Surface characterization of carbon nanotubes irradiated by electron beam

2008 ◽  
Vol 79 (2) ◽  
pp. 02C510 ◽  
Author(s):  
Jeonggil Lee ◽  
Euikwon Kim ◽  
Jaekyun Jeon ◽  
Yoonman Lee ◽  
Jae-yong Kim
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Surface Characterization

scholarly journals XPS and FESEM/STEM Surface Characterization of Activated Carbon, Carbon Black, and Carbon Nanotubes

2010 ◽  
Vol 16 (S2) ◽  
pp. 442-443 ◽  
Author(s):  
BR Strohmeier ◽  
JD Piasecki ◽  
KL Bunker ◽  
JL Sturgeon ◽  
BA Stitch ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Activated Carbon ◽  
Carbon Black ◽  
Surface Characterization ◽  
Characterization Of Activated Carbon

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

scholarly journals Protein Detection with Potentiometric Aptasensors: A Comparative Study between Polyaniline and Single-Walled Carbon Nanotubes Transducers

2013 ◽  
Vol 2013 ◽  
pp. 1-8 ◽  
Author(s):  
Ali Düzgün ◽  
Hassan Imran ◽  
Kalle Levon ◽  
F. Xavier Rius
Keyword(s):  
Carbon Nanotubes ◽  
Surface Characterization ◽  
Electrochemical Impedance ◽  
Protein Detection ◽  
Single Walled Carbon Nanotubes ◽  
Comparison Study ◽  
Single Walled Carbon ◽  
Multiply Charged ◽  
Walled Carbon Nanotubes

A comparison study on the performance characteristics and surface characterization of two different solid-contact selective potentiometric thrombin aptasensors, one exploiting a network of single-walled carbon nanotubes (SWCNTs) and the other the polyaniline (PANI), both acting as a transducing element, is described in this work. The molecular properties of both SWCNT and PANI surfaces have been modified by covalently linking thrombin binding aptamers as biorecognition elements. The two aptasensors are compared and characterized through potentiometry and electrochemical impedance spectroscopy (EIS) based on the voltammetric response of multiply charged transition metal cations (such as hexaammineruthenium, [Ru(NH3)6]3+) bound electrostatically to the DNA probes. The surface densities of aptamers were accurately determined by the integration of the peak for the reduction of [Ru(NH3)6]3+to [Ru(NH3)6]2+. The differences and the similarities, as well as the transduction mechanism, are also discussed. The sensitivity is calculated as 2.97 mV/decade and 8.03 mV/decade for the PANI and SWCNTs aptasensors, respectively. These results are in accordance with the higher surface density of the aptamers in the SWCNT potentiometric sensor.

Plasma-Based Chemical Modification of Epitaxial Graphene

2012 ◽  
Vol 717-720 ◽  
pp. 657-660 ◽  
Author(s):  
Scott G. Walton ◽  
Sandra C. Hernández ◽  
Mira Baraket ◽  
Virginia D. Wheeler ◽  
Luke O. Nyakiti ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electrical Properties ◽  
Chemical Modification ◽  
Functional Groups ◽  
Surface Characterization ◽  
Epitaxial Graphene ◽  
Functionalized Graphene ◽  
Oxygen Functional Groups

In this work, the treatment of epitaxial graphene on SiC using electron beam generated plasmas produced in mixtures of argon and oxygen is demonstrated. The treatment imparts oxygen functional groups on the surface with concentrations ranging up to about 12 at.%, depending on treatment parameters. Surface characterization of the functionalized graphene shows incorporation of oxygen to the lattice by disruption of ∏-bonds, and an altering of bulk electrical properties.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

A very rapid in situ Kikuchi technique to determine relative crystal misorientation

1988 ◽  
Vol 46 ◽  
pp. 830-831
Author(s):  
J. I. Bennetch
Keyword(s):  
Electron Beam ◽  
Analytical Techniques ◽  
Superplastic Forming ◽  
The Other ◽  
Kikuchi Pattern ◽  
Kikuchi Line ◽  
Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

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