scholarly journals Generation of high-flux soft X-ray high harmonics driven by loosely focused TW-class infrared pulses

2019 ◽  
Vol 205 ◽  
pp. 02012
Author(s):  
Kotaro Nishimura ◽  
Yuxi Fu ◽  
Akira Suda ◽  
Katsumi Midorikawa ◽  
J. Takahashi Eiji

We develop an experimental strategy for generating high-flux soft x-ray high-order harmonics (HH) driven by loosely focused high-energy infrared femtosecond pulses. Strong soft x-ray HHs are generated in a long Ne medium.

2020 ◽  
Vol 3 (1) ◽  
Author(s):  
Hanzhe Liu ◽  
Giulio Vampa ◽  
Jingyuan Linda Zhang ◽  
Yu Shi ◽  
Siddharth Buddhiraju ◽  
...  

Abstract Since the new millennium coherent extreme ultra-violet and soft x-ray radiation has revolutionized the understanding of dynamical physical, chemical and biological systems at the electron’s natural timescale. Unfortunately, coherent laser-based upconversion of infrared photons to vacuum-ultraviolet and soft x-ray high-order harmonics in gaseous, liquid and solid targets is notoriously inefficient. In dense nonlinear media, the limiting factor is strong re-absorption of the generated high-energy photons. Here we overcome this limitation by generating high-order harmonics from a periodic array of thin one-dimensional crystalline silicon ridge waveguides. Adding vacuum gaps between the ridges avoids the high absorption loss of the bulk and results in a ~ 100-fold increase of the extraction depth. As the grating period is varied, each high harmonic shows a different and marked modulation, indicating their waveguiding in the vacuum slots with reduced absorption. Looking ahead, our results enable bright on-chip coherent short-wavelength sources and may extend the usable spectral range of traditional nonlinear crystals to their absorption windows. Potential applications include on-chip chemically-sensitive spectro-nanoscopy.


2015 ◽  
Vol 32 (6) ◽  
pp. 1055 ◽  
Author(s):  
Ondřej Hort ◽  
Antoine Dubrouil ◽  
Amélie Cabasse ◽  
Stéphane Petit ◽  
Eric Mével ◽  
...  

2016 ◽  
Vol 87 (4) ◽  
pp. 043502 ◽  
Author(s):  
Sadaoki Kojima ◽  
Takahito Ikenouchi ◽  
Yasunobu Arikawa ◽  
Shohei Sakata ◽  
Zhe Zhang ◽  
...  

Author(s):  
Hirokatsu Yumoto ◽  
Haruhiko Ohashi ◽  
Hiroshi Yamazaki ◽  
Yasunori Senba ◽  
Takahisa Koyama ◽  
...  

Author(s):  
E. B. Steel

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.


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