Accurate Determination of113mCd in Environmental Samples

Author(s):  
David L. Dunn ◽  
Thomas Tisue
2014 ◽  
Vol 11 (4) ◽  
pp. 351 ◽  
Author(s):  
Manuel D. Montaño ◽  
Gregory V. Lowry ◽  
Frank von der Kammer ◽  
Julie Blue ◽  
James F. Ranville

Environmental context The detection and characterisation of engineered nanomaterials in the environment is essential for exposure and risk assessment for this emerging class of materials. However, the ubiquitous presence of naturally occurring nanomaterials presents a unique challenge for the accurate determination of engineered nanomaterials in environmental matrices. New techniques and methodologies are being developed to overcome some of these issues by taking advantage of subtle differences in the elemental and isotopic ratios within these nanomaterials. Abstract The increasing manufacture and implementation of engineered nanomaterials (ENMs) will continue to lead to the release of these materials into the environment. Reliably assessing the environmental exposure risk of ENMs will depend highly on the ability to quantify and characterise these materials in environmental samples. However, performing these measurements is obstructed by the complexity of environmental sample matrices, physiochemical processes altering the state of the ENM and the high background of naturally occurring nanoparticles (NNPs), which may be similar in size, shape and composition to their engineered analogues. Current analytical techniques can be implemented to overcome some of these obstacles, but the ubiquity of NNPs presents a unique challenge requiring the exploitation of properties that discriminate engineered and natural nanomaterials. To this end, new techniques are being developed that take advantage of the nature of ENMs to discern them from naturally occurring analogues. This paper reviews the current techniques utilised in the detection and characterisation of ENMs in environmental samples as well as discusses promising new approaches to overcome the high backgrounds of NNPs. Despite their occurrence in the atmosphere and soil, this review will be limited to a discussion of aqueous-based samples containing ENMs, as this environment will serve as a principal medium for the environmental dispersion of ENMs.


2018 ◽  
Vol 90 (11) ◽  
pp. 1703-1711 ◽  
Author(s):  
Dotse Selali Chormey ◽  
Merve Fırat ◽  
Çağdaş Büyükpınar ◽  
Fatih Erulaş ◽  
Okan Tarık Komesli ◽  
...  

AbstractQuantitative determination of contaminants in environmental samples is usually hampered by low analyte recovery which results from the complex nature of the sample matrix. This study presents the application of a developed dispersive liquid–liquid microextraction method for the determination of 12 analytes in environmental samples including sea water, fresh water (lake, well and tap water), brackish water and soil samples. Matrix matched standards were used to compensate for the low analyte recovery recorded by the conventional calibration method. The effect of matrix dilution on analyte recovery was also tested. All matrix matched and matrix diluted spiked recoveries were done concurrently with calibration standards prepared in deionized water. Percent recoveries recorded for the analytes according to deionized water calibration standards ranged between 66 and 137%. Matrix matching and matrix dilution yielded close to 100% recovery results, but the later lowered the detection limit according to the dilution factor.


RSC Advances ◽  
2015 ◽  
Vol 5 (49) ◽  
pp. 39209-39217 ◽  
Author(s):  
Saeid Ahmadzadeh ◽  
Majid Rezayi ◽  
Anuar Kassim ◽  
Majid Aghasi

The present work deals with developing a highly selective membrane electrode based on p-isopropylcalix[6]arene for accurate determination of trace amounts of cesium cations.


Author(s):  
R. E. Ferrell ◽  
G. G. Paulson ◽  
C. W. Walker

Selected area electron diffraction (SAD) has been used successfully to determine crystal structures, identify traces of minerals in rocks, and characterize the phases formed during thermal treatment of micron-sized particles. There is an increased interest in the method because it has the potential capability of identifying micron-sized pollutants in air and water samples. This paper is a short review of the theory behind SAD and a discussion of the sample preparation employed for the analysis of multiple component environmental samples.


Author(s):  
R.D. Leapman ◽  
P. Rez ◽  
D.F. Mayers

Microanalysis by EELS has been developing rapidly and though the general form of the spectrum is now understood there is a need to put the technique on a more quantitative basis (1,2). Certain aspects important for microanalysis include: (i) accurate determination of the partial cross sections, σx(α,ΔE) for core excitation when scattering lies inside collection angle a and energy range ΔE above the edge, (ii) behavior of the background intensity due to excitation of less strongly bound electrons, necessary for extrapolation beneath the signal of interest, (iii) departures from the simple hydrogenic K-edge seen in L and M losses, effecting σx and complicating microanalysis. Such problems might be approached empirically but here we describe how computation can elucidate the spectrum shape.The inelastic cross section differential with respect to energy transfer E and momentum transfer q for electrons of energy E0 and velocity v can be written as


Author(s):  
M.A. Gribelyuk ◽  
M. Rühle

A new method is suggested for the accurate determination of the incident beam direction K, crystal thickness t and the coordinates of the basic reciprocal lattice vectors V1 and V2 (Fig. 1) of the ZOLZ plans in pixels of the digitized 2-D CBED pattern. For a given structure model and some estimated values Vest and Kest of some point O in the CBED pattern a set of line scans AkBk is chosen so that all the scans are located within CBED disks.The points on line scans AkBk are conjugate to those on A0B0 since they are shifted by the reciprocal vector gk with respect to each other. As many conjugate scans are considered as CBED disks fall into the energy filtered region of the experimental pattern. Electron intensities of the transmitted beam I0 and diffracted beams Igk for all points on conjugate scans are found as a function of crystal thickness t on the basis of the full dynamical calculation.


Author(s):  
F.A. Ponce ◽  
H. Hikashi

The determination of the atomic positions from HRTEM micrographs is only possible if the optical parameters are known to a certain accuracy, and reliable through-focus series are available to match the experimental images with calculated images of possible atomic models. The main limitation in interpreting images at the atomic level is the knowledge of the optical parameters such as beam alignment, astigmatism correction and defocus value. Under ordinary conditions, the uncertainty in these values is sufficiently large to prevent the accurate determination of the atomic positions. Therefore, in order to achieve the resolution power of the microscope (under 0.2nm) it is necessary to take extraordinary measures. The use of on line computers has been proposed [e.g.: 2-5] and used with certain amount of success.We have built a system that can perform operations in the range of one frame stored and analyzed per second. A schematic diagram of the system is shown in figure 1. A JEOL 4000EX microscope equipped with an external computer interface is directly linked to a SUN-3 computer. All electrical parameters in the microscope can be changed via this interface by the use of a set of commands. The image is received from a video camera. A commercial image processor improves the signal-to-noise ratio by recursively averaging with a time constant, usually set at 0.25 sec. The computer software is based on a multi-window system and is entirely mouse-driven. All operations can be performed by clicking the mouse on the appropiate windows and buttons. This capability leads to extreme friendliness, ease of operation, and high operator speeds. Image analysis can be done in various ways. Here, we have measured the image contrast and used it to optimize certain parameters. The system is designed to have instant access to: (a) x- and y- alignment coils, (b) x- and y- astigmatism correction coils, and (c) objective lens current. The algorithm is shown in figure 2. Figure 3 shows an example taken from a thin CdTe crystal. The image contrast is displayed for changing objective lens current (defocus value). The display is calibrated in angstroms. Images are stored on the disk and are accessible by clicking the data points in the graph. Some of the frame-store images are displayed in Fig. 4.


Sign in / Sign up

Export Citation Format

Share Document