Electrical characterization of rapid thermal nitrided and reoxidized plasma‐enhanced chemical‐vapor‐deposited silicon dioxide metal‐oxide‐silicon structures
1994 ◽
Vol 34
(5)
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pp. 909-919
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1997 ◽
Vol 36
(Part 2, No. 2A)
◽
pp. L150-L153
◽
1997 ◽
Vol 36
(Part 2, No. 7B)
◽
pp. L922-L925
◽
Keyword(s):
Keyword(s):
1999 ◽
Vol 425
(2-3)
◽
pp. 245-258
◽
Keyword(s):