Systematic study of the crystallization process of CrAPO-5 using in situ high resolution X-ray diffraction

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

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Time resolved in situ X-ray diffraction study of crystallisation processes of large pore nanoporous aluminophosphate materials

Faraday Discussions ◽

10.1039/c4fd00179f ◽

2015 ◽

Vol 177 ◽

pp. 237-247 ◽

Cited By ~ 5

Author(s):

Kerry Simmance ◽

Wouter van Beek ◽

Gopinathan Sankar

Keyword(s):

Metal Ions ◽

Crystallization Process ◽

Hydrothermal Crystallization ◽

Divalent Metal Ions ◽

X Ray Diffraction ◽

Time Resolved ◽

X Ray ◽

Xrd Study ◽

The One

Time resolved high-resolution X-ray powder diffraction was utilized to obtain detailed changes in the crystal structure parameters during the hydrothermal crystallization process of the nanoporous aluminophosphate AlPO-5 (AFI) structure. This in situ study offered not only the influence of metal ions on the onset of crystallization and estimation of the activation energy of the process, but also allowed us to determine in detail the changes in lattice parameters during this process. More importantly the time-resolved study clearly showed the lattice expansion in the divalent metal ions substituted system right from the on-set of crystallization process, compared to the one without any dopant ions, which suggest that an amorphous or poorly crystalline network is formed prior to crystallization that contains the large divalent ions (compared to Al(iii), the substituting element), which is in agreement with the combined XAS/XRD study reported earlier. A mechanism based on this and the earlier study is suggested.

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Structural evolution of NASICON-type Li1+xAlxGe2−x(PO4)3 using in situ synchrotron X-ray powder diffraction

Journal of Materials Chemistry A ◽

10.1039/c6ta00402d ◽

2016 ◽

Vol 4 (20) ◽

pp. 7718-7726 ◽

Cited By ~ 39

Author(s):

Dorsasadat Safanama ◽

Neeraj Sharma ◽

Rayavarapu Prasada Rao ◽

Helen E. A. Brand ◽

Stefan Adams

Keyword(s):

Solid Electrolyte ◽

Diffraction Study ◽

Powder Diffraction ◽

Structural Evolution ◽

X Ray Diffraction ◽

X Ray ◽

Nasicon Type ◽

Precursor Glass

In situ synchrotron X-ray diffraction study of the synthesis of solid-electrolyte Li1+xAlxGe2−x(PO4)3 (LAGP) from the precursor glass reveals that an initially crystallized dopant poor phase transforms into the Al-doped LAGP at 800 °C.

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In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment

Applied Surface Science ◽

10.1016/j.apsusc.2004.10.145 ◽

2005 ◽

Vol 244 (1-4) ◽

pp. 281-284 ◽

Cited By ~ 28

Author(s):

Naohiko Kato ◽

Ichiro Konomi ◽

Yoshiki Seno ◽

Tomoyoshi Motohiro

Keyword(s):

Thin Films ◽

Heat Treatment ◽

Diffraction Study ◽

Crystallization Process ◽

X Ray Diffraction ◽

X Ray

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Effects of Glass Elements on the Structural Evolution ofin situGrown Ferroelectric Perovskite Crystals in Sol-gel Derived Glass-ceramics

Journal of Materials Research ◽

10.1557/jmr.1997.0156 ◽

1997 ◽

Vol 12 (4) ◽

pp. 1131-1140 ◽

Cited By ~ 15

Author(s):

Kui Yao ◽

Weiguang Zhu ◽

Liangying Zhang ◽

Xi Yao

Keyword(s):

Crystallization Process ◽

Sol Gel ◽

Glass Ceramics ◽

Structural Evolution ◽

Dielectric Measurements ◽

X Ray Diffraction ◽

Process Change ◽

X Ray ◽

Ferroelectric Perovskite

Several ABO3perovskite ferroelectric crystals, PbTiO3, Pb(Zr, Ti)O3, and BaTiO3have beenin situgrown from amorphous gels with glass elements, and the structural evolution has been systematically investigated using x-ray diffraction (XRD), infrared spectra (IR), differential thermal analysis (DTA), thermogravimetric analysis (TGA), and dielectric measurements. It is found that in the Si-contained glass-ceramic systems, Si and B glass elements are incorporated into the crystalline structures, resulting in the variation of the crystallization process, change of lattice constant, and dielectric properties. Some metastable phases expressed by a general formula AxByGzOw(A = Pb and Ba; B = Zr and Ti; G for glass elements, especially for Si) have been observed and discussed.

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Transformation of ferrihydrite to hematite: anin situinvestigation on the kinetics and mechanisms

Mineralogical Magazine ◽

10.1180/minmag.2008.072.1.217 ◽

2008 ◽

Vol 72 (1) ◽

pp. 217-220 ◽

Cited By ~ 10

Author(s):

H. P. Vu ◽

S. Shaw ◽

L. G. Benning

Keyword(s):

High Resolution ◽

Growth Mechanism ◽

Elevated Temperatures ◽

X Ray Diffraction ◽

Electron Microscopic ◽

Time Resolved ◽

X Ray ◽

Resolution Electron ◽

Stage Process

AbstractThe kinetics and mechanisms of the transformation of 2-line ferrihydrite (FH) to hematite (HM), in the presence of Pb at elevated temperatures and high pH condition, were elucidated using synchrotron-based,in situenergy dispersive X-ray diffraction (EDXRD). The time-resolved diffraction data indicated that HM crystallization occurred via a two-stage process. Based on the EDXRD data, combined with high-resolution electron microscopic images, an aqueous-aided 2D growth mechanism is proposed for both HM crystallization stages.

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Effects of Phosphorus Exposure on Arsenic-Stabilized GaAs 2×4 Surface

MRS Proceedings ◽

10.1557/proc-312-231 ◽

1993 ◽

Vol 312 ◽

Cited By ~ 1

Author(s):

A. H. Bensaoula ◽

A. Freundlich ◽

A. Bensaoula ◽

V. Rossignol

Keyword(s):

High Resolution ◽

Electron Diffraction ◽

Growth Process ◽

High Energy ◽

Ex Situ ◽

Chemical Beam Epitaxy ◽

High Energy Electron ◽

X Ray Diffraction ◽

X Ray

AbstractPhosphorus exposed GaAs (100) surfaces during a Chemical Beam Epitaxy growth process are studied using in-situ Reflection High Energy Electron Diffraction and ex-situ High Resolution X-ray Diffraction. It is shown that the phosphorus exposure of a GaAs (100) surface in the 500 – 580 °C temperature range results in the formation of one GaP monolayer.

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Direct observation of α- to β-glycine transformation during the ionic liquid-mediated crystallization process

CrystEngComm ◽

10.1039/c7ce02247f ◽

2018 ◽

Vol 20 (19) ◽

pp. 2705-2712

Author(s):

Liangfei Ouyang ◽

Tengfei Zheng ◽

Liang Shen

Keyword(s):

Ionic Liquid ◽

Direct Observation ◽

Liquid Water ◽

Polymorphic Transformation ◽

Crystallization Process ◽

Water System ◽

X Ray Diffraction ◽

X Ray

The application of in situ powder X-ray diffraction (XRD) to monitor the polymorphic transformation and crystallization of glycine from an ionic liquid–water system is introduced.

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In situsynchrotron powder diffraction study of active belite clinkers

Journal of Applied Crystallography ◽

10.1107/s0021889807042379 ◽

2007 ◽

Vol 40 (6) ◽

pp. 999-1007 ◽

Cited By ~ 16

Author(s):

Ángeles G. De la Torre ◽

Khadija Morsli ◽

Mohammed Zahir ◽

Miguel A.G. Aranda

Keyword(s):

High Temperature ◽

High Resolution ◽

Powder Diffraction ◽

Polymorphic Transformation ◽

High Energy ◽

Dicalcium Silicate ◽

Polymorphic Transformations ◽

X Ray ◽

High Temperature Reactions

The clinkerization processes to form belite clinkers, with theoretical compositions close to 60 wt% of Ca2SiO4, have been studiedin situby high-resolution high-energy (λ = 0.30 Å) synchrotron X-ray powder diffraction. In order to obtain active belite cements, different amounts of K2O, Na2O and SO3have been added. The existence range of the high-temperature phases has been established and, furthermore, Rietveld quantitative phase analyses at high temperature have been performed for all patterns. The following high-temperature reactions have been investigated: (i) polymorphic transformations of dicalcium silicate, \alpha_{\rm L}'-Ca2SiO4↔ \alpha_{\rm H}'-Ca2SiO4from 1170 to 1230 K, and \alpha_{\rm H}'-Ca2SiO4↔ α-Ca2SiO4from 1500 to 1600 K; (ii) melting of the aluminates phases, Ca3Al2O6and Ca4(Al2Fe2)O10, above ∼1570 K; and (iii) reaction of Ca2SiO4with CaO to yield Ca3SiO5above ∼1550 K. Moreover, in all the studied compositions the temperature of the polymorphic transformation \alpha_{\rm H}'-Ca2SiO4↔ α-Ca2SiO4has decreased with the addition of activators. Finally, active belite clinkers were produced as the final samples contained α-belite phases.

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Synthesis, X-ray powder diffraction and DFT calculations of vasorelaxant active 3-(arylmethylidene)pyrrolidine-2,5-diones

RSC Advances ◽

10.1039/c6ra24302a ◽

2016 ◽

Vol 6 (114) ◽

pp. 112950-112959 ◽

Cited By ~ 7

Author(s):

ElSayed M. Shalaby ◽

Adel S. Girgis ◽

Hanaa Farag ◽

Ahmed F. Mabied ◽

Andrew N. Fitch

Keyword(s):

High Resolution ◽

Dft Calculations ◽

Powder Diffraction ◽

X Ray Diffraction ◽

X Ray

Two 3-(arylmethylidene)pyrrolidine-2,5-diones, 12a and 12b, were synthesized and characterized by powder X-ray diffraction utilizing a high-resolution synchrotron X-ray powder technique as well as DFT calculations.

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