Carbon-Nanotube Engineering for Probes and Tweezers Operating in Scanning Probe Microscope

2003 ◽  
Vol 772 ◽  
Author(s):  
Yoshikazu Nakayama ◽  
Seiji Akita
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Knife Edge ◽  
Maximum Current ◽  
Probe Microscope ◽  
Carbon Nanotube Devices ◽  
Scanning Electron

AbstractWe have developed a series of processes for preparing carbon nanotube devices of probes and tweezers that operate in scanning probe microscope (SPM). The main developments are a nanotube cartridge where nanotubes are aligned at a knife-edge to be easily picked up one by one and a scanning-electron-microscope manipulator by which a nanotube is transferred from the nanotube cartridge onto a Si tip under observing its view.We have also developed the electron ablation of a nanotube to adjust its length and the sharpening of a multiwall nanotube to have its inner layer with or without an end cap at the tip. For the sharpening process, the free end of a nanotube protruded from the cartridge was attached onto a metal-coated Si tip and the voltage was applied to the nanotube. At a high voltage giving the saturation of current, the current decreased stepwise in the temporal variation, indicating the sequential destruction of individual nanotube layers. The nanotube was finally cut at the middle of the nanotube bridge, and its tip was sharpened to have an inner layer with an opened end. Moving up the cartridge before cutting enables us to extract the inner layer with an end cap.It is evidenced that the maximum current at each layer during the stepwise decrease depends on its circumference, and the force for extracting the inner layer with ∼ 5nm diameter is ∼ 4 nN.

Nanoengineering of Carbon Nanotubes and the Status of its Applications

2001 ◽  
Vol 706 ◽  
Author(s):  
Yoshikazu Nakayama ◽  
Seiji Akita
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Arc Discharge ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Gas Temperature ◽  
The Status ◽  
Probe Microscope ◽  
Scanning Electron

AbstractWe have developed a well-controlled method for manipulating carbon nanotubes. The first crucial process involved is to prepare a nanotube array, named nanotube cartridge. We have found the ac electrophoresis of nanotubes by which nanotubes are aligned at the knife-edge. The nanotubes used were multiwalled and prepared by an arc discharge with a relatively high gas temperature. The second important process is to transfer a nanotube from the nanotube cartridge onto a substrate in a scanning electron microscope. Using this method, we have developed nanotube tips and nanotube tweezers that operate in a scanning probe microscope. The nanotube probes have been applied for observation of biological samples and industrial samples to clarify their advantages. The nanotube tweezers have demonstrated their motion in scanning-electron-microscope and operated to carry nanomaterials in a scanning probe microscope.

scholarly journals A Scanning Probe Microscope in My Scanning Electron Microscope?

1995 ◽  
Vol 3 (2) ◽  
pp. 22-23
Author(s):  
George J. Collins
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Scientific Literature ◽  
Scanning Probe Microscope ◽  
The Other ◽  
Scanning Probe ◽  
Primary Reason ◽  
Probe Microscope ◽  
Scanning Electron

Scanning probe microscopes (SPMs) designed to fit into scanning elec- tron microscopes (SEMs) are now becoming commercially available and you might ask, "Why would I want to put an SPM in my SEM"? The primary reason is that the too forms of microscope are very complimentary. Each microscope extends the power of the other. The SEM can do things that are hard to do with an SPM, and vice versa.Not long after the introduction of the STM and the AFM, a few re- searchers built custom SPMs and installed them in their SEMs. The reports of these projects to build hybrid microscopes and examples of the data they produced can be found in the scientific literature.

scholarly journals Spinning Carbon Nanotube Nanothread under a Scanning Electron Microscope

Materials ◽  
2011 ◽  
Vol 4 (9) ◽  
pp. 1519-1527 ◽  
Author(s):  
Weifeng Li ◽  
Chaminda Jayasinghe ◽  
Vesselin Shanov ◽  
Mark Schulz
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Scanning Electron

Advancement in fabrication of carbon nanotube tip for atomic force microscope using multi-axis nanomanipulator in scanning electron microscope

2022 ◽  
Author(s):  
Sanjeev Kumar Kanth ◽  
Anjli Sharma ◽  
Byong Chon Park ◽  
Woon Song ◽  
Hyun Rhu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Atomic Force Microscope ◽  
Structural Integrity ◽  
Ion Beam ◽  
Rectilinear Motion ◽  
Atomic Force ◽  
Scanning Electron

Abstract We have constructed a new nanomanipulator (NM) in a field emission scanning electron microscope (FE-SEM) to fabricate carbon nanotube (CNT) tip to precisely adjust the length and attachment angle of CNT onto the mother atomic force microscope (AFM) tip. The new NM is composed of 2 modules, each of which has the degree of freedom of three-dimensional rectilinear motion x, y and z and one-dimensional rotational motion θ. The NM is mounted on the stage of a FE-SEM. With the system of 14 axes in total which includes 5 axes of FE-SEM and 9 axes of nano-actuators, it was possible to see CNT tip from both rear and side view about the mother tip. With the help of new NM, the attachment angle error could be reduced down to 0º as seen from both the side and the rear view, as well as, the length of the CNT could be adjusted with the precision using electron beam induced etching. For the proper attachment of CNT on the mother tip surface, the side of the mother tip was milled with focused ion beam. In addition, electron beam induced deposition was used to strengthen the adhesion between CNT and the mother tip. In order to check the structural integrity of fabricated CNT, transmission electron microscope image was taken which showed the fine cutting of CNT and the clean surface as well. Finally, the performance of the fabricated CNT tip was demonstrated by imaging 1-D grating and DNA samples with atomic force microscope in tapping mode.

Scanning Probe Microscope Tip with Carbon Nanotube Truss

2004 ◽  
Vol 43 (7B) ◽  
pp. 4499-4501 ◽  
Author(s):  
Seiji Akita ◽  
Yoshikazu Nakayama
Keyword(s):  
Carbon Nanotube ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

Highly sensitive compression sensors using three-dimensional printed polydimethylsiloxane/carbon nanotube nanocomposites

2019 ◽  
Vol 30 (8) ◽  
pp. 1216-1224 ◽  
Author(s):  
Mohammad Charara ◽  
Mohammad Abshirini ◽  
Mrinal C Saha ◽  
M Cengiz Altan ◽  
Yingtao Liu
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Three Dimensional ◽  
Multi Walled Carbon Nanotube ◽  
Highly Sensitive ◽  
Multi Walled Carbon Nanotubes ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

This article presents three-dimensional printed and highly sensitive polydimethylsiloxane/multi-walled carbon nanotube sensors for compressive strain and pressure measurements. An electrically conductive polydimethylsiloxane/multi-walled carbon nanotube nanocomposite is developed to three-dimensional print compression sensors in a freestanding and layer-by-layer manner. The dispersion of multi-walled carbon nanotubes in polydimethylsiloxane allows the uncured nanocomposite to stand freely without any support throughout the printing process. The cross section of the compression sensors is examined under scanning electron microscope to identify the microstructure of nanocomposites, revealing good dispersion of multi-walled carbon nanotubes within the polydimethylsiloxane matrix. The sensor’s sensitivity was characterized under cyclic compression loading at various max strains, showing an especially high sensitivity at lower strains. The sensing capability of the three-dimensional printed nanocomposites shows minimum variation at various applied strain rates, indicating its versatile potential in a wide range of applications. Cyclic tests under compressive loading for over 8 h demonstrate that the long-term sensing performance is consistent. Finally, in situ micromechanical compressive tests under scanning electron microscope validated the sensor’s piezoresistive mechanism, showing the rearrangement, reorientation, and bending of the multi-walled carbon nanotubes under compressive loads, were the main reasons that lead to the piezoresistive sensing capabilities in the three-dimensional printed nanocomposites.

Calibration of Carbon Nanotube Probes for Pico-Newton Order Force Measurement Inside a Scanning Electron Microscope

2004 ◽  
Vol 16 (2) ◽  
pp. 155-162 ◽  
Author(s):  
Masahiro Nakajima ◽  
◽  
Fumihito Arai ◽  
Lixin Dong ◽  
Toshio Fukuda
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Elastic Moduli ◽  
Force Measurement ◽  
Ultrasonic Waves ◽  
Copper Electrodes ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Scanning Electron

A method is presented for pico-Newton (pN) order force measurement using a carbon nanotube (CNT) probe, which is calibrated by electromechanical resonance. A CNT probe is constructed by attaching a CNT to the end of a tungsten needle or an atomic force microscope (AFM) cantilever using nanorobotic manipulators inside a field-emission scanning electron microscope (FE-SEM). Conductive electron-beam-induced deposition (EBID) is used for the fixation of CNTs with an internal vaporized precursor W(CO)6. For manipulating them easily and quickly, CNTs are dispersed in ethanol by ultrasonic waves and oriented on copper electrodes by electrophoresis. The elastic moduli of CNT probes are calibrated for use as a force measurement probe by electrically exciting at fundamental frequency. We analyzed the resolution of force measurement using a CNT probe. This force measurement can be used to characterize the mechanical properties of nanostructures and to measure friction or exfoliation forces in nanometer order.

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