scholarly journals Easy ultrastructural insight into the internal morphology of biological specimens by Atomic Force Microscopy

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Fabian Christopher Herrmann
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Easy Access ◽  
Experimental Protocol ◽  
Force Microscopy ◽  
The Past ◽  
Atomic Force ◽  
Internal Morphology ◽  
Insight Into ◽  
Microscopic Techniques

AbstractAs a topographical technique, Atomic Force Microscopy (AFM) needs to establish direct interactions between a given sample and the measurement probe in order to create imaging information. The elucidation of internal features of organisms, tissues and cells by AFM has therefore been a challenging process in the past. To overcome this hindrance, simple and fast embedding, sectioning and dehydration techniques are presented, allowing the easy access to the internal morphology of virtually any organism, tissue or cell by AFM. The study at hand shows the applicability of the proposed protocol to exemplary biological samples, the resolution currently allowed by the approach as well as advantages and shortcomings compared to classical ultrastructural microscopic techniques like electron microscopy. The presented cheap, facile, fast and non-toxic experimental protocol might introduce AFM as a universal tool for the elucidation of internal ultrastructural detail of virtually any given organism, tissue or cell.

Atomic Force Microscopy of Industrial Polymers

1999 ◽  
Vol 5 (S2) ◽  
pp. 982-983
Author(s):  
Alan A. Galuska
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Polymer Surface ◽  
Force Microscopy ◽  
The Past ◽  
Atomic Force ◽  
Wear And Tear ◽  
Microscopic Morphology ◽  
Reliable Methods ◽  
Adhesion Friction

The performance of many industrial polymers is determined by the microscopic morphology of the polymers. For example, surface morphology can influence properties such as adhesion, friction, sealing, blocking, printability, wettability, and haze. Furthermore, bulk morphology often controls mechanical properties such as toughness. strength, wear, and tear resistance. In order to optimize polymer performance, quick reliable methods of determining surface and bulk morphology are essential.In the past, electron microscopy (in particular TEM) has been the primary method for determining polymer morphology. However, the usefulness of electron microscopy has been limited by the destructive nature of the electron beam, the naturally poor contrast between polymer types, and the difficulty in preparing (staining, etching, cryogenic ultramicrotoming, etc.) high quality specimens.Recently, the tapping phase-shift mode of atomic force microscopy (TPSAFM) has provided the polymer scientist with a simple, quick, flexible and quantitative method for determining polymer surface and bulk morphology.

scholarly journals Tracking On-Surface Chemistry with Atomic Precision

Synlett ◽  
2017 ◽  
Vol 28 (19) ◽  
pp. 2509-2516 ◽  
Author(s):  
Peter Jacobse ◽  
Marc-Etienne Moret ◽  
Robertus Klein Gebbink ◽  
Ingmar Swart
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Graphene Nanoribbons ◽  
Single Molecule Level ◽  
Force Microscopy ◽  
The Past ◽  
Atomic Force ◽  
Atomic Precision ◽  
Different Types ◽  
Insight Into

The field of on-surface synthesis has seen a tremendous development in the past decade as an exciting new methodology towards atomically well-defined nanostructures. A strong driving force in this respect is its inherent compatibility with scanning probe techniques, which allows one to ‘view’ the reactants and products at the single-molecule level. In this article, we review the ability of noncontact atomic force microscopy to study on-surface chemical reactions with atomic precision. We highlight recent advances in using noncontact atomic force microscopy to obtain mechanistic insight into reactions and focus on the recently elaborated mechanisms in the formation of different types of graphene nanoribbons.

scholarly journals Corrosion Behavior and Mechanical Properties of a Nanocomposite Superhydrophobic Coating

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 652
Author(s):  
Divine Sebastian ◽  
Chun-Wei Yao ◽  
Lutfun Nipa ◽  
Ian Lian ◽  
Gary Twu
Keyword(s):  
Electron Microscopy ◽  
Mechanical Properties ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Nanocomposite Coating ◽  
Superhydrophobic Coating ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Images ◽  
Scanning Electron

In this work, a mechanically durable anticorrosion superhydrophobic coating is developed using a nanocomposite coating solution composed of silica nanoparticles and epoxy resin. The nanocomposite coating developed was tested for its superhydrophobic behavior using goniometry; surface morphology using scanning electron microscopy and atomic force microscopy; elemental composition using energy dispersive X-ray spectroscopy; corrosion resistance using atomic force microscopy; and potentiodynamic polarization measurements. The nanocomposite coating possesses hierarchical micro/nanostructures, according to the scanning electron microscopy images, and the presence of such structures was further confirmed by the atomic force microscopy images. The developed nanocomposite coating was found to be highly superhydrophobic as well as corrosion resistant, according to the results from static contact angle measurement and potentiodynamic polarization measurement, respectively. The abrasion resistance and mechanical durability of the nanocomposite coating were studied by abrasion tests, and the mechanical properties such as reduced modulus and Berkovich hardness were evaluated with the aid of nanoindentation tests.

Defect-Engineered Graded GexSi1-x Buffers on Si (001) with Extreme Low Threading Dislocation Density

1995 ◽  
Vol 378 ◽  
Author(s):  
G. Kissinger ◽  
T. Morgenstern ◽  
G. Morgenstern ◽  
H. B. Erzgräber ◽  
H. Richter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Dislocation Density ◽  
Threading Dislocation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Dislocation Densities ◽  
Threading Dislocation Density

AbstractStepwise equilibrated graded GexSii-x (x≤0.2) buffers with threading dislocation densities between 102 and 103 cm−2 on the whole area of 4 inch silicon wafers were grown and studied by transmission electron microscopy, defect etching, atomic force microscopy and photoluminescence spectroscopy.

A Robust Process for Ion Implant Annealing of SiC in a Low-Pressure Silane Ambient

2004 ◽  
Vol 815 ◽  
Author(s):  
S. Rao ◽  
S.E. Saddow ◽  
F. Bergamini ◽  
R. Nipoti ◽  
Y. Emirov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Secondary Electron ◽  
High Dose ◽  
Rf Power ◽  
Plan View ◽  
Force Microscopy ◽  
Atomic Force ◽  
Process Pressure ◽  
Robust Process

AbstractHigh-dose Al implants in n-type epitaxial layers have been successfully annealed at 1600°C without any evidence of step bunching. Anneals were conducted in a silane ambient and at a process pressure of 150 Torr. Silane, 3% premixed in 97% UHP Ar, was further diluted in a 6 slm Ar carrier gas and introduced into a CVD reactor where the sample was heated via RF induction. A 30 minute anneal was performed followed by a purge in Ar at which time the RF power was switched off. The samples were then studied via plan-view secondary electron microscopy (SEM) and atomic force microscopy (AFM). The resulting surface morphology was step- free and flat.

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

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