Cross-sectional dopant profiling and depletion layer visualization of SiC power double diffused metal-oxide-semiconductor field effect transistor using super-higher-order nonlinear dielectric microscopy
2005 ◽
Vol 44
(4B)
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pp. 2400-2404
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2003 ◽
Vol 7
(4)
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pp. 349-354
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1996 ◽
Vol 14
(1)
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pp. 224
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2021 ◽
Vol 134
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pp. 106046
Keyword(s):
2020 ◽
Vol 21
(3)
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pp. 339-347
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1997 ◽
Vol 9
(8)
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pp. 1143-1145
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