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Oxide-Voltage and Its Polarity Dependence of Interface-State-Generation Efficiency in (100) n-Si Metal/Oxide/Semiconductor Capacitors
Japanese Journal of Applied Physics
◽
10.1143/jjap.35.5921
◽
1996
◽
Vol 35
(Part 1, No. 12A)
◽
pp. 5921-5924
◽
Cited By ~ 3
Author(s):
Masao Inoue
◽
Akihiro Shimada
◽
Junji Shirafuji
Keyword(s):
Metal Oxide
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Generation Efficiency
◽
State Generation
Download Full-text
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References
Extra interface state generation enhanced by fluorine in tungsten‐polycided metal‐oxide‐semiconductor devices with nitrided oxide gate dielectric
Applied Physics Letters
◽
10.1063/1.114493
◽
1995
◽
Vol 67
(10)
◽
pp. 1456-1458
◽
Cited By ~ 1
Author(s):
C. W. Chen
◽
Y. K. Fang
◽
G. Y. Lee
◽
J. C. Hsieh
◽
M. S. Liang
Keyword(s):
Metal Oxide
◽
Gate Dielectric
◽
Semiconductor Devices
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
State Generation
Download Full-text
Transconductance degradation and interface state generation in metal‐oxide‐semiconductor field‐effect transistors with oxynitride gate dielectrics under hot‐carrier stress
Applied Physics Letters
◽
10.1063/1.102819
◽
1990
◽
Vol 56
(3)
◽
pp. 250-252
◽
Cited By ~ 8
Author(s):
G. Q. Lo
◽
W. C. Ting
◽
D. K. Shih
◽
D. L. Kwong
Keyword(s):
Metal Oxide
◽
Field Effect
◽
Gate Dielectrics
◽
Field Effect Transistors
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Hot Carrier
◽
Hot Carrier Stress
◽
State Generation
Download Full-text
Interface State Generation in p-Type Si Metal/ Oxide/ Semiconductor Capacitors due to Fowler-Nordheim Tunneling Current Stress
Japanese Journal of Applied Physics
◽
10.1143/jjap.34.l1315
◽
1995
◽
Vol 34
(Part 2, No. 10B)
◽
pp. L1315-L1317
◽
Cited By ~ 2
Author(s):
Masao Inoue
◽
Junji Shirafuji
Keyword(s):
Metal Oxide
◽
Tunneling Current
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Current Stress
◽
State Generation
◽
P Type
◽
Nordheim Tunneling
Download Full-text
Charge trapping and interface state generation in metal‐oxide‐semiconductor capacitors due to Fowler–Nordheim tunneling injection at low temperatures
Journal of Applied Physics
◽
10.1063/1.345082
◽
1990
◽
Vol 67
(11)
◽
pp. 6903-6907
◽
Cited By ~ 13
Author(s):
M. Sakashita
◽
S. Zaima
◽
Y. Yasuda
Keyword(s):
Metal Oxide
◽
Low Temperatures
◽
Charge Trapping
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
State Generation
◽
Tunneling Injection
◽
Nordheim Tunneling
Download Full-text
Interface state generation associated with hole transport in metal‐oxide‐semiconductor structures
Journal of Applied Physics
◽
10.1063/1.337618
◽
1986
◽
Vol 60
(1)
◽
pp. 448-449
◽
Cited By ~ 15
Author(s):
H. E. Boesch
◽
F. B. McLean
Keyword(s):
Metal Oxide
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Hole Transport
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
State Generation
Download Full-text
Positive charge and interface state generation in a thin gate oxide (30 nm) metal‐oxide‐semiconductor capacitor
Journal of Applied Physics
◽
10.1063/1.356396
◽
1994
◽
Vol 75
(3)
◽
pp. 1592-1598
◽
Cited By ~ 8
Author(s):
Abdelillah El‐Hdiy
Keyword(s):
Metal Oxide
◽
Positive Charge
◽
Gate Oxide
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
State Generation
◽
Thin Gate Oxide
◽
Metal Oxide Semiconductor Capacitor
Download Full-text
Relationship between interface state generation and substrate hole current in InGaAs metal-oxide-semiconductor (MOS) interfaces
Journal of Applied Physics
◽
10.1063/1.5031052
◽
2018
◽
Vol 123
(23)
◽
pp. 234502
Author(s):
S.-H. Yoon
◽
D.-H. Ahn
◽
M. Takenaka
◽
S. Takagi
Keyword(s):
Metal Oxide
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
State Generation
◽
Hole Current
Download Full-text
Abnormal interface state generation under positive bias stress in TiN/HfO2 p-channel metal-oxide-semiconductor field effect transistors
Applied Physics Letters
◽
10.1063/1.4752456
◽
2012
◽
Vol 101
(13)
◽
pp. 133505
◽
Cited By ~ 1
Author(s):
Wen-Hung Lo
◽
Ting-Chang Chang
◽
Jyun-Yu Tsai
◽
Chih-Hao Dai
◽
Ching-En Chen
◽
...
Keyword(s):
Metal Oxide
◽
Field Effect
◽
Field Effect Transistors
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Positive Bias
◽
Bias Stress
◽
State Generation
Download Full-text
Interface state‐induced shift of the oxide and semiconductor core levels for metal–oxide–semiconductor devices
Journal of Applied Physics
◽
10.1063/1.362954
◽
1996
◽
Vol 80
(3)
◽
pp. 1578-1582
◽
Cited By ~ 13
Author(s):
H. Kobayashi
◽
K. Namba
◽
Y. Yamashita
◽
Y. Nakato
◽
T. Komeda
◽
...
Keyword(s):
Metal Oxide
◽
Semiconductor Devices
◽
Interface State
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
Download Full-text
Evaluation of interface state density of strained-Si metal-oxide-semiconductor interfaces by conductance method
Journal of Applied Physics
◽
10.1063/1.4867935
◽
2014
◽
Vol 115
(9)
◽
pp. 094509
◽
Cited By ~ 4
Author(s):
Weili Cai
◽
Mitsuru Takenaka
◽
Shinichi Takagi
Keyword(s):
Metal Oxide
◽
Interface State
◽
State Density
◽
Metal Oxide Semiconductor
◽
Interface State Density
◽
Oxide Semiconductor
◽
Strained Si
◽
Semiconductor Interfaces
◽
Conductance Method
Download Full-text
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