Study of microstructural, morphological and optical properties of sprayed vanadium doped ZnO nanoparticles

2019 ◽  
Vol 87 (1) ◽  
pp. 10301 ◽  
Author(s):  
Hajar Ftouhi ◽  
Zouhair El Jouad ◽  
Mohammed Jbilou ◽  
Mustafa Diani ◽  
Mohammed Addou

In this paper, transparent conducting thin films based on both undoped and vanadium (V) doped zinc oxide Zn1−xVx O (x = 3, 5, 7 at.%), were studied. The thin films were prepared using a simple low cost deposition technique called spray pyrolysis (SP). The layers were deposited onto preheated glass substrates at 450 °C. The effect of vanadium on the microstructural, the morphological and the optical properties of ZnO material was carried out using X-ray diffractometer (XRD), micro Raman spectroscope, scanning electron microscope (SEM), energy dispersive analysis by X-ray (EDX) and UV-Vis-NIR spectrophotometer. We have demonstrated that doping with 3 at.% of V enhances the crystallinity of the films by estimating the grain size value, the dislocation density and the residual stress. Also, the SEM images have demonstrated that the vanadium concentrations do effect in the thin films morphology, from hexagonal-shaped grains to rounded crystals for higher doping concentrations. The optical analysis revealed that doping with 3 at.% of vanadium shows a remarkable enhancement in the average transmittance in the visible range 89% and in the band gap energy (3.3 eV). Moreover, the disorder inside the samples was estimated using Urbach equation. Therefore, the microstructural, the morphological and the optical results approve that doping with 3 at.% of V in ZnO lattices gives interesting results for the optical window material for solar cells application.

2014 ◽  
Vol 21 (05) ◽  
pp. 1450073 ◽  
Author(s):  
SOMAYEH AZIZI ◽  
HAMID REZAGHOLIPOUR DIZAJI ◽  
MOHAMMAD HOSSEIN EHSANI ◽  
SEYED FEYZOLAH GHAVAMI MIRMAHALLE

Cd 0.8 Zn 0.2 S thin films deposited on glass substrates by thermal evaporation method were annealed at different temperatures for the first time in order to investigate annealing effect on optical properties. The compositional, structural of nanoparticles precursor synthesized using microwave irradiation method and optical properties of the films were studied using energy dispersive X-ray (EDX), X-ray diffraction, transmission electron microscopy (TEM), and UV-visible spectrophotometer techniques. The annealed films were found to have hexagonal Wurtzite structure with strong preferential orientation along the (002) diffraction peak. Important optical parameters such as extinction coefficient and refractive index revealed the effect of heat treatment on the deposited thin layers. A reduction in the band gap energy from 2.41 eV to 2.29 eV was observed for the annealed samples.


2011 ◽  
Vol 306-307 ◽  
pp. 265-268
Author(s):  
Xue Yan Zhang ◽  
Xiao Yu Liu ◽  
Han Bin Wang ◽  
Xi Jian Zhang ◽  
Qing Pu Wang ◽  
...  

Cadmium sulfide (CdS) thin films with (111) preferential orientation were grown on glass substrates at room temperature by radio frequency (R.F.) magnetron sputtering. The structural and optical properties of CdS films have been investigated by X-ray diffraction, Scanning Electron Microscope micrographs, PL spectra and transmittance spectra. The grain sizes have been evaluated. The transmission spectra of the obtained films reveal a relatively high transmission coefficient (80%) in the visible range. All these results show that the grain sizes increased while the optical band gap decreased with increasing the thickness of CdS films.


Author(s):  
Atefeh Nazari Setayesh ◽  
Hassan Sedghi

Background: In this work, CdS thin films were synthesized by sol-gel method (spin coating technique) on glass substrates to investigate the optical behavior of the film. Methods: Different substrate spin coating speeds of 2400, 3000, 3600 rpm and different Ni dopant concentrations of 0 wt.%, 2.5 wt.%, 5 wt.%) were investigated. The optical properties of thin films such as refraction index, extinction coefficient, dielectric constant and optical band gap energy of the layers were discussed using spectroscopic ellipsometry method in the wavelength range of 300 to 900 nm. Results: It can be deduced that substrate rotation speed and dopant concentration has influenced the optical properties of thin films. By decreasing rotation speed of the substrate which results in films with more thicknesses, more optical interferences were appeared in the results. Conclusion: The samples doped with Ni comparing to pure ones have had more optical band gap energy.


2009 ◽  
Vol 609 ◽  
pp. 243-247 ◽  
Author(s):  
H. Moualkia ◽  
S. Hariech ◽  
M.S. Aida

The present work deals with the preparation and characterization of cadmium sulfur (CdS) thin films. These films are prepared by chemical bath deposition on the well cleaned glass substrates. The thickness of the samples was measured by using profilometer DEKTAK, structural and optical properties were studied by X-ray diffraction analysis, and UV-visible spectrophotometry. The optical properties of the films have been investigated as a function of temperature. The band gap energy and Urbach energy were also investigated as a function of temperature. From the transmittance data analysis the direct band gap ranges from 2.21 eV to 2.34 eV. A dependence of band gap on temperature has been observed and the possible raisons are discussed. Transmission spectra indicates a high transmission coefficient (75 %). Structural analysis revealed that the films showed cubic structure, and the crystallite size decreased at a higher deposition temperature.


2013 ◽  
Vol 591 ◽  
pp. 297-300
Author(s):  
Huan Ke ◽  
Shu Wang Duo ◽  
Ting Zhi Liu ◽  
Hao Zhang ◽  
Xiao Yan Fei

ZnS films have been deposited on glass substrates by chemical bath deposition (CBD). The optical and structural properties were analyzed by UV-VIS spectrophotometer and X-ray diffraction (XRD). The results showed that the prepared thin films from the solution using N2H4 as second complexing agent were thicker than those from the solution without adding N2H4 in; this is due to using second complexing agent of N2H4, the deposition mechanisms change which is conductive to heterogeneous deposition. When using N2H4 as second complexing agent, the crystallinity of ZnS thin films improved with a significant peak at 2θ=28.96°which can be assigned to the (111) reflection of the sphalerite structure. The transmittances of the prepared films from the solution adding N2H4 in as second complexing agent were over 85%, compared to those from the solution without N2H4 (over 95%). The band gaps of the ZnS films from the solution using N2H4 as second complexing agent were larger (about 4.0eV) than that from those from the solution without N2H4 (about 3.98eV), which indicated that the prepared ZnS films from the solution adding N2H4 in as second complexing agent were better used as buffer layer of solar cells with adequate optical properties. In short, using N2H4 as second complexing agent, can greatly improve the optical and structural properties of the ZnS thin films.


2011 ◽  
Vol 35 (1) ◽  
pp. 99-111 ◽  
Author(s):  
Fatema Rezwana Chowdhury ◽  
Shamima Choudhury ◽  
Firoz Hasan ◽  
Tahmina Begum

Thin films of Tin Oxide (SnO2), having thickness of 200 nm, were formed on to glass substrates by thermal evaporation of high-purity SnO2 powder in vacuum at various substrate temperatures (TS), ranging between 25 and 200°C. SnO2 films with varying thickness were also prepared for a fixed TS = 100°C. Further, doping of SnO2 films with Indium (In) was accomplished through solid state diffusion process by successive deposition of SnO2 and In films and subsequent annealing at 200°C for 10 minutes. Both undoped and doped films were characterized optically by UV-VIS-NIR spectrophotometry in the photon wavelength ranging from 300 to 2500 nm. In the visible photon wavelength range, the average optical transmittance (T%) of the films with varying TS was found to be 85%. The maximum value of T % was found to be 89 % around the wavelength of 700nm. The variation of absorption coefficient with photon energy in the fundamental absorption region is the steepest for TS = 100°C. The sub-band gap (SBG) absorption is also minimum for this Ts. A fluctuating behavior of the band gap energy (Eg) with Ts is observed attaining the highest value of 3.59 eV for Ts = 100°C. The band gap energy increases with thickness but T% in the visible range decreases. The T% in the visible range varies inversely with indium doping, being highest for undoped films. The Eg increases upto 2 wt% In doping and gradually decreases for enhanced doping. It seems reasonable to conclude that In doping does not bring favorable optical characteristics. Undoped SnO2 films having thickness of 200 nm and formed at substrate temperature of 100°C yield essential acceptable properties for photovoltaic applications.DOI: http://dx.doi.org/10.3329/jbas.v35i1.7975Journal of Bangladesh Academy of Sciences, Vol.35, No.1, 99-111, 2011


2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
Jie Zhang ◽  
Bo Long ◽  
Shuying Cheng ◽  
Weibo Zhang

Copper zinc tin sulfur (CZTS) thin films have been extensively studied in recent years for their advantages of low cost, high absorption coefficient (≥104 cm−1), appropriate band gap (~1.5 eV), and nontoxicity. CZTS thin films are promising materials of solar cells like copper indium gallium selenide (CIGS). In this work, CZTS thin films were prepared on glass substrates by vacuum evaporation and sulfurization method. Sn/Cu/ZnS (CZT) precursors were deposited by thermal evaporation and then sulfurized in N2+ H2S atmosphere at temperatures of 360–560°C to produce polycrystalline CZTS thin films. It is found that there are some impurity phases in the thin films with the sulfurization temperature less than 500°C, and the crystallite size of CZTS is quite small. With the further increase of the sulfurization temperature, the obtained thin films exhibit preferred (112) orientation with larger crystallite size and higher density. When the sulfurization temperature is 500°C, the band gap energy, resistivity, carrier concentration, and mobility of the CZTS thin films are 1.49 eV, 9.37 Ω · cm,1.714×1017 cm−3, and 3.89 cm2/(V · s), respectively. Therefore, the prepared CZTS thin films are suitable for absorbers of solar cells.


2005 ◽  
Vol 865 ◽  
Author(s):  
Hiroki Ishizaki ◽  
Keiichiro Yamada ◽  
Ryouta Arai ◽  
Yasuyuki Kuromiya ◽  
Yukari Masatsugu ◽  
...  

AbstractAgGa5Se8 and Ag(In1-xGax)Se2 thin films with different Ag/Ga atomic ratios have been deposited on the corning 1737 glass substrates by molecular beam epitaxy (MBE) system. This crystallographic property of AgGa5Se8 thin films has been investigated by x-ray diffraction and rietveld analysis. These films had the tetragonal structure with the space group of P-42m, regardless of Ag/Ga atomic ratio. The lattice parameters and the optical band gap energy decreased with an increase in the Ag/Ga atomic ratio. Thus, the structural and optical properties of these AgGa5Se8 thin films were controlled by the Ag/Ga atomic ratio.


2021 ◽  
Vol 49 (1) ◽  
Author(s):  
Reem S. Khaleel ◽  
◽  
Mustafa Sh. Hashim ◽  
Samer Gh. Majeed ◽  
◽  
...  

The deposition of metal oxides powder faces several problems, including poor adhesion to the bases deposited on them, the presence of many cracks, poor thickness control, and other disadvantages. The current study gives a new and simple idea to deposit thin films using two ZnO powders with nano and microparticle sizes on glass substrates. This was done by transforming the powders to Zinc acetate and then using chemical spray pyrolysis to deposit ZnO thin films. Scanning electron microscope (SEM) images showed that the prepared film from the nanopowder (ZnONano) lost the independence of powder’s nanoparticles and became a homogeneous film with nano projections. But the deposited one from the micro powder (ZnOMicro) had both nanorods and nanoplates. The different shapes and sizes of ZnO particles in ZnOMicro powder were disappeared after the Spray process. The two deposited films were homogeneous, crack-free and there were controllable thicknesses during the deposition. X-ray spectroscopy (EDS) was used to measure weights and atomic percentages of elements for the deposited films. The structures of the deposited films were approximately identical as the X-ray diffraction (XRD) technique showed. The optical properties of these two films were studied and their parameters were measured and calculated.


2019 ◽  
Vol 27 (01) ◽  
pp. 1950092
Author(s):  
BATOOL AHMADI KHANEGAHI ◽  
HASSAN SEDGHI

In the present work, zinc sulfide thin films were deposited on glass substrates by sol–gel process with different coating speeds 3600, 4800, 6000 and 7200[Formula: see text]rpm. Zinc acetate (Zn(CH3COO)[Formula: see text]H2O) and thiourea (CH4N2S) were used as precursors. Two-methoxyethanol and monoethanolamine were used as solvent and stabilizer, respectively. The optical properties of ZnS thin films such as refractive index, extinction coefficient, dielectric function and optical band gap energy of the films were obtained by spectroscopic ellipsometry (SE) analysis method in the wavelength range of 300–800[Formula: see text]nm. The incidence angle of the layers was kept at 70∘. The measured SE parameters [Formula: see text] and [Formula: see text] are fitted against the designed model by minimizing the mean square error (MSE). Considering the data obtained, it can be deduced that the optical properties of ZnS films are highly influenced by rotation rates. The extinction coefficients of the films were increased with increasing rotation rates of the films. From these results, it is found that the energy gap of the ZnS films increases with increasing rotation rates of the films in the range of 3.13–3.20[Formula: see text]eV.


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