Electric charging and nanostructure formation in polymeric films using combined amplitude-modulated atomic force microscopy-assisted electrostatic nanolithography and electric force microscopy

2008 ◽  
Vol 93 (3) ◽  
pp. 033109 ◽  
Author(s):  
Michael A. Reagan ◽  
Dmytro Kashyn ◽  
Shane Juhl ◽  
Richard A. Vaia ◽  
Sergei F. Lyuksyutov
Keyword(s):  
Atomic Force Microscopy ◽  
Polymeric Films ◽  
Electric Force ◽  
Force Microscopy ◽  
Nanostructure Formation ◽  
Atomic Force ◽  
Electric Force Microscopy

Atomic Force Microscopy in Analysis of Rubber Materials

2003 ◽  
Vol 76 (4) ◽  
pp. 846-859 ◽  
Author(s):  
Natalya Yerina ◽  
Sergei Magonov
Keyword(s):  
Atomic Force Microscopy ◽  
Processing Conditions ◽  
Electric Force ◽  
Degree Of Cure ◽  
Force Microscopy ◽  
Selective Distribution ◽  
Atomic Force ◽  
The Matrix ◽  
Electric Force Microscopy ◽  
Ratio Of Components

Abstract Atomic force microscopy (AFM) and electric force microscopy (EFM) have been applied for compositional mapping of a number of elastomers and related multicomponent materials. Several aspects of optimizing AFM experiments on polymers are discussed. AFM images revealed changes of EPDM morphology caused by crosslinking and by loading with fillers [carbon black (CB) and silica particles] and oil. It was shown that the morphology of isotactic polypropylene (iPP)/EPDM vulcanizates, which were studied with AFM and EFM, depends on the ratio of components, degree of cure and processing conditions. Diffusion of oil from the elastomer component to the matrix is evidenced in the AFM images. Selective distribution of CB in the iPP matrix is responsible for the electric conductivity of the thermoplastic vulcanizate.

Analysis of Influence of Voltage on Potential Barrier on BiCuVOX and BiTiVOX Ceramics

2013 ◽  
Vol 19 (3) ◽  
pp. 688-692
Author(s):  
S.M. Gheno ◽  
V.L. Pimentel ◽  
M.R. Morelli ◽  
P.I. Paulin Filho
Keyword(s):  
Atomic Force Microscopy ◽  
Low Temperatures ◽  
Electric Field Distribution ◽  
Peak Height ◽  
Schottky Barriers ◽  
Electric Force ◽  
Barrier Width ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electric Force Microscopy

AbstractThe BiMeVOx family of compounds appears to be more attractive for applications at low temperatures when ionic conductivity is the determining parameter. The objective of this study was to analysis the influence of voltage of the behavior of the Schottky barrier in both BiCuVOX and BiTiVOX. The samples were analyzed by atomic force microscopy and electric force microscopy (EFM). EFM experiments were conducted to map the electric field distribution on the surface. The formation of Schottky barriers was observed, and their height and width measured. BiCuVOX samples show a barrier width of 140 nm, and BiTiVOX shows a barrier width of 350 nm. The applied voltage has no effect on the barrier width but increases the peak height as observed in the cantilever frequency as measured with the EFM technique.

Characterization of cross-linking depth for thin polymeric films using atomic force microscopy

2014 ◽  
Vol 132 (8) ◽  
pp. n/a-n/a ◽  
Author(s):  
Qiuquan Guo ◽  
Maxim Paliy ◽  
Brad Kobe ◽  
Tomas Trebicky ◽  
Natalie Suhan ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Polymeric Films ◽  
Cross Linking ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy Based Electric Modes in Characterization of Organic Photovoltaics

2013 ◽  
Vol 1500 ◽  
Author(s):  
Craig Wall ◽  
Sergei Magonov ◽  
Sergey Belikov ◽  
John Alexander
Keyword(s):  
Atomic Force Microscopy ◽  
Organic Photovoltaics ◽  
Nanometer Scale ◽  
Structure Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Combined Use ◽  
Structure Property Relationship ◽  
Electric Force Microscopy

ABSTRACTCapabilities of Atomic Force Microscopy in different modes including Electric Force Microscopy and Kelvin Force Microscopy are reviewed and illustrated on several samples including organic photovoltaics (P3HT/PCBM, PEDOT:PSS). Compositional mapping of these blends is enhanced with a combined use of the modes, and variations of local electric properties are detected down to the nanometer scale. The revealed morphology will assist in development of comprehensive models accounting for the structure-property relationship in solar cells and related devices.

Thermo-Mechanical Effect on Nanostructure Formation Using Atomic Force Microscopy

2006 ◽  
Vol 505-507 ◽  
pp. 151-156
Author(s):  
Jin Ray Hsu ◽  
Chih Chung Hsiao ◽  
Cheng Kuo Sung ◽  
Chaug Liang Hsu
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Area ◽  
Adhesion Force ◽  
Force Measurement ◽  
Mechanical Effect ◽  
Force Microscopy ◽  
Nanostructure Formation ◽  
Atomic Force ◽  
Higher Temperature ◽  
Level Process

Molecular dynamics (MD) simulation and the experiment of adhesion force measurement were introduced to study the nanostructure formation process in the atomic force microscopy. The atomic level process of the nanostructure formation and the thermo-mechanical effect caused by the factors of the contact area, the adhesion force, and the temperature were clearly shown and discussed. The size of the forming nanostructures was found to be positively related to the contact area and temperature, but the adhesion force would decrease as the temperature increase. In the case of higher temperature with smaller adhesion force, however, the larger-size nanostructure could still be made.

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