Oxygen-induced degradation of the electronic properties of thin-layer InSe
2018 ◽
Vol 20
(4)
◽
pp. 2238-2250
◽
Keyword(s):
The degradation of thin-layer InSe induced by O atoms was quantificationally studied by first-principles calculations and deformation potential theory from the aspects of structural relaxation, band structure, and carrier mobility.
2016 ◽
Vol 18
(27)
◽
pp. 17912-17916
◽
2015 ◽
Vol 645-646
◽
pp. 325-329
2018 ◽
Vol 08
(01)
◽
pp. 1820002
◽
2014 ◽
Vol 141
(14)
◽
pp. 144107
◽
Keyword(s):
2020 ◽
Vol 22
(11)
◽
pp. 6434-6440
◽
2019 ◽
Vol 33
(20)
◽
pp. 1950227