“Stapled” Bis(phthalocyaninato)niobium(IV), Pc2Nb:  X-ray Crystal Structure, Chemical and Electrochemical Behavior, and Theoretical Studies. Perspectives for the Use of Pc2Nb (Thin Films) as an “Optically Passive Electrode” in Electrochromic Devices

Using magnetron sputtering technology, the CuInSi thin films were prepared by multilayer synthesized method. The structure of CuInSi films were detected by X-ray diffraction(XRD), the main crystal phase peak is at 2θ=42.458°; The resistivity of films were measured by SDY-4 four-probe meter; The conductive type of the films were tested by DLY-2 conductivity type testing instrument. The results show that the annealing temperature and time effect on the crystal resistivity and crystal structure greatly.

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ChemInform Abstract: Heteronuclear Complexes Containing Group 6 Transition Metals; Chemical, Spectroscopic, and Theoretical Studies on Some Binuclear Complexes and the X-Ray Crystal Structure Determination of (WNi(CO)3(PPh3)2(η5-C5H5)).

ChemInform ◽

10.1002/chin.198809312 ◽

1988 ◽

Vol 19 (9) ◽

Author(s):

L. CARLTON ◽

W. E. LINDSELL ◽

K. J. MCCULLOUGH ◽

P. N. PRESTON

Keyword(s):

Crystal Structure ◽

Transition Metals ◽

Structure Determination ◽

Crystal Structure Determination ◽

Theoretical Studies ◽

Binuclear Complexes ◽

X Ray ◽

Heteronuclear Complexes ◽

Group 6

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Synthesis and reactivity of novel 3-isothiocyanatopropylsilatrane derived from aminopropylsilatrane: X-ray crystal structure and theoretical studies

Journal of Organometallic Chemistry ◽

10.1016/j.jorganchem.2009.10.013 ◽

2010 ◽

Vol 695 (2) ◽

pp. 183-188 ◽

Cited By ~ 19

Author(s):

Raghubir Singh ◽

Jugal Kishore Puri ◽

Varinder Kaur Chahal ◽

Raj Pal Sharma ◽

Paloth Venugopalan

Keyword(s):

Crystal Structure ◽

Theoretical Studies ◽

X Ray

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Obtaining the structure factors for an epitaxial film using Cu X-ray radiation

Journal of Applied Crystallography ◽

10.1107/s002188981302414x ◽

2013 ◽

Vol 46 (6) ◽

pp. 1749-1754 ◽

Cited By ~ 12

Author(s):

P. Wadley ◽

A. Crespi ◽

J. Gázquez ◽

M.A. Roldán ◽

P. García ◽

...

Keyword(s):

Crystal Structure ◽

Thin Films ◽

Structure Factor ◽

Tetragonal Symmetry ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Electron ◽

Structure Factors ◽

Scanning Transmission

Determining atomic positions in thin films by X-ray diffraction is, at present, a task reserved for synchrotron facilities. Here an experimental method is presented which enables the determination of the structure factor amplitudes of thin films using laboratory-based equipment (Cu Kα radiation). This method was tested using an epitaxial 130 nm film of CuMnAs grown on top of a GaAs substrate, which unlike the orthorhombic bulk phase forms a crystal structure with tetragonal symmetry. From the set of structure factor moduli obtained by applying this method, the solution and refinement of the crystal structure of the film has been possible. The results are supported by consistent high-resolution scanning transmission electron microscopy and stoichiometry analyses.

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OS04W0091 A comparison of X-ray stress measurement methods for TiN thin films having fiber texture near single crystal structure

The Abstracts of ATEM International Conference on Advanced Technology in Experimental Mechanics Asian Conference on Experimental Mechanics ◽

10.1299/jsmeatem.2003.2._os04w0091 ◽

2003 ◽

Vol 2003.2 (0) ◽

pp. _OS04W0091-_OS04W0091

Author(s):

Masahide Gotoh ◽

Shouichi Ejiri ◽

Toshihiko Sasaki ◽

Yukio Hirose

Keyword(s):

Crystal Structure ◽

Thin Films ◽

Single Crystal ◽

Stress Measurement ◽

Fiber Texture ◽

Measurement Methods ◽

Single Crystal Structure ◽

X Ray ◽

Tin Thin Films

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Lattice parameters and optical absorption of CuIn1-xGaxSe2 thin films

Canadian Journal of Physics ◽

10.1139/p99-039 ◽

1999 ◽

Vol 77 (7) ◽

pp. 515-520

Author(s):

AAI Al-Bassam

Keyword(s):

Thin Film ◽

Crystal Structure ◽

Thin Films ◽

Grain Size ◽

Lattice Parameters ◽

X Ray Diffraction ◽

X Ray ◽

Lattice Constants ◽

Cubic Structure ◽

Ga Content

Thin film polycrystalline solar cells based on CuIn1xGaxSe2 have been fabricated and studied with x values from 0 to 1.0. The lattice parameters, grain size, and band gap were measured. Crystal structure and X-ray data of CuIn1xGaxSe2 were determined using X-ray diffractometry. These materials had a cubic structure with x ≥ 0.5 and a tetragonal structure with x ≤ 0.5. The lattice constants vary linearly with composition. Grain size was measured using X-ray diffraction where the grain size increased linearly with Ga content. A grain size of 1.83-3.52 μm was observed with x ≤ 0.5, while it increased to 4.53 μm for x = 0.58.PACS No.: 70.73

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