scholarly journals HEXITEC: A High-Energy X-ray Spectroscopic Imaging Detector for Synchrotron Applications

2018 ◽  
Vol 31 (6) ◽  
pp. 28-32 ◽  
Author(s):  
M. C. Veale ◽  
P. Seller ◽  
M. Wilson ◽  
E. Liotti
Keyword(s):  
Spectroscopic Imaging ◽  
High Energy ◽  
X Ray ◽  
Imaging Detector

scholarly journals Developments toward hard X-ray radiography on heavy-ion heated dense plasmas

2014 ◽  
Vol 32 (4) ◽  
pp. 631-637 ◽  
Author(s):  
K. Li ◽  
B. Borm ◽  
F. Hug ◽  
D. Khaghani ◽  
B. Löher ◽  
...  
Keyword(s):  
Laser System ◽  
Heavy Ion ◽  
High Energy ◽  
High Energy Density ◽  
Radiographic Images ◽  
X Ray ◽  
Dense Plasmas ◽  
X Ray Imaging ◽  
Imaging Detector ◽  
Energy Laser

AbstractWe have studied the potential of hard X-ray radiography as a diagnostic in high energy density experiments, proposed for the future Facility for Antiproton and Ion Research (FAIR). We present synthetic radiographic images generated from hydrodynamic simulations of the target evolution. The results suggest that high-resolution density measurements can be obtained from powerful hard X-ray sources driven by a PW-class high-energy laser system. Test measurements of a prototype hard X-ray imaging detector for photon energies above 100 keV are presented.

Development of an X-ray imaging detector for high-energy X-ray microtomography

2020 ◽  
Vol 27 (4) ◽  
pp. 934-940
Author(s):  
Masato Hoshino ◽  
Kentaro Uesugi ◽  
Naoto Yagi
Keyword(s):  
High Energy ◽  
Field Of View ◽  
Wide Field ◽  
Modulation Transfer ◽  
High Definition ◽  
X Ray ◽  
X Ray Imaging ◽  
Imaging Detector ◽  
Wide Field Of View ◽  
Tomographic Measurement

A dedicated X-ray imaging detector for 200 keV high-energy X-ray microtomography was developed. The novelty of the detector is a large-format camera lens employed for a wide field of view. Several scintillators were evaluated in terms of the degree of efficiency of detection for high-energy X-ray photons and the modulation transfer function. For tomographic measurement, a high-definition CMOS camera was incorporated in the detector to achieve a high spatial resolution while keeping the field of view wide. Rocks with fossil inclusions were imaged to demonstrate the applicability of the detector to high-energy X-ray microtomography.

scholarly journals HEXITEC 2 × 2 tiled hard X-ray spectroscopic imaging detector system

2022 ◽  
Vol 17 (01) ◽  
pp. P01012
Author(s):  
L. Jowitt ◽  
M. Wilson ◽  
P. Seller ◽  
C. Angelsen ◽  
R.M. Wheater ◽  
...  
Keyword(s):  
Spectroscopic Imaging ◽  
Detector System ◽  
Frame Rate ◽  
Energy Curve ◽  
Charge Sharing ◽  
Camera System ◽  
X Ray ◽  
Sensor Material ◽  
Imaging Detector ◽  
Sealed Source

Abstract HEXITEC is a spectroscopic imaging X-ray detector technology developed at the STFC Rutherford Appleton Laboratory for X-ray and γ-ray spectroscopic imaging applications. Each module has 80 × 80 pixels on a 250 μm pixel pitch, and has been implemented successfully in a number of applications. This paper presents the HEXITEC 2 × 2 detector system, a tiled array of 4 HEXITEC modules read out simultaneously, which provides an active area of 16 cm2. Systems have been produced using 1 mm thick Cadmium Telluride (CdTe) and 2 mm thick Cadmium Zinc Telluride (CdZnTe) sensor material. In this paper the system and data processing methods are presented, and the performance of the systems are evaluated. The detectors were energy calibrated using an 241Am sealed source. Three types of charge sharing correction were applied to the data-charge sharing addition (CSA), charge sharing discrimination (CSD), and energy curve correction (ECC) which compensates for energy lost in the inter-pixel region. ECC recovers an additional 34 % of counts in the 59.5 keV peak in CdTe compared to the use of CSD; an important improvement for photon-starved applications. Due to the high frame rate of the camera system (6.3 kHz) an additional End of Frame (EOF) correction was also applied to 6.0 % of events to correct for signals that were readout whilst the signal was still forming. After correction, both detector materials were found to have excellent spectroscopic performance with a mean energy resolution (FWHM) of 1.17 keV and 1.16 keV for CdZnTe and CdTe respectively. These results successfully demonstrate the ability to construct tiled arrays of HEXITEC modules to provide larger imaging areas.

High-purity Ge x-ray detectors: Sensitivity factors and usefulness

1990 ◽  
Vol 48 (2) ◽  
pp. 548-548
Author(s):  
E. B. Steel
Keyword(s):  
High Purity ◽  
High Energy ◽  
Quantitative Chemical Analysis ◽  
Detector Performance ◽  
X Ray ◽  
Detector Sensitivity ◽  
Specimen Holder ◽  
Many Instruments ◽  
Charge Resolution ◽  
Sensitivity Factors

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.

Designing high-resolution slow scan CCD-based TEM camera systems

1992 ◽  
Vol 50 (2) ◽  
pp. 946-947
Author(s):  
James F. Mancuso ◽  
William B. Maxwell ◽  
Russell E. Camp ◽  
Mark H. Ellisman
Keyword(s):  
Fiber Optics ◽  
Ccd Camera ◽  
High Energy ◽  
Phosphor Layer ◽  
X Ray ◽  
Light Production ◽  
Camera Systems ◽  
X Ray Imaging ◽  
Electron Image ◽  
Scintillating Fiber

The imaging requirements for 1000 line CCD camera systems include resolution, sensitivity, and field of view. In electronic camera systems these characteristics are determined primarily by the performance of the electro-optic interface. This component converts the electron image into a light image which is ultimately received by a camera sensor.Light production in the interface occurs when high energy electrons strike a phosphor or scintillator. Resolution is limited by electron scattering and absorption. For a constant resolution, more energy deposition occurs in denser phosphors (Figure 1). In this respect, high density x-ray phosphors such as Gd2O2S are better than ZnS based cathode ray tube phosphors. Scintillating fiber optics can be used instead of a discrete phosphor layer. The resolution of scintillating fiber optics that are used in x-ray imaging exceed 20 1p/mm and can be made very large. An example of a digital TEM image using a scintillating fiber optic plate is shown in Figure 2.

The Basic Physical Principles of Ion, Electron, and X-Ray Detectors and Their Application to Microanalysis

1985 ◽  
Vol 43 ◽  
pp. 154-157
Author(s):  
A.J. Tousimis
Keyword(s):  
Ion Beam ◽  
Depth Resolution ◽  
Sample Surface ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
Electrons And Ions ◽  
Spatial Depth ◽  
Minimum Surface Area ◽  
Physical Principles

An integral and of prime importance of any microtopography and microanalysis instrument system is its electron, x-ray and ion detector(s). The resolution and sensitivity of the electron microscope (TEM, SEM, STEM) and microanalyzers (SIMS and electron probe x-ray microanalyzers) are closely related to those of the sensing and recording devices incorporated with them.Table I lists characteristic sensitivities, minimum surface area and depth analyzed by various methods. Smaller ion, electron and x-ray beam diameters than those listed, are possible with currently available electromagnetic or electrostatic columns. Therefore, improvements in sensitivity and spatial/depth resolution of microanalysis will follow that of the detectors. In most of these methods, the sample surface is subjected to a stationary, line or raster scanning photon, electron or ion beam. The resultant radiation: photons (low energy) or high energy (x-rays), electrons and ions are detected and analyzed.

Utilisation of High-Energy Heat Sources in Magnesium Alloy Surface Layer Treatment

2013 ◽  
Vol 58 (2) ◽  
pp. 619-624 ◽  
Author(s):  
M. Szafarska ◽  
J. Iwaszko ◽  
K. Kudła ◽  
I. Łegowik
Keyword(s):  
Surface Layer ◽  
Magnesium Alloy ◽  
Physicochemical Properties ◽  
Treatment Effectiveness ◽  
High Energy ◽  
Alloy Surface ◽  
Heat Sources ◽  
X Ray ◽  
Additional Equipment ◽  
Alloy Surface Layer

The main aim of the study was the evaluation of magnesium alloy surface treatment effectiveness using high-energy heat sources, i.e. a Yb-YAG Disk Laser and the GTAW method. The AZ91 and AM60 commercial magnesium alloys were subject to surface layer modification. Because of the physicochemical properties of the materials studied in case of the GTAW method, it was necessary to provide the welding stand with additional equipment. A novel two-torch set with torches operating in tandem was developed within the experiment. The effectiveness of specimen remelting using a laser and the GTAW method was verified based on macro- and microscopic examinations as well as in X-ray phase analysis and hardness measurements. In addition, the remelting parameters were optimised. The proposed treatment methodology enabled the achieving of the intended result and effective modification of a magnesium alloy surface layer.

Mesoscale structural characterization within bulk materials by high-energy X-ray microdiffraction

AIAA Journal ◽  
2001 ◽  
Vol 39 ◽  
pp. 919-923
Author(s):  
U. Lienert ◽  
H. F. Poulsen ◽  
A. Kvick
Keyword(s):  
Structural Characterization ◽  
High Energy ◽  
Bulk Materials ◽  
X Ray
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