Local crystal structure in the vicinity of Cr in doped AlN thin films studied by X-ray absorption spectroscopy

2018 ◽  
Vol 20 (18) ◽  
pp. 13084-13091 ◽  
Author(s):  
Padmalochan Panda ◽  
R. Ramaseshan ◽  
Madhusmita Sahoo ◽  
Nanda Gopala Krishna ◽  
A. K. Yadav ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Absorption Spectroscopy ◽  
Reactive Magnetron ◽  
X Ray ◽  
X Ray Absorption ◽  
Local Crystal Structure

This article reports the detailed X-ray absorption spectroscopy (XAS) study of Al1−xCrxN (x = 4, 6, 11%) thin films synthesized by the reactive magnetron co-sputtering technique.

Local crystal structure and mechanical properties of sputtered Ti-doped AlN thin films

2018 ◽  
Vol 20 (47) ◽  
pp. 29817-29825 ◽  
Author(s):  
Padmalochan Panda ◽  
Nanda Gopala Krishna ◽  
Parasmani Rajput ◽  
R. Ramaseshan
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Mechanical Properties ◽  
Absorption Spectroscopy ◽  
X Ray ◽  
X Ray Absorption ◽  
Local Crystal Structure

In this article, we predominantly report the investigation of the local crystal structure around a Ti dopant by X-ray absorption spectroscopy (XAS) and the nano-mechanical properties of co-sputtered Al1−xTixN (x = 0 to 4%) thin films.

A contrast in the electronic structures of B ion implanted ZnO thin films grown on glass and silicon substrates by using x-ray absorption spectroscopy

2020 ◽  
Vol 128 (6) ◽  
pp. 065303
Author(s):  
Krishna Kumar ◽  
Shi-Chen Wu ◽  
Yueh-Chung Yu ◽  
Da-Hua Wei ◽  
Jau-Wern Chiou
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Electronic Structures ◽  
Zno Thin Films ◽  
Silicon Substrates ◽  
X Ray ◽  
X Ray Absorption ◽  
Ion Implanted

scholarly journals X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films

2014 ◽  
Vol 104 (24) ◽  
pp. 242113 ◽  
Author(s):  
Sin Cheng Siah ◽  
Sang Woon Lee ◽  
Yun Seog Lee ◽  
Jaeyeong Heo ◽  
Tomohiro Shibata ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Tin Oxide ◽  
Electron Mobility ◽  
Structural Disorder ◽  
Oxide Thin Films ◽  
X Ray ◽  
Zinc Tin Oxide ◽  
The Impact ◽  
X Ray Absorption

X-ray Absorption Spectroscopy Study of TiO2–x Thin Films for Memory Applications

2015 ◽  
Vol 119 (8) ◽  
pp. 4362-4370 ◽  
Author(s):  
D. Carta ◽  
G. Mountjoy ◽  
A. Regoutz ◽  
A. Khiat ◽  
A. Serb ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray ◽  
Memory Applications ◽  
X Ray Absorption

scholarly journals Speciation and Lability of Ag-, AgCl-, and Ag2S-Nanoparticles in Soil Determined by X-ray Absorption Spectroscopy and Diffusive Gradients in Thin Films

2014 ◽  
Vol 49 (2) ◽  
pp. 897-905 ◽  
Author(s):  
R. Sekine ◽  
G. Brunetti ◽  
E. Donner ◽  
M. Khaksar ◽  
K. Vasilev ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
X Ray ◽  
Ag2s Nanoparticles ◽  
Diffusive Gradients ◽  
X Ray Absorption

A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Noritake Isomura ◽  
Keiichiro Oh-ishi ◽  
Naoko Takahashi ◽  
Satoru Kosaka
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Absorption Spectroscopy ◽  
Electron Spectroscopy ◽  
Practical Method ◽  
Decay Length ◽  
Total Electron ◽  
X Ray ◽  
Logarithmic Equation ◽  
X Ray Absorption

Thin films formed on surfaces have a large impact on the properties of materials and devices. In this study, a method is proposed using X-ray absorption spectroscopy to derive the film thickness of a thin film formed on a substrate using the spectral separation and logarithmic equation, which is a modified version of the formula used in electron spectroscopy. In the equation, the decay length in X-ray absorption spectroscopy is longer than in electron spectroscopy due to a cascade of inelastic scattering of electrons generated in a solid. The modification factor, representing a multiple of the decay length, was experimentally determined using oxidized Si and Cu with films of thickness 19 nm and 39 nm, respectively. The validity of the proposed method was verified, and the results indicated that the method can be used in the analysis of various materials with thin films.

scholarly journals Revisiting the crystal structure of the equilibrium S (Al2CuMg) phase in Al–Cu–Mg alloys using X-ray absorption spectroscopy (XAFS)

Materialia ◽  
2019 ◽  
Vol 6 ◽  
pp. 100341
Author(s):  
Danny Petschke ◽  
Frank Lotter ◽  
Torsten E.M. Staab
Keyword(s):  
Crystal Structure ◽  
Absorption Spectroscopy ◽  
Mg Alloys ◽  
X Ray ◽  
X Ray Absorption

scholarly journals In-situ growth of iron mononitride thin films studied using x-ray absorption spectroscopy and nuclear resonant scattering

2019 ◽  
Vol 240 (1) ◽  
Author(s):  
Mukul Gupta ◽  
Nidhi Pandey ◽  
Niti ◽  
V. R. Reddy ◽  
D. M. Phase ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Resonant Scattering ◽  
Nuclear Resonant Scattering ◽  
In Situ Growth ◽  
X Ray ◽  
X Ray Absorption

Effect of nonstoichiometry on crystal structure, charge and spin states of cobalt ions in Tb1−Ba1+Co2−O5.5−: Neutron diffraction and soft X-ray absorption spectroscopy studies

2020 ◽  
Vol 817 ◽  
pp. 152775
Author(s):  
S.V. Naumov ◽  
V.I. Voronin ◽  
I.F. Berger ◽  
M.S. Udintseva ◽  
V.V. Mesilov ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Neutron Diffraction ◽  
Absorption Spectroscopy ◽  
Spin States ◽  
Cobalt Ions ◽  
X Ray ◽  
Spectroscopy Studies ◽  
X Ray Absorption
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