Raman spectroscopy and x-ray diffraction study of PbTiO3 thin films prepared by sol–gel technique

The microstructure of Fe2O3 sol-gel thin films, obtained from Fe(OCH2CH3)3, was investigated by x-ray diffraction (XRD), transmission electron microscopy (TEM), and Raman spectroscopy. Samples were nanocrystalline from 400 °C to 1000 °C, and the crystallized phase was haematite. In the coatings, the α–Fe2O3 clusters were dispersed as single particles in a network of amorphous ferric oxide.

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STUDIES ON THE TiO2 THIN FILMS DOPED WITH Fe3+

International Journal of Modern Physics B ◽

10.1142/s0217979205029298 ◽

2005 ◽

Vol 19 (01n03) ◽

pp. 671-673

Author(s):

PENG XIAO ◽

WANLU WANG

Keyword(s):

Thin Films ◽

Raman Spectroscopy ◽

Electrical Properties ◽

Sol Gel ◽

Experimental Results ◽

X Ray Diffraction ◽

Tio2 Thin Films ◽

Gel Method ◽

X Ray ◽

Nanometer Particles

The Fe 3+- TiO 2 thin films obtained through sol-gel method were characterized by x-ray diffraction, AFM and Raman spectroscopy. It was found that TiO 2 films consisted of nanometer particles. The experimental results shows that the nanometer TiO 2 thin films doped with Fe 3+ were greatly improved in the activity aspect. This may be ascribed to change their structure and electrical properties after doping with Fe 3+. The results were discussed theoretically in detail.

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Characterization of Sol-Gel Derived (Pb,Ba)(Zr,Ti,Nb)O3 Thin Films for Optical Waveguide Development

MRS Proceedings ◽

10.1557/proc-343-445 ◽

1994 ◽

Vol 343 ◽

Cited By ~ 2

Author(s):

P. F. Baude ◽

J. S. Wright ◽

C. Ye ◽

L. F. Francis ◽

D. L. Polla

Keyword(s):

Thin Films ◽

Sol Gel ◽

Silicon Substrates ◽

X Ray Diffraction ◽

X Ray ◽

Sapphire Substrates ◽

Solution Preparation ◽

Transmission Measurements ◽

Gel Technique

ABSTRACT(PbBa)(ZrTiNb)03 thin films and powders have been prepared using the sol-gel technique. Solutions were synthesized in 2-methoxyethanol based upon our previous PZT solution preparation. Three different approaches were used for incorporating barium into PZT alkoxide solutions. Thermal analysis and x-ray diffraction results indicated that barium methoxypropoxide gave the best results. PBZTN (71% Pb and 71% Zr) was deposited onto sapphire substrates as well as oxidized silicon substrates. Optical transmission measurements showed greater than 80% transmission for wavelengths longer than 400 nm. Films with thickness of 3000 Å on sapphire exhibited a refractive index of 2.19 at λ=633 nm.

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Properties of SiO2CuOx Films for Nitrogen Dioxide Detection

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.834-836.112 ◽

2013 ◽

Vol 834-836 ◽

pp. 112-116 ◽

Cited By ~ 2

Author(s):

Tatiana Myasoedova ◽

G.E. Yalovega ◽

V.V. Petrov ◽

O.V. Zabluda ◽

V.A. Shmatko ◽

...

Keyword(s):

Thin Films ◽

Nitrogen Dioxide ◽

Photoelectron Spectroscopy ◽

Sol Gel ◽

Structure And Properties ◽

X Ray Diffraction ◽

X Ray ◽

Gel Technique ◽

Operating Temperatures

SiOxCuOythin films were prepared by the deposition on to the Si/SiO2substrates from the alcoholic solutions employing the sol-gel technique. The various analytic techniques were applied to characterize structure and properties of the films under study . The both X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) studies showed the presence CuO as well as CuO2phases and formation of a dual-oxide CuSiO3with the average crystallites sizes of 35-50 nm. The conductance of the films was rather sensitive to the presence of 1-20 ppm NO2concentration at the operating temperatures in the range of 20–200◦C.

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Raman spectroscopy and X-ray diffraction study of PrMnO3 oriented thin films deposited on LaAlO3 and SrTiO3 substrates

Journal of Magnetism and Magnetic Materials ◽

10.1016/j.jmmm.2013.06.005 ◽

2013 ◽

Vol 344 ◽

pp. 230-234

Author(s):

Aditi Chaturvedi ◽

V.G. Sathe

Keyword(s):

Thin Films ◽

Raman Spectroscopy ◽

Diffraction Study ◽

X Ray Diffraction ◽

X Ray

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Improvement of the optical and photocatalytic properties of ZnAl2O4: 1% La3+, x% Pb2+ nanoparticles synthesized by citrate sol-gel route

10.21203/rs.3.rs-316386/v1 ◽

2021 ◽

Author(s):

Hichem Filali ◽

Nahman Boukheit ◽

Rafika Bouhroum ◽

Wassila Chekirou ◽

Ahcène Karaali

Keyword(s):

Raman Spectroscopy ◽

Single Phase ◽

Sol Gel ◽

X Ray Diffraction ◽

Scanning Calorimetry ◽

Constant Amount ◽

Pure Zinc ◽

Characterization Methods ◽

X Ray ◽

Gel Technique

Abstract Samples of pure zinc aluminate (ZnAl2O4) and doped both with lead (Pb2+) at different ratios (0, 0.5, 1, 1.5, 2 and 2.5% mol) and a constant amount of lanthanum (La: 1% mol), were prepared by the citrate sol-gel technique, and then annealed at 900°C for 2h. In order to study the structural, optical and thermal properties; different characterization methods were used, such as: powder X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive X-ray spectroscopy (EDX), differential scanning calorimetry (DSC), TGA, Fourier transform infrared spectroscopy (FTIR) and Raman spectroscopy. The Analyzes by XRD revealed the presence of the cubic single phase ZnAl2O4 for all samples, with a crystallites size between 19 and 25 nm. These results were confirmed using FTIR, Raman spectroscopy and SEM. Also, photocatalytic study for different samples of ZnAl2O4 shows that they can be used like as photocatalyst and good adsorbents for degradation of Hexamethyl crystallized violet dye in aqueous solution.

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A Study on Optical Waveguide Application of Lanthanum III Oxide (LA O ) Thin Film Prepared 2 3 by Sol-gel Method.

NIGERIAN ANNALS OF PURE AND APPLIED SCIENCES ◽

10.46912/napas.16 ◽

2015 ◽

Vol 6 ◽

pp. 112-123

Author(s):

A A Akombor ◽

M D Tyona ◽

J SA Adelabu

Keyword(s):

Thin Film ◽

Thin Films ◽

Raman Spectroscopy ◽

Optical Waveguide ◽

Lanthanum Oxide ◽

Sol Gel ◽

Measurement Techniques ◽

Single Layer ◽

X Ray ◽

Gel Technique

Optogeometric properties of La 2 O 3 (Lanthanum Oxide) thin films prepared by sol-gel technique have been investigated. Characterization was derived by M-line spectroscopy, X-ray diffractometry and waveguide Raman Spectroscopy. M-line spectroscopy measurements revealed a refractive index of 1.592±0.001 on Pyrex substrate for a wavelength of 543.4nm and thin film thickness of 850nm and 1.589±0.001 on silicon wafer and thickness of single layer is between 40 and 60nm. X-ray diffractrometry has shown that the film has monoclinic structure. Waveguide Raman Spectroscopy has revealed a mixture of La 2 O 3 and La 2 O 2 CO 3 (Lanthanum Oxide Carbonate) which are mainly nanocrystalline and polycrystalline respectively. The research has shown that the La 2 O 3 thin films produced can be used as a planar optical waveguide. The results obtained are comparable with the works of other scientists using different measurement techniques.

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EFFECTS OF La DOPING ON FERROELECTRIC PROPERTIES OF CaBi4Ti4O15 THIN FILMS

Surface Review and Letters ◽

10.1142/s0218625x07009360 ◽

2007 ◽

Vol 14 (02) ◽

pp. 277-281

Author(s):

YANXIA DING ◽

GUANGDA HU ◽

SUHUA FAN

Keyword(s):

Thin Films ◽

Diffraction Analysis ◽

Single Phase ◽

Ferroelectric Properties ◽

Sol Gel ◽

X Ray Diffraction ◽

X Ray ◽

La Doping ◽

Gel Technique ◽

A Site

La modified CBTi ( CLBTi ) thin films were prepared on Pt/Ti/SiO 2/ Si (100) substrates by a sol–gel technique. X-ray diffraction analysis showed that single phase of CLBTi thin films were obtained. Their crystallization and hysteresis behavior were strongly dependent on the La contents. An increase of 2Pr as well as a decrease of 2Ec with the increase of La concentration were observed. The leakage properties of CBTi thin films were found to be improved by the La doping. The results were discussed with respect to the effects of La 3+ substitution at perovskite A-site.

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