Two-dimensional X-ray diffraction and transmission electron microscopy study on the effect of magnetron sputtering atmosphere on GaN/SiC interface and gallium nitride thin film crystal structure
2015 ◽
Vol 119
(19)
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pp. 10653-10661
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2001 ◽
Vol 19
(5)
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pp. 2207-2216
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1972 ◽
2004 ◽
Vol 34
(3)
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pp. 345-348
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1977 ◽
Vol 33
(2)
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pp. 276-279
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