Characterization of Sol-Gel Derived (Pb,Ba)(Zr,Ti,Nb)O3 Thin Films for Optical Waveguide Development

1994 ◽  
Vol 343 ◽  
Author(s):  
P. F. Baude ◽  
J. S. Wright ◽  
C. Ye ◽  
L. F. Francis ◽  
D. L. Polla

ABSTRACT(PbBa)(ZrTiNb)03 thin films and powders have been prepared using the sol-gel technique. Solutions were synthesized in 2-methoxyethanol based upon our previous PZT solution preparation. Three different approaches were used for incorporating barium into PZT alkoxide solutions. Thermal analysis and x-ray diffraction results indicated that barium methoxypropoxide gave the best results. PBZTN (71% Pb and 71% Zr) was deposited onto sapphire substrates as well as oxidized silicon substrates. Optical transmission measurements showed greater than 80% transmission for wavelengths longer than 400 nm. Films with thickness of 3000 Å on sapphire exhibited a refractive index of 2.19 at λ=633 nm.

1996 ◽  
Vol 459 ◽  
Author(s):  
E. Ching-Prado ◽  
W. Pérez ◽  
A. Reynés-Figueroa ◽  
R. S. Katiyar ◽  
D. Ravichandran ◽  
...  

ABSTRACTThin films of SrBi2Nb2O9 (SBN) with thicknesses of 0.1, 0.2, and 0.4 μ were grown by Sol-gel technique on silicon, and annealed at 650°C. The SBN films were investigated by Raman scatering for the first time. Raman spectra in some of the samples present bands around 60, 167, 196, 222, 302, 451, 560, 771, 837, and 863 cm−1, which correspond to the SBN formation. The study indicates that the films are inhomogeneous, and only in samples with thicknesses 0.4 μ the SBN material was found in some places. The prominent Raman band around 870 cm−1, which is the A1g mode of the orthorhombic symmetry, is assigned to the symmetric stretching of the NbO6 octahedrals. The frequency of this band is found to shift in different places in the same sample, as well as from sample to sample. The frequency shifts and the width of the Raman bands are discussed in term of ions in non-equilibrium positions. FT-IR spectra reveal a sharp peak at 1260 cm−1, and two broad bands around 995 and 772 cm−1. The bandwidths of the latter two bands are believed to be associated with the presence of a high degree of defects in the films. The experimental results of the SBN films are compared with those obtained in SBT (T=Ta) films. X-ray diffraction and SEM techniques are also used for the structural characterization.


1998 ◽  
Vol 541 ◽  
Author(s):  
M. Linnik ◽  
O. Wilson ◽  
A. Christou

AbstractThe preparation and characterization of thick PLZT films for spatial phase modulator applications are reported. Films were fabricated on LSCO/LAO substrates by a sol-gel technique using multiple heat-treatment parameters. The crystal quality of PLZT 9/65/35 films was investigated by X-ray diffraction and scanning electron microscopy.


1997 ◽  
Vol 12 (3) ◽  
pp. 596-599 ◽  
Author(s):  
Ji Zhou ◽  
Qing-Xin Su ◽  
K. M. Moulding ◽  
D. J. Barber

Ba(Mg1/3Ta2/3)O3 thin films were prepared by a sol-gel process involving the reaction of barium isopropoxide, tantalum ethoxide, and magnesium acetate in 2-methoxyethanol and subsequently hydrolysis, spin-coating, and heat treatment. Transmission electron microscopy, x-ray diffraction, and Raman spectroscopy were used for the characterization of the thin films. It was shown that the thin films tend to crystallize with small grains sized below 100 nm. Crystalline phase with cubic (disordered) perovskite structure was formed in the samples annealed at a very low temperature (below 500 °C), and well-crystallized thin films were obtained at 700 °C. Although disordered perovskite is dominant in the thin films annealed below 1000 °C, a low volume fraction of 1 : 2 ordering domains was found in the samples and grows with an increase of annealing temperature.


2017 ◽  
Vol 907 ◽  
pp. 56-60
Author(s):  
Ummuhanı Hilal Özer ◽  
Kerim Emre Öksüz ◽  
Ali Özer

It is well known that sol-gel technique is a simple method to produce nano sized ceramic powders. In this study, cerium oxide doped zirconia samples, with 10 mol%-12mol% and14mol% CeO2, were synthesized by sol-gel technique and characterized. The surface morphology, elemental composition, microstructure, and phase analysis, of the sintered CeO2 doped ZrO2 ceramics were characterized by field emission scanning electron microscopy (FE-SEM), energy dispersive X-ray (EDS) analysis, and X-ray diffraction (XRD) respectively. X-ray diffraction for samples sintered at 1550 °C for 4h revealed that the zirconia ceramics have a tetragonal phase structure. The addition of CeO2 can raise the content of the tetragonal phase, but the minor monoclinic phase exists even at the CeO2 content of 10 mol%. The effect of dopant concentration on the lattice parameter, average primary crystallite size and micro-strain was studied. Relative densities for CeO2 doped ZrO2 bulk ceramics varied between 95% and 99 %, depending on the CeO2 addition.


2021 ◽  
Author(s):  
Deniz ÇOBAN ÖZKAN ◽  
Ahmet Türk ◽  
Erdal Celik

Abstract The present research demonstrates the synthesis and characterization of LaMnO3 perovskite powders using the sol-gel technique for dye-sensitive solar cell applications. With this respect, transparent solutions were prepared from La and Mn based precursors, distilled water and citric acid monohydrate. Ammonium hydroxide was incorporated into the La-Mn solution in order to neutralize/precipitate at 24oC for 1 hour in the air. The solution was allowed to evaporate on a hot plate device at 90 °C in the air. The obtained solutions were dried at 90 oC for 24 hours to form a xerogel structure, dried at 200 oC for 2 hours and consequently annealed at 500 and 850 oC for 2 hours in the air. Thermal, structural, microstructural, optical and magnetic properties of the powders were characterized through differential thermal analysis-thermogravimetry (DTA-TG), Fourier transform infrared (FTIR), X-ray diffraction (XRD), X-ray Photoelectron Spectroscopy (XPS), scanning electron microscopy (SEM), Malvern zeta sizer (PSD), UV-vis spectrometer and vibrating sample magnetometer (VSM). The obtained results indicate promise, especially the low band range, that LaMnO3 powders can be used in dye-sensitized solar cells and can positively affect performance and efficiency.


2020 ◽  
Vol 7 (2) ◽  
pp. 1-11
Author(s):  
Hamed A. Gatea ◽  
Iqbal Nahi

"Barium strontium Titanate (BST) is a solid solution consist of BaTiO3 and SrTiO3 that mixed with suitable ratio. Barium strontium Titanate oxide (Ba0.8Sr0.2TiO3) thin films prepared by sol gel technique. Barium strontium Titanate thin films deposited on Si substrate and annealed at [400,500, 600 and 700] ºC. The characterization of BST films investigated by a different technique, the X-Ray Diffraction (XRD) and Scanning Electron Macroscopy (SEM) revealed the phases, crystal structure and surface topography of the films. XRD pattern shows tetragonal phase for Ba0.8Sr0.2TiO3 perovskite structure with many peaks for different plans. The films annealed at the different temperature that indicated intermediate phases on perovskite structure of Ba0.8Sr0.2TiO3.


2012 ◽  
Vol 620 ◽  
pp. 435-439 ◽  
Author(s):  
Wan Fahmin Faiz Wan Ali ◽  
Mohamad Ariff Othman ◽  
Nik Akmar Rejab ◽  
Mohd Zaid Abdullah ◽  
Arjuna Marzuki ◽  
...  

This manuscript is explained and discussed the properties of ceramic thick films, [Ba0.3Sr0.7ZrO3,BSZ (0.7)] synthesized through sol-gel route. The gel decomposition was studied by thermogravinometry analysis (TGA). From thermal analysis, it had shown that BSZ (0.7) phase started formed at 800 °C and above. The crystal structure of this composite film studied exhibited highly polycrystalline materials by X-ray diffraction analysis. From high magnification observation of field emission scanning electron microscopy (FESEM), grain boundaries of BSZ (0.7) films are clearly defined meanwhile grains displayed are in flaky shape. The average diameters of the grains measured were 94.6 nm. However, grains boundaries of BSZ (0.0) films, are unclear and grains slightly look dendritic structure. Electrical characterizations of the films are carried out with impedance analyzer at 4 - 12 GHz respectively. Both of electrical permittivity and loss tangent observed are dependable with microstructural and structural of the films.


2013 ◽  
Vol 834-836 ◽  
pp. 112-116 ◽  
Author(s):  
Tatiana Myasoedova ◽  
G.E. Yalovega ◽  
V.V. Petrov ◽  
O.V. Zabluda ◽  
V.A. Shmatko ◽  
...  

SiOxCuOythin films were prepared by the deposition on to the Si/SiO2substrates from the alcoholic solutions employing the sol-gel technique. The various analytic techniques were applied to characterize structure and properties of the films under study . The both X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) studies showed the presence CuO as well as CuO2phases and formation of a dual-oxide CuSiO3with the average crystallites sizes of 35-50 nm. The conductance of the films was rather sensitive to the presence of 1-20 ppm NO2concentration at the operating temperatures in the range of 20–200◦C.


2003 ◽  
Vol 785 ◽  
Author(s):  
R. Guzman ◽  
M.S. Tomar ◽  
R.E. Melgarejo

ABSTRACTThere is a great deal of interest in CaCu3Ti4O12 system for dielectric applications. We have studied Ca1-xSrxCu3Ti4O12 system for different compositions. The material is synthesized by sol-gel chemical solution route and thin films were deposited by spin coating. Thin films were investigated by x-ray diffraction and Raman spectroscopy for structural properties. These results indicate a solid solution for the compositions x = 0.00 to 0.80. The SEM micrographs shows the uniform films at 800° C, but the dielectric response of Ca1-xSrxCu3Ti4O12 (x = 0.00) shows the dielectric constant value below 200.


1993 ◽  
Vol 310 ◽  
Author(s):  
Keiichi Nashimoto

AbstractDense epitaxial LiNbO3 thin films without any misoriented plane on sapphire substrates were obtained with a sol-gel process utilizing 2-methoxyethanol based metal alkoxide precursors without pre-hydrolysis and rapid thermal annealing. Epitaxial LiNbO3 films annealed at 700°C were transparent and showed refractive indices close to bulk single crystal values. Epitaxial and transparent LiTaO3 films crystallized successfully on sapphire substrates with single orientations with the present process. X-ray rocking curve full widths at half maximum of epitaxial LiNbO3 and LiTaO3 films on sapphire (110) substrates and annealed at 700°C were less than 0.4 degree.


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