Ionic charge distributions in silicon atomic surface wires
Keyword(s):
Using a non-contact atomic force microscope (nc-AFM), we examine continuous dangling bond (DB) wire structures patterned on the hydrogen terminated silicon (100)-2 × 1 surface.
1992 ◽
Vol 50
(2)
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pp. 1146-1147
1989 ◽
Vol 47
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pp. 32-33
1993 ◽
Vol 51
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pp. 704-705
2004 ◽
Vol 28
(3)
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pp. 301-304
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2015 ◽
Vol 6
(3)
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pp. 179-191
Keyword(s):
Keyword(s):