200 femtometer sensitivity for near-field analysis of surface acoustic waves in a scanning electron / scanning probe microscope hybrid system

2007 ◽  
Vol 90 (14) ◽  
pp. 144106 ◽  
Author(s):  
Ch. Thomas ◽  
R. Heiderhoff ◽  
L. J. Balk
Keyword(s):  
Hybrid System ◽  
Acoustic Waves ◽  
Near Field ◽  
Surface Acoustic Waves ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Field Analysis ◽  
Probe Microscope ◽  
Scanning Electron

Carbon-Nanotube Engineering for Probes and Tweezers Operating in Scanning Probe Microscope

2003 ◽  
Vol 772 ◽  
Author(s):  
Yoshikazu Nakayama ◽  
Seiji Akita
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Knife Edge ◽  
Maximum Current ◽  
Probe Microscope ◽  
Carbon Nanotube Devices ◽  
Scanning Electron

AbstractWe have developed a series of processes for preparing carbon nanotube devices of probes and tweezers that operate in scanning probe microscope (SPM). The main developments are a nanotube cartridge where nanotubes are aligned at a knife-edge to be easily picked up one by one and a scanning-electron-microscope manipulator by which a nanotube is transferred from the nanotube cartridge onto a Si tip under observing its view.We have also developed the electron ablation of a nanotube to adjust its length and the sharpening of a multiwall nanotube to have its inner layer with or without an end cap at the tip. For the sharpening process, the free end of a nanotube protruded from the cartridge was attached onto a metal-coated Si tip and the voltage was applied to the nanotube. At a high voltage giving the saturation of current, the current decreased stepwise in the temporal variation, indicating the sequential destruction of individual nanotube layers. The nanotube was finally cut at the middle of the nanotube bridge, and its tip was sharpened to have an inner layer with an opened end. Moving up the cartridge before cutting enables us to extract the inner layer with an end cap.It is evidenced that the maximum current at each layer during the stepwise decrease depends on its circumference, and the force for extracting the inner layer with ∼ 5nm diameter is ∼ 4 nN.

Nanoengineering of Carbon Nanotubes and the Status of its Applications

2001 ◽  
Vol 706 ◽  
Author(s):  
Yoshikazu Nakayama ◽  
Seiji Akita
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Arc Discharge ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Gas Temperature ◽  
The Status ◽  
Probe Microscope ◽  
Scanning Electron

AbstractWe have developed a well-controlled method for manipulating carbon nanotubes. The first crucial process involved is to prepare a nanotube array, named nanotube cartridge. We have found the ac electrophoresis of nanotubes by which nanotubes are aligned at the knife-edge. The nanotubes used were multiwalled and prepared by an arc discharge with a relatively high gas temperature. The second important process is to transfer a nanotube from the nanotube cartridge onto a substrate in a scanning electron microscope. Using this method, we have developed nanotube tips and nanotube tweezers that operate in a scanning probe microscope. The nanotube probes have been applied for observation of biological samples and industrial samples to clarify their advantages. The nanotube tweezers have demonstrated their motion in scanning-electron-microscope and operated to carry nanomaterials in a scanning probe microscope.

Nanostructuring With Scanning Probe Microscope Tip Irradiated With Femtosecond Laser

2002 ◽  
Author(s):  
Anant Chimmalgi ◽  
Taeyoul Choi ◽  
Costas P. Grigoropoulos
Keyword(s):  
Femtosecond Laser ◽  
Data Storage ◽  
Near Field ◽  
Laser System ◽  
Ambient Air ◽  
Femtosecond Laser Pulses ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Fdtd Simulation ◽  
Probe Microscope

Nanostructures, which have characteristic dimensions that are difficult to achieve by conventional optical lithography techniques, are finding ever-increasing applications in a variety of fields. High resolution, reliability and throughput fabrication of these nanostructures is essential if applications incorporating nanodevices are to gain widespread acceptance. Owing to the minimal thermal and mechanical damage, ultra-short pulsed laser radiation has been shown to be effective for precision material processing and surface micro-modification. In this work, nanostructuring based on local field enhancement in the near field of a Scanning Probe Microscope (SPM) probe tip irradiated with femtosecond laser pulses has been studied. High spatial resolution (~10–12nm), flexibility in the choice of the substrate material and possibility of massive integration of the tips make this method highly attractive for nanomodification. We report results of nanostructuring of gold thin film utilizing an 800nm femtosecond laser system in conjunction with a commercial SPM in ambient air. Further, Finite Difference Time Domain (FDTD) simulation results for the spatial distribution of the laser field intensity beneath the tip are presented. Potential applications of this method include nanolithography, nanodeposition, high-density data storage, as well as various biotechnology related applications.

Terahertz Coherent Scanning Probe Microscope

2010 ◽  
Vol 5 (4) ◽  
pp. 151-153
Author(s):  
Valeriy N. Trukhin ◽  
Nikolay N. Zinov’ev ◽  
Aleksandr V. Andrianov ◽  
Leonid L. Samoilov ◽  
Aleksandr O. Golubok ◽  
...  
Keyword(s):  
Scattered Radiation ◽  
Electromagnetic Waves ◽  
Near Field ◽  
Harmonic Signal ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Signal Demodulation ◽  
Probe Microscope

We present the terahertz (THz) scanning probe microscope which combines a THz coherent spectrometer and a scanning probe microscope. It detects forward-scattered radiation and employs harmonic signal demodulation to extract the signal of near-field contribution to scattering of THz electromagnetic waves

A planar scanning probe microscope for near-field microscopy

2020 ◽  
Author(s):  
Paul Weinbrenner ◽  
Stefan Ernst ◽  
Dominik M. Irber ◽  
Friedemann Reinhard
Keyword(s):  
Near Field ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

scholarly journals A Scanning Probe Microscope in My Scanning Electron Microscope?

1995 ◽  
Vol 3 (2) ◽  
pp. 22-23
Author(s):  
George J. Collins
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Scientific Literature ◽  
Scanning Probe Microscope ◽  
The Other ◽  
Scanning Probe ◽  
Primary Reason ◽  
Probe Microscope ◽  
Scanning Electron

Scanning probe microscopes (SPMs) designed to fit into scanning elec- tron microscopes (SEMs) are now becoming commercially available and you might ask, "Why would I want to put an SPM in my SEM"? The primary reason is that the too forms of microscope are very complimentary. Each microscope extends the power of the other. The SEM can do things that are hard to do with an SPM, and vice versa.Not long after the introduction of the STM and the AFM, a few re- searchers built custom SPMs and installed them in their SEMs. The reports of these projects to build hybrid microscopes and examples of the data they produced can be found in the scientific literature.

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