scholarly journals Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasers

2001 ◽  
Vol 202 (1) ◽  
pp. 172-175 ◽  
Author(s):  
N. H. Lu ◽  
W. C. Lin ◽  
D. P. Tsai
Keyword(s):  
Low Power ◽  
Optical Microscopy ◽  
Semiconductor Lasers ◽  
Tuning Fork ◽  
Near Field ◽  
Tapping Mode ◽  
Power Semiconductor ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Short fiber probe scheme for tapping-mode tuning fork near-field scanning optical microscopy

2002 ◽  
Author(s):  
Chien W. Huang ◽  
Nien H. Lu ◽  
Chih Y. Chen ◽  
Cheng Feng Yu ◽  
Tsung S. Kao ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Tuning Fork ◽  
Near Field ◽  
Short Fiber ◽  
Fiber Probe ◽  
Tapping Mode ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

DESIGN AND CONSTRUCTION OF A SHORT-TIP TAPPING-MODE TUNING FORK NEAR-FIELD SCANNING OPTICAL MICROSCOPE

2003 ◽  
Vol 02 (04n05) ◽  
pp. 225-230
Author(s):  
CHIEN-WEN HUANG ◽  
NIEN-HUA LU ◽  
CHIH-YEN CHEN ◽  
CHENG-FENG YU ◽  
TSUNG-SHENG KAO ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Tuning Fork ◽  
Near Field ◽  
Single Mode ◽  
Optical Microscope ◽  
Sensing Element ◽  
Tapping Mode ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Design And Construction

The design and construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides a stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples. We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on the endfaces of a single mode telecommunication optical fiber and a silica-based buried channel waveguide.

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
Sign in / Sign up

Export Citation Format

Share Document