scholarly journals Publisher's Note: “Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator”[Appl. Phys. Lett. 87, 133114 (2005)]

2006 ◽  
Vol 88 (14) ◽  
pp. 149903
Author(s):  
Toshu An ◽  
Toyoaki Eguchi ◽  
Kotone Akiyama ◽  
Yukio Hasegawa
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Resolving Structure and Mechanical Properties at the Nanoscale of Viruses with Frequency Modulation Atomic Force Microscopy

PLoS ONE ◽  
2012 ◽  
Vol 7 (1) ◽  
pp. e30204 ◽  
Author(s):  
David Martinez-Martin ◽  
Carolina Carrasco ◽  
Mercedes Hernando-Perez ◽  
Pedro J. de Pablo ◽  
Julio Gomez-Herrero ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force

Mapping and imaging for rapid atom discrimination: A study of frequency modulation atomic force microscopy

2009 ◽  
Vol 94 (2) ◽  
pp. 023108 ◽  
Author(s):  
Yoshiaki Sugimoto ◽  
Takashi Namikawa ◽  
Masayuki Abe ◽  
Seizo Morita
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force

Self-assembled monolayers of sulfonate-terminated alkanethiols investigated by frequency modulation atomic force microscopy in liquid

2017 ◽  
Vol 28 (45) ◽  
pp. 455603 ◽  
Author(s):  
Hitoshi Asakawa ◽  
Natsumi Inada ◽  
Kaito Hirata ◽  
Sayaka Matsui ◽  
Takumi Igarashi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled

High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method

2010 ◽  
Vol 3 (6) ◽  
pp. 065205 ◽  
Author(s):  
Ken-ichi Umeda ◽  
Noriaki Oyabu ◽  
Kei Kobayashi ◽  
Yoshiki Hirata ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Excitation Method

Multi-Frequency Atomic Force Microscopy Combining Amplitude- and Frequency-Modulation Techniques

2012 ◽  
Vol 1422 ◽  
Author(s):  
Santiago D. Solares ◽  
Gaurav Chawla
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Complementary Information ◽  
Control Loops ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Of Operation ◽  
Modulation Techniques ◽  
Different Response ◽  
Amplitude And Frequency Modulation

ABSTRACTMulti-frequency atomic force microscopy (AFM) offers additional response signals in comparison to traditional dynamic AFM. Furthermore, depending on the mode of operation used, the higher eigenmode responses are generally not directly influenced by the topographical acquisition control loops, such that they can explore a fuller range of tip-sample interactions. In this work we describe the implementation of multi-frequency imaging schemes that enable the acquisition of topographical, phase and frequency shift contrast in tapping-mode operation. This type of characterization can be especially useful for soft, highly dissipative samples, such as polymers, for which the various response channels can exhibit significantly different response, thus providing complementary information. We discuss typical results obtained as well as important challenges that need to be addressed in order to develop a fully quantitative technique.

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