Chiral Chemical Synthesis of DNA Containing (S)-9-(1,3-Dihydroxy-2-propoxymethyl)guanine (DHPG) and Effects on Thermal Stability, Duplex Structure, and Thermodynamics of Duplex Formation

Biochemistry ◽  
1995 ◽  
Vol 34 (28) ◽  
pp. 9235-9248 ◽  
Author(s):  
Stephen J. Marshalko ◽  
Barry I. Schweitzer ◽  
G. Peter Beardsley
Epigenomes ◽  
2021 ◽  
Vol 5 (1) ◽  
pp. 5 ◽  
Author(s):  
Ryohei Wada ◽  
Wataru Yoshida

N6-methyladenine modification (m6dA) has recently been identified in eukaryote genomic DNA. The methylation destabilizes the duplex structure when the adenine forms a Watson–Crick base pair, whereas the methylation on a terminal unpaired adenine stabilizes the duplex structure by increasing the stacking interaction. In this study, the effects of m6dA modification on the thermal stability of four distinct telomeric G-quadruplex (G4) structures were investigated. The m6dA-modified telomeric oligonucleotide d[AGGG(TTAGGG)3] that forms a basket-type G4 in Na+, d[(TTAGGG)4TT] that forms a hybrid-type G4 in K+ (Form-2), d[AAAGGG(TTAGGG)3AA] that forms a hybrid-type G4 in K+ (Form-1), and d[GGG(TTAGGG)3T] that forms a basket-type G4 with two G-tetrads in K+ (Form-3) were analyzed. Circular dichroism melting analysis demonstrated that (1) A7- and A19-methylation destabilized the basket-type G4 structure that formed in Na+, whereas A13-methylation stabilized the structure; (2) A15-methylation stabilized the Form-2 G4 structure; (3) A15- and A21-methylations stabilized the Form-1 G4 structure; and (4) A12-methylation stabilized the Form-3 G4 structure. These results suggest that m6dA modifications may affect the thermal stability of human telomeric G4 structures in regulating the biological functions.


2016 ◽  
Vol 128 (47) ◽  
pp. 14963-14967 ◽  
Author(s):  
John A. Karas ◽  
Nitin A. Patil ◽  
Julien Tailhades ◽  
Marc-Antoine Sani ◽  
Denis B. Scanlon ◽  
...  

2016 ◽  
Vol 55 (47) ◽  
pp. 14743-14747 ◽  
Author(s):  
John A. Karas ◽  
Nitin A. Patil ◽  
Julien Tailhades ◽  
Marc-Antoine Sani ◽  
Denis B. Scanlon ◽  
...  

2020 ◽  
Vol 11 (21) ◽  
pp. 5526-5531
Author(s):  
Muna Msallam ◽  
Hao Sun ◽  
Roman Meledin ◽  
Pauline Franz ◽  
Ashraf Brik

This study describes the chemical synthesis of unmodified and phosphorylated p19INK4d that were characterized by circular dichroism and biochemical methods to examine the effect of phosphorylation on the thermal stability and ubiquitination.


2018 ◽  
Vol 757 ◽  
pp. 87-97 ◽  
Author(s):  
Vikas Shivam ◽  
Joysurya Basu ◽  
Yagnesh Shadangi ◽  
Manish Kumar Singh ◽  
N.K. Mukhopadhyay

Author(s):  
Shiro Fujishiro ◽  
Harold L. Gegel

Ordered-alpha titanium alloys having a DO19 type structure have good potential for high temperature (600°C) applications, due to the thermal stability of the ordered phase and the inherent resistance to recrystallization of these alloys. Five different Ti-Al-Ga alloys consisting of equal atomic percents of aluminum and gallium solute additions up to the stoichiometric composition, Ti3(Al, Ga), were used to study the growth kinetics of the ordered phase and the nature of its interface.The alloys were homogenized in the beta region in a vacuum of about 5×10-7 torr, furnace cooled; reheated in air to 50°C below the alpha transus for hot working. The alloys were subsequently acid cleaned, annealed in vacuo, and cold rolled to about. 050 inch prior to additional homogenization


Author(s):  
Yih-Cheng Shih ◽  
E. L. Wilkie

Tungsten silicides (WSix) have been successfully used as the gate materials in self-aligned GaAs metal-semiconductor-field- effect transistors (MESFET). Thermal stability of the WSix/GaAs Schottky contact is of major concern since the n+ implanted source/drain regions must be annealed at high temperatures (∼ 800°C). WSi0.6 was considered the best composition to achieve good device performance due to its low stress and excellent thermal stability of the WSix/GaAs interface. The film adhesion and the uniformity in barrier heights and ideality factors of the WSi0.6 films have been improved by depositing a thin layer of pure W as the first layer on GaAs prior to WSi0.6 deposition. Recently WSi0.1 has been used successfully as the gate material in 1x10 μm GaAs FET's on the GaAs substrates which were sputter-cleaned prior to deposition. These GaAs FET's exhibited uniform threshold voltages across a 51 mm wafer with good film adhesion after annealing at 800°C for 10 min.


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