Surface roughness of a Co-less WC micro-die fabricated by focused-ion-beam machining

2004 ◽  
Vol 84 (3) ◽  
pp. 149-155 ◽  
Author(s):  
Hiroyuki Hosokawa ◽  
Koji Shimojima ◽  
Mamoru Mabuchi
Author(s):  
Roberta Condò ◽  
Gianluca Mampieri ◽  
Guido Pasquantonio ◽  
Aldo Giancotti ◽  
Paola Pirelli ◽  
...  

Bacterial adhesion to the surface of the adhesive material is an important step in the formation of plaque and enamel demineralization. In order to correlate the material composition to the specific surface roughness of the resin and to the probable more favourable adhesion of bacteria, scanning electron microscopy, combined with focus ion bean micromachining, together with stylus profilometry analysis have been in vitro performed to reveal the structural nature of three orthodontic adhesive resins used for bracket bonding and, above all, to understand how compositional factors can influence specific pivotal properties such as material’s surface roughness and robustness. In particular, we speculated about the morphological features that determine an increase in the bacterial adhesion and we proposed focused ion beam technique as a valuable tool to compare the internal structures of the polymers and to determine the peculiar mechanical properties of the examined adhesive resins.


Microscopy ◽  
2020 ◽  
Vol 69 (1) ◽  
pp. 11-16
Author(s):  
Takaharu Nagatomi ◽  
Tatsuya Nakao ◽  
Yoko Fujimoto

Abstract In the present study, a free-standing object-sampling technique for microelectromechanical systems (MEMS) is developed to measure their sidewall surface roughnesses by atomic force microscopy (AFM). For this purpose, a conventional focused ion beam (FIB) sampling technique widely used for cross-sectional transmission electron microscope specimen preparation was applied. The sub-nm-order roughness parameters were quantitatively measured for sidewalls of Si-bridge test samples. The roughness parameters were compared before and after H2 annealing treatment, which induced smoothing of the surface by migration of the Si atoms. The reduction in the surface roughness by a factor of approximately one-third with 60-s H2 annealing was quantitatively evaluated by AFM. The present study confirms that the developed FIB–AFM technique is one potential approach for quantitatively evaluating the surface-roughness parameters on the oblique faces of free-standing objects in MEMS devices.


2021 ◽  
Author(s):  
Myoung Youp SONG

One of the candidates for metallic interconnects of solid oxide fuel cells is ferritic stainless steel, Crofer 22 APU. Ferritic stainless steel Crofer 22 APU specimens with different surface roughness were prepared by grinding with SiC powder papers of various grits and then thermally cycled in air. Variation in the microstructure of the samples having different roughness with thermal cycling was investigated. Polished Crofer 22 APU specimens after three and five thermal cycles had relatively flat oxide layers with thicknesses of about 13.8 and 17.9 μm, respectively. Micrographs of a trench made by milling with FIB (focused ion beam) for a Crofer 22 APU specimen ground with grit 80 SiC powder paper after 8 thermal cycles (total oxygen exposure time of 200 h at 1073 K), captured by ESB (energy selective back-scattering) and SE2 (type II secondary electrons), showed that the surface of the sample was very coarse and its oxide layer was undulated. In the oxide layer, the phase of the sublayer was Cr2O3, and that of the top layer was (Cr, Mn)3O4 spinel. The surface of the sample ground with grit 80 SiC powder paper was very rough after 60 thermal cycles (total oxygen exposure time of 1500 h at 1073 K). The polished Crofer 22 APU is a better applicant to an interconnect of SOFC than those with rougher surfaces.


2013 ◽  
Vol 7 (6) ◽  
pp. 638-643
Author(s):  
Tsunehisa Suzuki ◽  
◽  
Hiroshi Saito

The cutting edge of a single-blade monocrystalline diamond endmill was formed using the Focused Ion Beam technique (FIB): the cutting edge was mechanically polished to a rake angle of -70° and then formed to a rake angle of 0° by FIB sputtering. The performance of the diamond endmill was evaluated for the machining of acryl resin. Grooves were cut into optical acrylic resin with the resulting endmill; characteristics such as the surface roughness, cutting resistance, and chip shape were evaluated. The improved sharpness of the cutting edge reduced the surface roughness and cutting force in the depth direction. The surface roughness did not fluctuate even under the conditions of a fast feed rate and deep cutting depth. A cutter mark was observed on the finished surface, and flowing chips were generated unlike the performance of the -70° rake angle cutter.


Materials ◽  
2021 ◽  
Vol 14 (10) ◽  
pp. 2485
Author(s):  
Roberta Condò ◽  
Gianluca Mampieri ◽  
Guido Pasquantonio ◽  
Aldo Giancotti ◽  
Paola Pirelli ◽  
...  

Bacterial adhesion to the surface of orthodontic materials is an important step in the formation and proliferation of plaque bacteria, which is responsible for enamel demineralization and periodontium pathologies. With the intent of investigating if adhesive resins used for bracket bonding are prone to bacteria colonization, the surface roughness of these materials has been analyzed, combining information with a novel methodology to observe the internal structures of orthodontic composites. Scanning electron microscopy, combined with focus ion bean micromachining and stylus profilometry analyses, were performed to evaluate the compositional factors that can influence specific pivotal properties facilitating the adhesion of bacteria to the surface, such as surface roughness and robustness of three orthodontic adhesive composite resins. To confirm these findings, contact angle measurements and bacteria incubation on resin slide have been performed, evaluating similarities and differences in the final achievement. In particular, the morphological features that determine an increase in the resins surface wettability and influence the bacterial adhesion are the subject of speculation. Finally, the focused ion beam technique has been proposed as a valuable tool to combine information coming from surface roughness with specific the internal structures of the polymers.


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