Charge trapping and interface state generation in metal‐oxide‐semiconductor capacitors due to Fowler–Nordheim tunneling injection at low temperatures
1997 ◽
Vol 216
◽
pp. 174-179
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Keyword(s):
1996 ◽
Vol 35
(Part 1, No. 12A)
◽
pp. 5921-5924
◽
Keyword(s):
Keyword(s):