a specially designed lifetime spectrometer mounted on a slow positron beam system. The intensity of the 142 ns vacuum lifetime component was recorded as a function of the energy of the positron beam. In a film with high porosity a reemission efficiency of as high as 40 % was found at low positron energy. Positron lifetime in samples capped by a thin silica layer was used to determine the pore size. The energy of the reemitted o-Ps fraction was measured by a time-of-flight detector, mounted on the same system, allowing determination of both o-Ps re-emission efficiency and energy in the same sample. We demonstrate the potential of the simultaneous use of different positron annihilation techniques in the study of thin porous films.


2010 ◽  
Vol 12 (26) ◽  
pp. 6928 ◽  
Author(s):  
Natalia Pérez-Hernández ◽  
Trung Quan Luong ◽  
Cirilo Pérez ◽  
Julio D. Martín ◽  
Martina Havenith

2015 ◽  
Vol 40 (12) ◽  
pp. 2731 ◽  
Author(s):  
Chi-Kuang Sun ◽  
Borwen You ◽  
Yu-Ru Huang ◽  
Kao-Hsiang Liu ◽  
Shusaku Sato ◽  
...  

2021 ◽  
Author(s):  
Wahid Ullah ◽  
Gregoire Herzog ◽  
neus vila ◽  
Alain Walcarius

Indium-tin oxide electrodes modified with vertically aligned silica nanochannel membrane have been produced by electrochemically assisted self-assembly of cationic surfactants (cetyl- or octadecyl-trimethylammonium bromide) and concomitant polycondensation of the silica...


2013 ◽  
Vol 102 (4) ◽  
pp. 967-974 ◽  
Author(s):  
Xiupeng Wang ◽  
Xia Li ◽  
Atsuo Ito ◽  
Yu Sogo ◽  
Tadao Ohno

1998 ◽  
Vol 4 (S2) ◽  
pp. 726-727
Author(s):  
C. A. Drewien ◽  
Y. Lu ◽  
C. J. Brinker ◽  
R. Ganguli ◽  
M. T. Anderson

Processing can be controlled to produce a family of mesoporous silica films with either disordered, lamellar, hexagonal, or cubic pore distributions[l]. These films, formed by surfactant-templated synthesis and exhibiting a unimodal pore size, promise potential use as inorganic membranes, catalysts, and optically-based sensors[l,2]. The mesoporous films can be formed from initially homogeneous silica sols by a continuous, surfactant-templated process, which relies upon solvent evaporation during the sol-gel dip-coating process. Films of 100-500 nm thick are formed within seconds in a continuous coating operation. The microstructure of the films is dependent upon the cationic surfactant concentration CTAB (CH3(CH2)15N+(CH3)3Br-) and the dip-coating rate. Several films, processed under differing conditions, were investigated by TEM to characterize pore size, structure, and orientation.Figures 1 a & b show the plan view and cross-sectional microstructure of a 2-d hexagonal mesoporous silica film deposited on silicon; the sample was calcined at 400 °C for 3 hours in air. The images were obtained on a Philips CM30 TEM, operated at 300 kV.


Sign in / Sign up

Export Citation Format

Share Document