Texture and microstructure analysis with high-energy synchrotron radiation

2004 ◽  
Vol 19 (1) ◽  
pp. 60-64 ◽  
Author(s):  
Hans J. Bunge
Keyword(s):  
Synchrotron Radiation ◽  
Orientation Distribution ◽  
High Energy ◽  
Polycrystalline Materials ◽  
Area Detector ◽  
High Penetration ◽  
High Lateral Resolution ◽  
Individual Grains ◽  
Relationship Of ◽  
Very High

Diffraction of high-energy synchrotron radiation with wavelengths in the range of 0.1 Å, provided by the beamline BW5 at HASYLAB in Hamburg, was used to measure textures (orientation distribution) and microstructures (spatial distribution) of the crystallites in various polycrystalline materials. In order to achieve extremely high angular-combined with very high lateral resolution a continuous sweeping technique with an area detector was employed. This technique “images” three different types of two-dimensional sections and projections of the six-dimensional orientation–location space onto the area detector. In many cases the orientations and locations of all individual grains of the sample can thus be seen simultaneously. The high penetration depth of this radiation in the range of several centimeters (comparable with that of neutrons) allows investigating big or capsulated samples. Examples are given of grain-resolved recrystallization textures, a soldering seam, a filled beverage can, and the orientation distribution of kamacite lamellae in an iron meteorite, elucidating the orientation relationship of the γ→α transformation in iron.

scholarly journals High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method

2003 ◽  
Vol 35 (3-4) ◽  
pp. 253-271 ◽  
Author(s):  
H. J. Bunge ◽  
H. Klein ◽  
L. Wcislak ◽  
U. Garbe ◽  
W. Weiß ◽  
...  
Keyword(s):  
Polycrystalline Material ◽  
High Energy ◽  
Short Wave ◽  
High Resolution Imaging ◽  
X Rays ◽  
Area Detector ◽  
High Penetration ◽  
Detector Method ◽  
Resolution Imaging ◽  
Individual Grains

In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={ϕ1Φϕ2} must be known in all points x={x1 x2 x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector “sweeping” technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional “orientation– location” space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.

Orientation relationship of Widmannstätten plates in an iron meteorite measured with high-energy synchrotron radiation

2003 ◽  
Vol 36 (1) ◽  
pp. 137-140 ◽  
Author(s):  
Hans Joachim Bunge ◽  
Wolfgang Weiss ◽  
Helmut Klein ◽  
Leszek Wcislak ◽  
Ulf Garbe ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Orientation Relationship ◽  
Orientation Distribution ◽  
High Energy ◽  
Iron Meteorite ◽  
Iron Nickel ◽  
A Minor ◽  
Relationship Of ◽  
Continuous Range

The orientation distribution of the Widmannstätten plates was measured in a sample of the Gibeon iron–nickel meteorite. The measurements were made with high-energy synchrotron radiation at beamline BW5 at HASYLAB/DESY in Hamburg using a high-resolution `moving-detector' technique. The measurements reveal a continuous range of orientations stretching out from both sides of the Nishiyama–Wassermann orientation to the Kurdjumov–Sachs orientations, as well as a minor `spread-pipe' between the Kurdjumov–Sachs ends of neighbouring non-coplanar orientation variants.

3-Dimensional Characterization of Polycrystalline Bulk Materials Using High-Energy Synchrotron Radiation

2007 ◽  
Vol 539-543 ◽  
pp. 2353-2358 ◽  
Author(s):  
Ulrich Lienert ◽  
Jonathan Almer ◽  
Bo Jakobsen ◽  
Wolfgang Pantleon ◽  
Henning Friis Poulsen ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
High Energy ◽  
Mapping Technique ◽  
X Ray Diffraction ◽  
Bulk Materials ◽  
Reciprocal Space Mapping ◽  
3 Dimensional ◽  
Individual Grains

The implementation of 3-Dimensional X-Ray Diffraction (3DXRD) Microscopy at the Advanced Photon Source is described. The technique enables the non-destructive structural characterization of polycrystalline bulk materials and is therefore suitable for in situ studies during thermo-mechanical processing. High energy synchrotron radiation and area detectors are employed. First, a forward modeling approach for the reconstruction of grain boundaries from high resolution diffraction images is described. Second, a high resolution reciprocal space mapping technique of individual grains is presented.

Focusing Optics for High-Energy X-ray Diffraction

1998 ◽  
Vol 5 (3) ◽  
pp. 226-231 ◽  
Author(s):  
U. Lienert ◽  
C. Schulze ◽  
V. Honkimäki ◽  
Th. Tschentscher ◽  
S. Garbe ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
High Spatial Resolution ◽  
Dispersion Compensation ◽  
High Energy ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Momentum Resolution ◽  
Potential Applications ◽  
Band Pass

Novel focusing optical devices have been developed for synchrotron radiation in the energy range 40–100 keV. Firstly, a narrow-band-pass focusing energy-tuneable fixed-exit monochromator was constructed by combining meridionally bent Laue and Bragg crystals. Dispersion compensation was applied to retain the high momentum resolution despite the beam divergence caused by the focusing. Next, microfocusing was achieved by a bent multilayer arranged behind the crystal monochromator and alternatively by a bent Laue crystal. A 1.2 µm-high line focus was obtained at 90 keV. The properties of the different set-ups are described and potential applications are discussed. First experiments were performed, investigating with high spatial resolution the residual strain gradients in layered polycrystalline materials. The results underline that focused high-energy synchrotron radiation can provide unique information on the mesoscopic scale to the materials scientist, complementary to existing techniques based on conventional X-ray sources, neutron scattering or electron microscopy.

Texture and microstructure imaging in six dimensions with high-energy synchrotron radiation

2003 ◽  
Vol 36 (5) ◽  
pp. 1240-1255 ◽  
Author(s):  
Hans Joachim Bunge ◽  
Leszek Wcislak ◽  
Helmut Klein ◽  
Ulf Garbe ◽  
Jochen Richard Schneider
Keyword(s):  
Synchrotron Radiation ◽  
Imaging Techniques ◽  
High Energy ◽  
Resolving Power ◽  
Step Width ◽  
Area Detector ◽  
New Methods ◽  
Pole Figures ◽  
Finite Step ◽  
High Orientation

The texture of a material can be calculated from several pole figures, which, in turn, are usually measured by one of several `step-scan' techniques. In these techniques, the finite step width limits the attainable orientation resolving power. In the present paper, the discontinuous step-scan technique is replaced by a continuous `sweeping' technique based on the continuous movement of an area detector during exposure. In this way, continuous two-dimensional `images' of pole figures are obtained, without the necessity of interpolation. Similar sweeping techniques are also being used to obtain continuous images of other sections and projections of the six-dimensional `orientation–location' space which characterizes a polycrystalline structure completely. The high potential orientation and/or location resolving power of these imaging techniques can only be reached with synchrotron radiation. In the present paper, the measurements were made at the high-energy (short-wavelength) beamline BW5 at HASYLAB/DESY in Hamburg. The high orientation and location resolving power implies the necessity to distinguish `grain-resolved' textures and microstructures (mainly in recrystallized materials) from `continuous' ones (mainly in deformed materials). Under certain conditions, it is thus possible to obtain the complete six-dimensional `orientation stereology' of grain-resolved microstructures. The new methods are illustrated with several examples, including technological applications.

Misorientation Measurement of Individual Grains in Fatigue of Polycrystalline Alloys by Diffraction Contrast Tomography Using Ultrabright Synchrotron Radiation

2016 ◽  
Vol 879 ◽  
pp. 1355-1360 ◽  
Author(s):  
Yoshikazu Nakai ◽  
Daiki Shiozawa ◽  
Ryota Nakao ◽  
Naoya Asakawa ◽  
Shoichi Kikuchi
Keyword(s):  
Stainless Steel ◽  
Synchrotron Radiation ◽  
Austenitic Stainless Steel ◽  
Pure Iron ◽  
Polycrystalline Materials ◽  
Mapping Technique ◽  
Diffraction Contrast ◽  
Commercially Pure ◽  
Schmid Factor ◽  
Individual Grains

A three dimensional grain mapping technique for polycrystalline materials, called X-ray diffraction contrast tomography (DCT), was developed at SPring-8, which is the brightest synchrotron radiation facility in Japan. The developed technique was applied to a commercially pure iron and austenitic stainless steel. The shape and location of grains could be determined by DCT using the apparatus in a beam line of SPring-8. To evaluate the dislocation structure in fatigue, the total misorientation of individual grains was measured by DCT. The average value of the total misorientation over one sample was increased with the number of cycles. In a grain, the change of the total misorientation was largest for primary slip plane. For austenitic stainless steel (fcc), the change of the total misorientation in fatigue was larger for planes with larger Schmid factor, while it was not depended on the Schmid factor for commercially pure iron (bcc). This different behavior must come from planer slip in fcc structure and wavy slip in bcc structure.

Three-Dimensional X-Ray Diffraction Microscopy Using High-Energy X-Rays

MRS Bulletin ◽  
2004 ◽  
Vol 29 (3) ◽  
pp. 166-169 ◽  
Author(s):  
Henning F. Poulsen ◽  
Dorte Juul Jensen ◽  
Gavin B.M. Vaughan
Keyword(s):  
Materials Science ◽  
Three Dimensional ◽  
High Energy ◽  
Polycrystalline Materials ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reconstruction Methods ◽  
The Individual ◽  
Individual Grains

AbstractThree-dimensional x-ray diffraction (3DXRD) microscopy is a tool for fast and nondestructive characterization of the individual grains, subgrains, and domains inside bulk materials. The method is based on diffraction with very penetrating hard x-rays (E ≥ 50 keV), enabling 3D studies of millimeter-to-centimeter-thick specimens.The position, volume, orientation, and elastic and plastic strain can be derived for hundreds of grains simultaneously. Furthermore, by applying novel reconstruction methods, 3D maps of the grain boundaries can be generated. The 3DXRD microscope in use at the European Synchrotron Radiation Facility in Grenoble, France, has a spatial resolution of ∼5 μm and can detect grains as small as 150 nm. The technique enables, for the first time, dynamic studies of the individual grains within polycrystalline materials. In this article, some fundamental materials science applications of 3DXRD are reviewed: studies of nucleation and growth kinetics during recrystallization, recovery, and phase transformations, as well as studies of polycrystal deformation.

scholarly journals Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications

2018 ◽  
Vol 25 (3) ◽  
pp. 706-716 ◽  
Author(s):  
H. Joress ◽  
J. D. Brock ◽  
A. R. Woll
Keyword(s):  
Synchrotron Radiation ◽  
Film Growth ◽  
Sample Surface ◽  
High Energy ◽  
Time Resolved ◽  
Synchrotron Source ◽  
X Ray ◽  
Area Detector ◽  
Monochromatic Synchrotron

A new technique for the parallel collection of X-ray reflectivity (XRR) data, compatible with monochromatic synchrotron radiation and flat substrates, is described and applied to thein situobservation of thin-film growth. The method employs a polycapillary X-ray optic to produce a converging fan of radiation, incident onto a sample surface, and an area detector to simultaneously collect the XRR signal over an angular range matching that of the incident fan. Factors determining the range and instrumental resolution of the technique in reciprocal space, in addition to the signal-to-background ratio, are described in detail. This particular implementation records ∼5° in 2θ and resolves Kiessig fringes from samples with layer thicknesses ranging from 3 to 76 nm. The value of this approach is illustrated by showingin situXRR data obtained with 100 ms time resolution during the growth of epitaxial La0.7Sr0.3MnO3on SrTiO3by pulsed laser deposition at the Cornell High Energy Synchrotron Source (CHESS). Compared with prior methods for parallel XRR data collection, this is the first method that is both sample-independent and compatible with the highly collimated, monochromatic radiation typical of third-generation synchrotron sources. Further, this technique can be readily adapted for use with laboratory-based sources.

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