Photocurrent Mapping in High-Efficiency Radial p–n Junction Silicon Nanowire Solar Cells Using Atomic Force Microscopy

2011 ◽  
Vol 115 (44) ◽  
pp. 21981-21986 ◽  
Author(s):  
Jih-Shang Hwang ◽  
Ming-Chun Kao ◽  
Jian-Min Shiu ◽  
Chieh-Ning Fan ◽  
Shien-Chau Ye ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
High Efficiency ◽  
Silicon Nanowire ◽  
Force Microscopy ◽  
Atomic Force

Electroluminescence mapping of CuGaSe2 solar cells by atomic force microscopy

2006 ◽  
Vol 89 (14) ◽  
pp. 143120 ◽  
Author(s):  
Manuel J. Romero ◽  
C.-S. Jiang ◽  
J. Abushama ◽  
H. R. Moutinho ◽  
M. M. Al-Jassim ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Force Microscopy ◽  
Atomic Force

Imaging Electron Transport across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells

2009 ◽  
Vol 1153 ◽  
Author(s):  
Manuel J Romero ◽  
Fude Liu ◽  
Oliver Kunz ◽  
Johnson Wong ◽  
Chun-Sheng Jiang ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electron Transport ◽  
Grain Boundaries ◽  
Polycrystalline Silicon ◽  
High Energy ◽  
Dominant Factor ◽  
Force Microscopy ◽  
Atomic Force

AbstractWe have investigated the local electron transport in polycrystalline silicon (pc-Si) thin-films by atomic force microscopy (AFM)-based measurements of the electron-beam-induced current (EBIC). EVA solar cells are produced at UNSW by <i>EVAporation</i> of a-Si and subsequent <i>solid-phase crystallization</i>–a potentially cost-effective approach to the production of pc-Si photovoltaics. A fundamental understanding of the electron transport in these pc-Si thin films is of prime importance to address the factors limiting the efficiency of EVA solar cells. EBIC measurements performed in combination with an AFM integrated inside an electron microscope can resolve the electron transport across individual grain boundaries. AFM-EBIC reveals that most grain boundaries present a high energy barrier to the transport of electrons for both p-type and n-type EVA thin-films. Furthermore, for p-type EVA pc-Si, in contrast with n-type, charged grain boundaries are seen. Recombination at grain boundaries seems to be the dominant factor limiting the efficiency of these pc-Si solar cells.

Emerging Conductive Atomic Force Microscopy for Metal Halide Perovskite Materials and Solar Cells

2020 ◽  
Vol 10 (10) ◽  
pp. 1903922 ◽  
Author(s):  
Haonan Si ◽  
Suicai Zhang ◽  
Shuangfei Ma ◽  
Zhaozhao Xiong ◽  
Ammarah Kausar ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Metal Halide ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Perovskite Materials ◽  
Metal Halide Perovskite ◽  
Halide Perovskite

Light Trapping by Periodically Structured TCO in the Submicrometer Range

2000 ◽  
Vol 609 ◽  
Author(s):  
Christopher Eisele ◽  
Christoph E. Nebel ◽  
Martin Stutzmann
Keyword(s):  
Solar Cells ◽  
Total Internal Reflection ◽  
High Efficiency ◽  
Light Trapping ◽  
Diffraction Order ◽  
Hydrogenated Silicon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Amorphous Hydrogenated Silicon ◽  
Aluminum Doped Zinc Oxide

ABSTRACTAmorphous hydrogenated silicon (a-Si:H) solar cells need efficient light trapping structures to achieve high efficiency. To this end, aluminum doped zinc oxide (ZnO:Al) as a transparent front contact was periodically structured. Solar cells with grating periods between 390 and 980 nm were realized. The structures were characterized by Atomic Force Microscopy (AFM) and optical reflection. A simple formula for the wavelength where total internal reflection starts is deduced for each diffraction order. Solar cells with a periodic grating show a significant reduction in the overall reflectance which is comparable to cells with an optimized statistical texture.

Electrochemical and atomic force microscopy investigations of the effect of CdS on the local electrical properties of CH3NH3PbI3:CdS perovskite solar cells

2017 ◽  
Vol 5 (46) ◽  
pp. 12112-12120 ◽  
Author(s):  
Mingxuan Guo ◽  
Fumin Li ◽  
Lanyu Ling ◽  
Chong Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electrochemical Impedance Spectroscopy ◽  
Electrochemical Impedance ◽  
Bulk Heterojunction ◽  
Perovskite Solar Cells ◽  
Kelvin Probe ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

The effect of the incorporated CdS on the local optoelectronic properties of CH3NH3PbI3:CdS bulk heterojunction (BHJ) perovskite solar cells (PSCs) are studied using Kelvin probe force microscopy (KPFM), conductive atomic force microscopy (c-AFM) and electrochemical impedance spectroscopy (EIS).

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