Effect of isothermal aging on intermetallic compound layer growth at the interface between Sn-3.5Ag-0.75Cu solder and Cu substrate

2004 ◽  
Vol 39 (13) ◽  
pp. 4211-4217 ◽  
Author(s):  
Jeong-Won Yoon ◽  
Seung-Boo Jung
2005 ◽  
Vol 486-487 ◽  
pp. 273-276
Author(s):  
Dae Gon Kim ◽  
Hyung Sun Jang ◽  
Young Jig Kim ◽  
Seung Boo Jung

In the present work, the growth kinetics of intermetallic compound layer formed in Sn-3.5Ag flip chip solder joints by solid-state isothermal aging was examined at temperatures between 80 and 150 °C for 0 to 60 days. The bumping for the flip chip devices was performed using an electroless under bump metallization. The quantitative analyses were performed on the intermetallic compound layer thickness as a function of aging time and aging temperature. The layer growth of the Ni3Sn4 intermetallic compound followed a parabolic law within a given temperature range. As a whole, because the value of the time exponent (n) is approximately equal to 0.5, the layer growth of the intermetallic compound was mainly controlled by diffusion mechanism in the temperature range studied. The apparent activation energy of the Ni3Sn4 intermetallic was 49.63 kJ/mol.


2004 ◽  
Vol 381 (1-2) ◽  
pp. 151-157 ◽  
Author(s):  
Jeong-Won Yoon ◽  
Young-Ho Lee ◽  
Dae-Gon Kim ◽  
Han-Byul Kang ◽  
Su-Jeong Suh ◽  
...  

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