scholarly journals Unravelling the characteristics of Al-alloy corrosion at the atomic to nanometre scale by transmission electron microscopy

2020 ◽  
Vol 326 ◽  
pp. 01007
Author(s):  
Shravan K. Kairy ◽  
Nick Birbilis
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Al Alloy ◽  
Second Phase ◽  
Clear Understanding ◽  
Transmission Electron ◽  
Second Phase Particles ◽  
Al Matrix

The localised corrosion associated with Mg2Si in the Al-matrix of an Al-Mg-Si alloy was studied in 0.1 M NaCl at pH 6 by quasi in-situ transmission electron microscopy. Herein, physical imaging of corrosion at the atomic to nanometre scale was performed. Phase transformation and subsequent chemical composition variations associated with the localised corrosion of Mg2Si were studied. It was observed that corrosion initiated upon Mg2Si, often preferentially at the interface with the Al-matrix, and propagated until Mg2Si was completely dealloyed by Mg-dissolution, resulting in an amorphous SiO-rich phase remnant. The SiO-rich remnant became electrochemically inert and did not initiate corrosion in the Al-matrix. This study provides a clear understanding on the localised corrosion of Al-alloys associated with Mg2Si. In addition, the methodology followed in this study can also be applied to understand the role of precipitates and second phase particles in the localised corrosion of Al-alloy systems.

Clarifying the Role of Mg2Si and Si in Localized Corrosion of Aluminum Alloys by Quasi In Situ Transmission Electron Microscopy

CORROSION ◽  
10.5006/3457 ◽  
2020 ◽  
Vol 76 (5) ◽  
pp. 464-475 ◽  
Author(s):  
Shravan K. Kairy ◽  
Nick Birbilis
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnesium Silicide ◽  
Localized Corrosion ◽  
In Situ Tem ◽  
Al Alloy ◽  
Transmission Electron ◽  
Al Matrix

The role of magnesium silicide (Mg2Si) and silicon (Si) particles in the localized corrosion of aluminum (Al) alloys was investigated herein. Sub-micrometer-sized Mg2Si and Si particles were grown in the Al matrix of Al-Mg-Si and Al-Si alloys, respectively, and characterized by transmission electron microscopy (TEM). A quasi in situ TEM technique was used to study an identical location containing Mg2Si or Si particle in the Al matrix, prior to and following a period of immersion in 0.1 M NaCl at pH 6, 2, and 12. At pH 6 and 2, Mg2Si was initially “anodic,” preferentially dealloying via selective dissolution of Mg, resulting in the development of SiO-rich remnants that are electrochemically inert. The SiO-rich remnants at pH 2 physically detached from the Al matrix. Silicon particles were electrochemically inert at pH 6, while “cathodic” at pH 2, dissolving the Al matrix at their periphery. It was observed that copper (Cu) was redeposited on Si particles at pH 2. At pH 12, Mg2Si and Si were “cathodic” to the Al matrix. This study clarifies, and provides new insights into, the characteristics of Al alloy physical manifestation of corrosion associated with Mg2Si and Si at the nanoscale.

Role of Interface Boundaries in the Deformation Behavior of TiAl Polysynthetically Twinned Crystal: In situ Transmission Electron Microscopy Deformation Study

2005 ◽  
Vol 20 (7) ◽  
pp. 1888-1901 ◽  
Author(s):  
Sung G. Pyo ◽  
Nack J. Kim
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Deformation Behavior ◽  
Localized Deformation ◽  
Deformation Twins ◽  
Thin Foils ◽  
Transmission Electron ◽  
Longitudinal Orientation

To understand the role of boundaries in the deformation behavior of TiAl, in situ straining experiments in transmission electron microscopy have been performed on thin foils of polysynthetically twinned (PST) crystal of Ti–49.3 at.% Al. The deformation behavior of PST TiAl is anisotropic, depending on the angle between the lamellar boundaries and the straining axes. For L-orientation, deformation twins and ordinary dislocations transmit across the true-twin (TT) boundaries but are reflected at the pseudo-twin (PT) and rotational order-fault (RO) boundaries. For transverse (T) orientation, deformation twins are transmitted across all TT, PT, and RO boundaries. For I-orientation, shear deformation occurs parallel to the lamellar boundaries. There is a transmission of deformation across the interphase (IP) boundary in longitudinal orientation, but deformation is blocked and reflected at the IP boundary in T-orientation. The role of the various types of boundaries in localized deformation behavior was evaluated by considering Schmid factors and geometric compatibility factors.

scholarly journals Study on strength and fracture toughness of Al-Zn-Mg-Cu-Ti(-Sn) alloys

2015 ◽  
Vol 51 (1) ◽  
pp. 73-79 ◽  
Author(s):  
A. Yan ◽  
L. Chen ◽  
H.S. Liu ◽  
F.F. Xiao ◽  
X.Q. Li
Keyword(s):  
Electron Microscopy ◽  
Fracture Toughness ◽  
Transmission Electron Microscopy ◽  
Second Phase ◽  
Plane Strain Fracture Toughness ◽  
Optical Scanning ◽  
Transmission Electron ◽  
Strain Fracture ◽  
Second Phase Particles ◽  
Scanning Electron

The strength and fracture toughness of Al-Zn-Mg-Cu-Ti(-Sn) alloys were investigated by performing tensile and plane strain fracture toughness (KIC) tests. Detailed observations with optical, scanning electron and transmission electron microscopy were conducted to analyze microstructure and fracture surfaces of the alloys. The results revealed that addition of Sn refined the solution-aging grain size of matrix and reduced coarsening rate of precipitate during aging. Narrower precipitation free zones and more discontinuous distribution of grain boundary precipitates were observed to be displayed in the Sn-containing alloy. Small size second phase particles Mg2Sn were observed to form in the Sn-containing alloy and distribute in the fine dimples of fracture surface. These features of microstructure were believed to impart higher strength and fracture toughness of the Sn-containing alloy on overaging.

Role of the Interfaces on the Activation of Slip Systems in The PST TiAl Alloy

1998 ◽  
Vol 552 ◽  
Author(s):  
Slim Zghal ◽  
Haruyuki Inui ◽  
Masaharu Yamaguchi ◽  
Alain Couret
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Tial Alloy ◽  
Slip Systems ◽  
Post Mortem ◽  
Transmission Electron ◽  
In Situ Observations ◽  
Deformation Modes

ABSTRACTThe operative slip systems in the so-called PST alloy are determined by transmission electron microscopy. Both post-mortem analyses and in situ observations are presented. It is shown that glide of ordinary dislocations and twinning are the most easily deformation modes activated at yield. The role of the interfaces on the activation of these operative slip systems is then examined and discussed.

Nano-Crystalline Structure in Mg2Si/Mg-2.5Er-5Zn Composite on the Route of Repeated Plastic Working Process

2010 ◽  
Vol 667-669 ◽  
pp. 635-639
Author(s):  
Wen Bo Du ◽  
Xu Dong Wang ◽  
Zhao Hui Wang ◽  
Shu Bo Li
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Second Phase ◽  
Plastic Working ◽  
Nano Crystalline ◽  
Transmission Electron ◽  
The Matrix ◽  
Nonequilibrium Grain Boundaries ◽  
The Difference

The Mg-5Zn-2.5Er matrix composite reinforced with the in-situ synthesized Mg2Si second phase particles was fabricated via repeated plastic working (RPW) process. The microstructures and the nanocrystals in the composite have been investigated using transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HREM) and energy dispersive X-ray (EDX). Great deals of nanocrystals were found in the matrix, and they were around the in-situ synthesized Mg2Si. The HREM analysis showed that the size of nanocrystals was in the range of 5-10 nm, and the difference in their crystallographic orientation was bigger than 15°. It is suggested that the formation of nanocrystals in the matrix is attributed to the RPW deformation process and to the intensive stresse fields around the in-situ synthesized Mg2Si particles, which suppress the growth of nanocrystals by forming nonequilibrium grain boundaries containing disordered dislocation networks and junction disclinations.

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