Structural and Electrical Properties of EOT HfO2 (<1 nm) Grown on InAs by Atomic Layer Deposition and Its Thermal Stability
2016 ◽
Vol 8
(11)
◽
pp. 7489-7498
◽
Keyword(s):
2011 ◽
Vol 29
(1)
◽
pp. 01A302
◽
2010 ◽
Vol 16
(6)
◽
pp. 953-958
◽
2012 ◽
Vol 47
(3)
◽
pp. 790-793
◽
2018 ◽
Vol 53
(21)
◽
pp. 15237-15245
◽
2019 ◽
Vol 97
◽
pp. 35-39
◽
2012 ◽
Vol 1
(1)
◽
pp. P5-P10
◽