Post-deposition-annealing effect on current conduction in Al2O3films formed by atomic layer deposition with H2O oxidant
2005 ◽
Vol 44
(4B)
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pp. 2230-2234
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Keyword(s):
Keyword(s):
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2018 ◽
Vol 44
(12)
◽
pp. 13565-13571
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Keyword(s):
2012 ◽
Vol 51
(2S)
◽
pp. 02BA04
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